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CLC/SR 47E - Discrete semiconductor devices

Discrete semiconductor devices

General Information

Status
Inactive
Sector
V09 - SEMICONDUCTORS
Parent
CLC - CLC TC
Standardization Organization
ICS
Directive
Mandate
50
CLC
EN IEC 60747-17:2020/AC:2021-02(Corrigendum)
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
SIST EN IEC 60747-17:2021/AC:2021

IEC Corrected Version

  • Corrigendum
    3 pages
    English and French language
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EN 60747-5-5:2011/A1:2015(Amendment)
Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
SIST EN 60747-5-5:2011/A1:2015

2014-08-18: endorsement of IEC 60747-5-5:2007/A1 under 3-month UAP

  • Amendment
    6 pages
    English language
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EN 60747-5-5:2011(Main)
Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
SIST EN 60747-5-5:2011

This part of IEC 60747 gives the terminology, essential ratings, characteristics, safety test as well as the measuring method for photocouplers (or optocouplers). NOTE The word 'optocoupler' can also be used instead of 'photocoupler'. This standard replaces the clauses for photocouplers (or optocouplers) described in IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3, including their amendments. The contents for phototransistors and photothyristors in IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3, including their amendments, will be considered obsolete as of the effective date of publication of this standard. NOTE Photocouplers that are certified to the previous version of the photocoupler standard, namely IEC 60747-5-1/2/3, are to be considered in compliance with the requirements and provisions of IEC 60747-5-5.

  • Standard
    56 pages
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EN 60747-15:2004(Main)
Discrete semiconductor devices - Part 15: Isolated power semiconductor devices
SIST EN 60747-15:2004

Gives the product specific standards, requirements and test methods for isolated power semiconductor devices. These requirements are added to those given in other parts of EN 60747, EN 60748 and EN 60749 for the corresponding non-isolated power devices.

  • Standard
    53 pages
    English language
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EN 60747-5-3:2001/A1:2002(Amendment)
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
SIST EN 60747-5-3:2002/A1:2004

EN following parallel vote

  • Amendment
    15 pages
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EN 60747-5-2:2001/A1:2002(Amendment)
Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
SIST EN 60747-5-2:2002/A1:2004

EN following parallel vote

  • Amendment
    15 pages
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EN 60747-5-3:2001(Main)
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
SIST EN 60747-5-3:2002

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

  • Standard
    34 pages
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EN 60747-5-2:2001(Main)
Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
SIST EN 60747-5-2:2002

Gives the essential ratings and characteristics of the following categories or subcategories of optoelectronic devices which are not intended to be used in the field of fibre optic systems or subsystems: Semiconductor photoemitters, semiconductor photoelectric detectors, semiconductor photosensitive devices, and semiconductor devices utilizing the optical radiation for internal operation.

  • Standard
    30 pages
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CLC
EN 150014:1996(Main)
Blank Detail Specification: Thyristor-diodes, transient overvoltage suppressor
SIST EN 150014:2002

D114/033: Withdrawn

  • Standard
    13 pages
    English language
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EN 150009:1992(Main)
Blank Detail Specification: Case-rated rectifier diodes
SIST EN 150009:2002

D114/033: Withdrawn

  • Standard
    13 pages
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EN 150015:1992(Main)
Blank Detail Specification: Unidirectional transient overvoltage suppressor diodes
SIST EN 150015:2002

D114/033: Withdrawn

  • Standard
    14 pages
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EN 150008:1992(Main)
Blank Detail Specification: Ambient-rated rectifier diodes
SIST EN 150008:2002

D114/033: Withdrawn

  • Standard
    12 pages
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EN 150010:1991(Main)
Blank Detail Specification: Ambient-rated thyristors
SIST EN 150010:2002

D114/033: Withdrawn

  • Standard
    15 pages
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EN 150001:1991(Main)
Blank Detail Specification: General purpose semiconductor diodes
SIST EN 150001:2002

D114/033: Withdrawn

  • Standard
    9 pages
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EN 150006:1991(Main)
Blank Detail Specification: Variable capacitance diodes
SIST EN 150006:2002

D114/033: Withdrawn

  • Standard
    8 pages
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EN 150012:1991(Main)
Blank Detail Specification: Single gate field-effect transistors
SIST EN 150012:2002

D114/033: Withdrawn

  • Standard
    64 pages
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EN 150013:1991(Main)
Blank Detail Specification: Current regulator and current reference diodes
SIST EN 150013:2002

D114/033: Withdrawn

  • Standard
    11 pages
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EN 150003:1991(Main)
Blank Detail Specification: Case-rated bipolar transistors for low frequency amplification
SIST EN 150003:2002

D114/033: Withdrawn

  • Standard
    12 pages
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EN 150011:1991(Main)
Blank Detail Specification: Case-rated thyristors
SIST EN 150011:2002

D114/033: Withdrawn

  • Standard
    16 pages
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EN 150007:1991(Main)
Blank Detail Specification: Case-rated bipolar transistors for high frequency amplification
SIST EN 150007:2002

D114/033: Withdrawn

  • Standard
    12 pages
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EN 150004:1991(Main)
Blank Detail Specification: Bipolar transistors for switching applications
SIST EN 150004:2002

D114/033: Withdrawn

  • Standard
    13 pages
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EN 60747-5-1:2001/A2:2002(Amendment)
Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
SIST EN 60747-5-1:2002/A2:2004

EN following parallel vote

  • Amendment
    10 pages
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EN 60747-5-1:2001/A1:2002(Amendment)
Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
SIST EN 60747-5-1:2002/A1:2004
  • Amendment
    6 pages
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EN 60747-5-1:2001(Main)
Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
SIST EN 60747-5-1:2002

Deals with the terminology relating to the semiconductor optoelectronic devices.

  • Standard
    33 pages
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EN 153000:1998(Main)
Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval)
SIST EN 153000:2002

This document applies to discrete pressure contact power semiconductor devices namely rectifier diodes, transistors, thyristors and their derivatives. The requirements also cover encapsulated assemblies. The document does not apply to stacks or assemblies made with these encapsulated components.

  • Standard
    42 pages
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