EN 60352-3:1994

Solderless connections - Part 3: Solderless accessible insulation displacement connections - General requirements, test methods and practical guidance

Applies to ID connections which are accessible for tests and measurements, and which are made with: -appropriately designed ID terminations -wires having solid round conductors of 0,25 mm to 3,6 mm nominal diameter -wires having stranded conductors of 0,05 mm2 to 10 mm2 cross-section.

Lötfreie elektrische Verbindungen - Teil 3: Lötfreie zugängliche Schneidklemmverbindungen - Allgemeine Anforderungen, Prüfverfahren und Anwendungshinweise

Connexions sans soudure - Partie 3: Connexions autodénudantes accessibles sans soudure - Règles générales, méthodes d'essai et guide pratique

Est applicable aux connexions CAD qui sont accessibles pour les essais et les mesures et qui sont composées de: Contacts CAD de conception appropriée; fils à conducteur circulaire massif de diamètre nominal 0,25 mm à 3,6 mm; fils à conducteur divisé de section 0,05 mm2 à 10 mm2.

Solderless connections - Part 3: Solderless accessible insulation displacement connections - General requirements, test methods and practical guidance (IEC 60352-3:1993)

General Information

• Status: Withdrawn
• Publication Date: 10-Oct-1994
• Withdrawal Date: 14-Jul-1995
• ICS: 29.120.20 - Connecting devices
• Technical Committee: CLC/SR 48B - Connectors
• Drafting Committee: IEC/SC 48B - IEC_SC_48B
• Parallel Committee: IEC/SC 48B - IEC_SC_48B
• Current Stage: 9960 - Withdrawal effective - Withdrawal
• Start Date: 14-May-2023
• Completion Date: 14-May-2023
• Ref Project: SIST EN 60352-3:2002 - Solderless connections -- Part 3: Solderless accessible insulation displacement connections - General requirements, test methods and practical guidance

Relations

• Replaced By: EN IEC 60352-3:2020 - Solderless connections - Part 3: Accessible insulation displacement (ID) connections - General requirements, test methods and practical guidance
• Effective Date: 04-Jun-2020

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 60352-3:2002
01-september-2002
Solderless connections - Part 3: Solderless accessible insulation displacement
connections - General requirements, test methods and practical guidance (IEC
60352-3:1993)
Solderless connections -- Part 3: Solderless accessible insulation displacement
connections - General requirements, test methods and practical guidance
Lötfreie elektrische Verbindungen -- Teil 3: Lötfreie zugängliche
Schneidklemmverbindungen - Allgemeine Anforderungen, Prüfverfahren und
Anwendungshinweise
Connexions sans soudure -- Partie 3: Connexions autodénudantes accessibles sans
soudure - Règles générales, méthodes d'essai et guide pratique
Ta slovenski standard je istoveten z: EN 60352-3:1994
ICS:
29.120.20 Spojni elementi Connecting devices
SIST EN 60352-3:2002 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 60352-3:2002
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SIST EN 60352-3:2002
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SIST EN 60352-3:2002
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SIST EN 60352-3:2002
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SIST EN 60352-3:2002
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SIST EN 60352-3:2002
NORME CEI
INTERNATIONALE IEC
352-3
INTERNATIONAL
Première édition
STANDARD
First edition
1993-02
Connexions sans soudure
Partie 3:
Connexions autodénudantes accessibles
sans soudure — Règles générales, méthodes
d'essai et guide pratique
Solderless connections
Part 3:
Solderless accessible insulation displacement
connections — General requirements, test methods
and practical guidance
© CEI 1993 Droits de reproduction réservés — Copyright — all rights reserved

Aucune partie de cette publication ne peut étre reproduite ni No part of this publication may be reproduced or utilized in

utilisée sous quelque forme que ce soit et par aucun pro- any form or by any means, electronic or mechanical,

cédé, électronique ou mécanique, y compris la photocopie et including photocopying and microfilm, without permission

les microfilms, sans l'accord écrit de l'éditeur. in writing from the publisher.
Genève, Suisse

Bureau Central de la Commission Electrotechnique Internationale 3, rue de Varembé

Commission Electrotechnique Internationale CODE PRIX
International Electrotechnical Commission PRICE CODE
IEC MemutyHapoaHaa 3neKtpoîexHH4eceaa IiouHccsn
 Pour prix, voir catalogue en vigueur
For price, see current catalogue
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SIST EN 60352-3:2002
- 3 -
352-3 © IEC: 1993
CONTENTS
Page
FOREWORD 5
INTRODUCTION 7
SECTION 1: GENERAL
Clause
1 Scope 9
2 Object 9
3 Normative references 9
11
4 Definitions
17
5 IEC type designation
SECTION 2: REQUIREMENTS
17 6 Workmanship
17
7 Tools
19
Insulation displacement terminations (ID terminations) 8
21
Wires
21 10 Accessible insulation displacement connections (ID connections)
SECTION 3: TESTS
23
11 Testing
25
12 Type tests
37
13 Test schedules
SECTION 4: PRACTICAL GUIDANCE
55 14 Current-carrying capacity
55 15 Tool information
55 16 Termination information
57
17 Wire information
57
18 Connection information
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SIST EN 60352-3:2002
352-3 © IEC: 1993 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
SOLDERLESS CONNECTIONS
Part 3: Solderless accessible insulation displacement connections —
General requirements, test methods and practical guidance
FOREWORD

The formal decisions or agreements of the IEC on technical matters, prepared by Technical Committees on

which all the National Committees having a special interest therein are represented, express, as nearly as

possible, an international consensus of opinion on the subjects dealt with.

They have the form of recommendations for international use and they are accepted by the National

Committees in that sense.

In order to promote international unification, the IEC expresses the wish that all National Committees

should adopt the text of the IEC recommendation for their national rules in so far as national conditions will

permit. Any divergence between the IEC recommendation and the corresponding national rules should, as

far as possible, be clearly indicated in the latter.

The IEC has not laid down any procedure concerning marking as an indication of approval and has no

responsibility when an item of equipment is declared to comply with one of its recommendations.

International Standard IEC 352-3 has been prepared by IEC technical committee 48:

Electromechanical components and mechanical structures for electronic equipment.
The text of this standard is based on the following documents:
DIS Report on Voting
48(CO)339
48(CO)331

Full information on the voting for the approval of this standard can be found in the Voting

Report indicated in the above table.
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SIST EN 60352-3:2002
352-3 © IEC: 1993 — 7 —
INTRODUCTION
Two standards are available on solderless insulation displacement connections:

Part 3: Solderless accessible insulation displacement connections – General require-

ments, test methods and practical guidance;
Part 4: Solderless non-accessible insulation displacement connections – General
requirements, test methods and practical guidance.
This standard includes requirements, tests and practical guidance information.
Two test schedules are provided:
The Basic Test Schedule applies to insulation displacement connections which
conform to all requirements of section 2.

These requirements are derived from experience with successful applications of such

connections.

– The Full Test Schedule applies to insulation displacement connections which do not

fully conform to all requirements of section 2, for example those which are manu-

factured using materials or surface finishes not included in section 2.

This philosophy permits cost and time effective performance verification using a limited

Basic Test Schedule for established connections and an expanded Full Test Schedule

for connections requiring more extensive performance validation.

NOTE - In this standard the term Insulation displacement" is abbreviated to "ID", for example "ID connec-

tion" , "ID termination".
Accessible ID Non-accessible ID
connection
connection
IEC 026/93
IEC 025193

Figure 1 – Example of accessible and non-accessible insulation displacement connection

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SIST EN 60352-3:2002
IEC: 1993 352-3 — 9 -
SOLDERLESS CONNECTIONS
Part 3: Solderless accessible insulation displacement connections –
General requirements, test methods and practical guidance
SECTION 1: GENERAL
1 Scope

This part of IEC 352 is applicable to ID connections which are accessible for tests and

measurements according to section 3 and which are made with:
appropriately designed ID terminations;
— wires having solid round conductors of 0,25 mm to 3,6 mm nominal diameter;
— 2 cross-section;
wires having stranded conductors of 0,05 mm 2 to 10 mm

for use in telecommunication equipment and in electronic devices employing similar

techniques.

Information on materials and data from industrial experience is included in addition to the

test procedures to provide electrically stable connections under prescribed environmental

conditions.
2 Object

To determine the suitability of accessible ID connections under specified mechanical,

electrical and atmospheric conditions.

There are different designs and materials for ID terminations in use. For this reason only

rformance require-
fundamental parameters of the termination are specified while the pe
ments of the wire and the complete connection are specified in full detail.

To provide a means of comparing test results when the tools used to make the connec-

tions are of different designs or manufacture.
3 Normative references

The following normative documents contain provisions which, through reference in this

text, constitute provisions of this part of IEC 352. At the time of publication, the editions

indicated were valid. All normative documents are subject to revision, and parties to agree-

ments based on this part of IEC 352 are encouraged to investigate the possibility of apply-

ing the most recent editions of the normative documents indicated below. Members of IEC

and ISO maintain registers of currently valid International Standards.

IEC 50(581): 1978, International Electrotechnical Vocabulary (IEV) — Chapter 581: Electro-

mechanical components for electronic equipment
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SIST EN 60352-3:2002
352-3 © IEC: 1993 - 11 -
IEC 68-1: 1988, Environmental testing - Part 1: General and guidance

IEC 68-2-60 TTD: 1989, Environmental testing - Part 2: Tests - Test Ke: Corrosion tests

in artificial atmosphere at very low concentration of polluting gas(es)

IEC 189-3: 1988, Low-frequency cables and wires with PVC insulation and PVC sheath -

Part 3: Equipment wires with solid or stranded conductor, PVC insulated, in singles, pairs

and triples.
Amendment 1 (1989)

IEC 352-4, Solderless connections - Part 4: Solderless non-accessible insulation displace-

ment connections - General requirements, tests methods and practical guidance (under

consideration)

IEC 512-1: 1984, Electromechanical components for electronic equipment; basic testing

1: General.
procedures and measuring methods - Pa rt
Amendment 1 (1988)
Electromechanical components for electronic equipment, basic testing
IEC 512-2: 1985,

procedures and measuring methods - Part 2: General examination, electrical continuity

and contact resistance tests, insulation tests and voltage stress tests
Electromechanical components for electronic equipment; basic testing
IEC 512-4: 1976,
procedures and measuring methods - Part 4: Dynamic stress tests

IEC 512-5: 1992, Electromechanical components for electronic equipment; basic testing

procedures and measuring methods - Part 5: Impact tests (free components), static load

tests (fixed components), endurance tests and overload tests

IEC 512-6: 1984, Electromechanical components for electronic equipment; basic testing

rt 6: Climatic tests and soldering tests
procedures and measuring methods - Pa
Low-frequency miniature equipment wires with solid or stranded conductor,
IEC 673: 1980,
fluorinated polyhydrocarbon type insulation, single.
Amendment 3 (1989)
4 Definitions

Terms and definitions used in and applicable to this part of IEC 352 are included in

IEC 50(581). IEC 512-1 also contains some applicable terms and definitions.
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SIST EN 60352-3:2002
352-3 © IEC: 1993 - 13 -

For the purpose of this part of IEC 352, the following additional terms and definitions

shall apply.
4.1
Insulation displacement connection (ID connection)

A solderless electrical connection made by inserting a single wire into a precisely

controlled slot in a termination such that the sides of the slot displace the insulation and

deform the conductor of a solid wire or strands of stranded wire to produce a gas-tight

connection.
Ribbon cable with
stranded conductors
!EC 027193
Figure 2 - Insulation displacement connection
4.1.1
Accessible insulation displacement connection (accessible ID connection)

An ID connection in which it is possible to access test points for carrying out mechanical

tests (for example, transverse extraction force) and electrical measurements (for example,

contact resistance) without deactivation of any design feature intended to establish and/or

maintain the ID connection.
4.1.2
Non-accessible insulation displacement connection (non-accessible ID connection)
(See IEC 352-4, under consideration)

An ID connection in which it is not possible to access test points for carrying out mecha-

nical tests such as transverse extraction force and some electrical measurements (for ex-

ample, contact resistance) without deactivation of any design feature intended to establish

and/or maintain the ID connection, mainly where the ID connection is enclosed in a compo-

nent.
4.2
Insulation displacement termination (ID termination)

A termination designed to accept a wire for the purpose of establishing an ID connection.

4.2.1
Reusable insulation displacement termination (reusable ID termination)
An ID termination that can be used more than once.
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SIST EN 60352-3:2002
352-3 © I EC: 1993 - 15 -
Non-reusable insulation displacement termination (non-reusable ID termination)
4.2.2
An ID termination that can be used only once.
4.3 Slot
Strain relief slot or second
connection slot
!EC 028/93
Figure 3 - Slot
4.3.1 Connection slot

The specially shaped opening in an ID termination suitable to displace the insulation of a

wire and to ensure a gas-tight connection between the termination and the conductor(s) of

the wire.

In certain cases a second connection slot is used to provide for a double connection.

4.3.2 Strain relief slot

The specially shaped opening in an ID termination suitable to provide for strain relief.

4.4 Beam

The specially shaped metallic part of an ID termination on each side of the slot.

Beams
Slot
ID termination
IEC 029/93
Figure 4 - Beam
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SIST EN 60352-3:2002
352-3 © I EC: 1993 - 17 -
4.5 Apparent diameter (of a stranded conductor)
The diameter of the circumscribing circle of the bundle of strands.
4.6 Guiding block (see IEC 352-4)

A specially shaped part of a component, for example, a connector, which guides/inserts

the wire(s) into the slot(s). Additionally it may provide for other mechanical features, for

example, fixing the wire(s) in correct position(s), strain relief of the ID connection(s),

secondary loading on the ID termination(s) or beams.
Guiding block
Ribbon cable or
single wires
ID termination
IEC 030193
Figure 5 - Guiding block
4.7 Wire insertion tool

A hand- or power-operated tool for producing an ID connection by inserting the wire(s) in a

controlled manner to a predetermined position into the slot(s).
4.8 Wire extraction tool
A device for extracting the wire(s) from the ID termination.
5 IEC type designation
Not applicable.
SECTION 2: REQUIREMENTS
6 Workmanship

The connections shall be processed in a careful and workmanlike manner, in accordance

with good current practice.
7 Tools

Tools shall be used and inspected according to the instructions given by the manufacturer.

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SIST EN 60352-3:2002
352-3 ©IEC: 1993 - 19 -

A tool shall be able to make uniformly reliable connections during its useful life.

A tool shall be designed and shall operate in such a manner that any damage to the ID

termination and/or to the wire is avoided.
A tool shall provide for a correct location of the wire in the slot.

Tools are evaluated by testing ID connections made with the tools to be evaluated.

8 Insulation displacement terminations (ID terminations)
8.1 Materials

Suitable grades of copper alloy, such as copper-tin (bronze), copper-zinc (brass), or

beryllium copper shall be used.

NOTE - If copper-zinc is used care should be taken regarding corrosion effects caused by stress.

8.2 Dimensions

The quality of an ID connection depends on the dimensions of the ID termination, parti-

cularly of its slot and beams, together with the characteristics of the materials used. The

dimensions shall be chosen so as to be suitable for the wire or range of wires for which

the ID termination is designed. The suitability is verified by applying the test schedule

given in section 3.
8.3 Surface finishes

The contact area of the termination shall be plated with tin or tin-lead or with silver, gold,

palladium or their alloys. The surface shall be free of detrimental contamination or corro-

sion.
8.4 Design features

ID terminations may be distinguished according to reusability conditions and according to

a range of wire sizes that can be accommodated. This results in the following types:

- reusable terminations, designed to be connected more than once and designed for

one specified nominal conductor diameter or cross-section;

- reusable terminations, designed to be connected more than once and designed for

a specified range of conductor diameters or cross-sections;
- non-reusable terminations, designed to be connected once and designed for one
specified nominal conductor diameter or cross-section;
- non-reusable terminations, designed to be connected once and designed for a
specified range of conductor diameters or cross-sections.

The edges of the beams shall be smooth and free of burrs to avoid unintentional damage

to the conductor(s) or insulation.
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SIST EN 60352-3:2002
-21 -
352-3 © IEC: 1993
Wires

Wires with solid round conductors or stranded conductors with seven single strands shall

be used.
NOTE - For further information on wires see IEC 189-3 and IEC 673.
9.1 Materials

The conductor material shall be annealed copper. It shall have an elongation at break of

not less than 10 %.
9.2 Dimensions
Different ranges of wires shall be used:
2 to
single solid round wires of 0,25 mm to 0,8 mm diameter (converted 0,049 mm
0,5 mm 2), or
stranded wires of 0,075 mm 2 to 0,5 mm 2 cross-section.
9.3 Surface finishes

Solid round conductors shall be unplated or plated with tin, tin-lead or silver. Stranded

conductors shall have strands plated with tin, tin-lead or silver.
The conductor surface shall be free of contamination and corrosion.
9.4 Wire insulation

The detail specification of the ID termination shall specify the outside diameter of the wire

insulation that can be accommodated.

The insulation material shall be PVC or another material with properties compatible with

the insulation displacement process, i.e. the insulation material shall be capable of being

readily displaced by the inner edges of the beams without damaging the conductor. In the

case of stranded conductors, the insulation shall, in addition, be capable of keeping

the strands in place so that they are not unduly displaced when making the ID connection.

10 Accessible insulation displacement connections (ID connections)
a) The combination of wire, termination and connection tool shall be compatible.

When inserting the wire into the connection slot of the ID termination the inner sides

of the beams shall displace the wire insulation and deform
the diameter of a solid round conductor, or
the apparent diameter of a stranded conductor and, in addition, the diameter
beams to produce a gas-tight
of those strands which are in contact with the
connection.
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SIST EN 60352-3:2002
352-3 © IEC: 1993 - 23 -

c) The wire shall be correctly located in the connection slot of the ID termination as

specified by the detail specification. There shall be a sufficient distance between the

termination and the wire end. The minimum value of that distance depends on the wire

used and shall be as specified by the detail specification.
Only one wire in one connection slot shall be used.
SECTION 3: TESTS
11 Testing
11.1 Introduction
Where a termination is designed to accommodate more than one ID connection each
connection shall be tested individually.
11.2 General

As explained in the introduction there are two test schedules which shall be applied

according to the following conditions:

- ID connections which conform to all the requirements of section 2 shall be tested in

accordance with and meet the requirements of 13.2.

- ID connections which do not fully conform to all the requirements of section 2, for

example, which are made with different wire and/or termination sizes and/or materials,

shall be tested according to and meet the requirements of 13.3.
11.3 Standard conditions for testing

Unless otherwise specified, all tests shall be carried out under standard conditions for

testing as specified in IEC 512-1.

The ambient temperature and the relative humidity at which the measurements are made

shall be stated in the test report.

In the case of dispute about test results, the test shall be repeated at one of the referee

conditions of IEC 68-1.
11.4 Preconditioning

Where specified, the connections shall be preconditioned under standard conditions for

testing for a period of 24 h, in accordance with IEC 512-1.
11.5 Recovery

Where specified, the specimen shall be allowed to recover under standard conditions for

testing for a period of 1 h to 2 h after conditioning.
11.6 Mounting of specimen

When mounting is required in a test, the specimens shall be mounted using the normal

mounting method, unless otherwise specified.
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SIST EN 60352-3:2002
352-3 © I EC: 1993 – 25 –
12 Type tests

NOTE - As far as test methods are described in this standard, it is intended that the description be

replaced by a reference to IEC 512 as soon as the relevant test method is included in IEC 512.

12.1
General examination

The tests shall be carried out in accordance with Test la: Visual examination, and

Test 1b: Examination of dimension and mass, of IEC 512-2. The visual examination test

may be carried out with magnification of up to approximately five times.

All parts shall be examined to determine whether the requirements of clauses 8 to 10 have

been met.
12.2 Mechanical tests
12.2.1 Transverse extraction force

The object of this test is to determine the force necessary to move the wire within the

connection slot of an accessible ID termination along the longitudinal axis of the termination.

The test specimen shall consist of an ID termination with one inserted wire. If necessary,

the termination may be separated from the component, provided the ID connection is not

affected. The ID termination shall be securely held.

A force F shall be applied to the inserted wire so as to move the wire in the longitudinal

axis of the connection slot of the termination. The force shall be applied using a suitable

device, for example, a test fork. An example of a suitable test arrangement is shown in

figure 6. The total clearance between the termination and the test fork shall not exceed

50 % of the wire diameter. The force shall be applied by a suitable means, for example, a

tensile testing machine. The head of the tensile testing machine shall travel steadily at

a speed of between 25 mm/min and 50 mm/min.

The specimen shall be tested until the wire moves in the connection slot of the ID termina-

tion. The ultimate load shall be measured.
Wire extraction
tool
Wire
ID termination
Forked hook
Hook jaws
Holding device
lEC 031193
Figure 6 – Test arrangement, transverse extraction force
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SIST EN 60352-3:2002
352-3 ©IEC: 1993 - 27 -
Requirement:
The force measured shall be not less than the minimum values given in table 1.
Table 1 - Minimum transverse extraction force
Solid conductors, Stranded conductors, Minimum transverse extraction force
nominal diameter nominal cross–section
Solid conductors Stranded conductors
mm mm 2 N N
0,25 to 0,32 0,05 to 0,08 2 1
> 0,32 to 0,5 >0,08 to 0,2 3 2
>0,5 to 0,8 >0,2 to 0,5 5 3
>0,8 to 1,4 >0,5 to 1,5 8 5
>1,4 to 2,3 >1,5 to 4,0 10 8
>2,3 to 3,6 >4,0 to 10,0 12 10
12.2.2 Bending of the wire

The object of this test is to assess the ability of an accessible ID connection to withstand

the mechanical stress caused by bending the connected wire in a specified manner.

The test specimen shall consist of one ID termination with one inserted wire (see figure 7).

If necessary, the termination may be separated from the component, provided the ID

connection is not affected.
Holding device
ID termination
Actuator for the wire-bending
device (swivelling)
Actuator pins
Wire
lEC 032193
Figure 7 - Test arrangement, bending of the wire
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SIST EN 60352-3:2002
352-3 © IEC: 1993 – 29 –

The test specimen shall be securely held in such a position that the wire hangs along its

longitudinal axis in the connection slot as shown in figure 7. An axial load shall be

applied to the free end of the wire to keep the wire straight. The value of this load shall

be 5 % to 10 % of the breaking strength of the wire.

The wire shall then be bent in both directions from the vertical which constitutes one cycle.

Unless otherwise specified by the detail specification, the bending angle a shall be 30°.

Other recommended bending angles for detail specifications are 60° and 90°.

Bending of the wire shall be carried out using a suitable device, for example, as indicated

in figure 7.

Contact disturbance shall be monitored during the bending test in accordance with

Test 2e: Contact disturbance, of IEC 512-2.

The limit of duration of contact disturbance shall be 10 ms unless otherwise specified by

the detail specification.

The number of cycles shall be 10, unless otherwise specified by the detail specification.

After testing, the termination shall not be damaged and the conductor shall not be broken.

12.2.3 Vibration

The test shall be carried out in accordance with Test 6d: Vibration, of IEC 512-4.

The test specimens shall be firmly held on a vibration table.

An example of a suitable test arrangement for testing accessible ID connections is shown

in figure 8.

Contact disturbance shall be monitored during the vibration test in accordance with

Test 2e: Contact disturbance, of IEC 512-2.

The limit of duration of contact disturbance shall be 10 ms unless otherwise specified by

the detail specification.
Free wire length
50 mm
Connection point for
electrical measurement
/EC 033/93
Figure 8 – Test arrangement, vibration
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SIST EN 60352-3:2002
352-3 © IEC: 1993 -31 -
Table 2 - Vibration, preferred test severities
10 Hz to 2 000 Hz
10 Hz to 500 Hz
Range of frequency 10 Hz to 55 Hz
57 Hz to 62 Hz 57 Hz to 62 Hz
Crossover frequency —
Displacement amplitude below the
1,5 mm
0,35 mm 0,35 mm
crossover frequency
Acceleration amplitude above the
50 m/s 2 (5 g) 200 m/s 2 (20
crossover frequency —
3 axes 3 axes
3 axes
Directions
5 5
Number of sweep cycles per direction
The applicable test severity shall be specified by the detail specification.
Repeated connection and disconnection, reusable accessible ID terminations
12.2.4

The object of this test is to assess the ability of a reusable accessible ID termination to

withstand a specified number of connections and disconnections.

A specified wire shall be inserted into a reusable ID termination in a specified manner.

Following this, the wire shall be extracted in a specified manner. This shall be considered

to be one cycle.

The last cycle of a specified number of test cycles consists of only inserting the wire into

the termination, i.e. in any case there shall be a complete ID connection at the end of a

specified number of test cycles.

The same reusable ID termination shall be used for the total number of test cycles

specified.

A new part of the wire or a new wire of the same type shall be used for each test cycle.

Where terminations are designed to accept a range of conductor sizes all cycles except

the last one shall be carried out with the maximum conductor sizes specified. The last

cycle and the final measurement shall be carried out with the minimum conductor sizes

specified by the detail specification.
Test severities:

The conductor sizes for the last cycle and the number of cycles to be carried out shall

be specified by the detail specification. Preferred values for the number of cycles are 4,

20 or 100.
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SIST EN 60352-3:2002
352-3 © IEC: 1993 - 33 -
12.3 Electrical tests

The component detail specification shall prescribe the upper category temperature (UCT)

and the lower category temperature (LCT) which shall be used in the following tests.

12.3.1 Contact resistance

The contact resistance test shall be carried out according to Test 2a: Contact resistance,

millivolt level method, or Test 2b: Contact resistance, specified test current method, of

IEC 512-2 as specified in the detail specification.
A suitable test arrangement as shown in figure 9 shall be used.
Connection slot
!EC 034/93
Figure 9 - Test arrangement, contact resistance
2 of the conductor cross-
When Test 2b is applied, the test current shall be 1 A per mm

section. The duration of application of the test current shall be short enough to prevent

heating of the specimens.

The maximum permitted change in resistance is to be added to the initially measured

resistance, not to the permitted initial limit, i.e. the maximum permitted contact resistance

after conditioning is equal to the measured initial value plus the maximum permitted

change as given in table 3.
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SIST EN 60352-3:2002
352-3 © IEC: 1993 - 35 -
Table 3 - Contact resistance of accessible ID connections,
maximum permitted values
Initial contact resistance, Maximum change in
resistance after
maximum
Conductor mechanical, electrical or
termination
climatic conditioning
mS2
mL2
plated 1
solid round conductor
unplated 5 1
plated
plated 2 2
stranded conductor
unplated 5 5
plated 5 1
solid round conductor
unplated 5 1
unplated
plated 5 2
stranded conductor
unplated 5 5
12.3.2
Electrical load and temperature

The test shall be carried out in accordance with Test 9b: Electrical load and temperature,

of IEC 512-5. Unless otherwise specified by the detail specification, the following details

shall apply:
maximum operating temperature: +100 °C (UCT)
test duration: 1 000 h
Test current shall be as specified in the detail specification.
12.4 Climatic tests
The component detail specification
...