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EN 61069-2:1994

(Main)

Industrial-process measurement and control - Evaluation of system properties for the purpose of system assessment - Part 2: Assessment methodology

Industrial-process measurement and control - Evaluation of system properties for the purpose of system assessment - Part 2: Assessment methodology

Details the assessment methodology of industrial-process measurement and control systems. Describes the method for analyzing the objectives given for the assessment, the method for weighing the relative importance of the various system properties and influencing conditions, and for determining an assessment programme.

Leittechnik für industrielle Prozesse - Ermittlung der Systemeigenschaften zum Zweck der Eignungsbeurteilung eines Systems - Teil 2: Methodik der Eignungsbeurteilung

Mesure et commande dans les processus industriels - Appréciation des propriétés d'un système en vue de son évaluation - Partie 2: Méthodologie à appliquer pour l'évaluation

Détaille la méthodologie à appliquer pour l'évaluation des systèmes de mesure et de commande des processus industriels. Décrit la méthode à suivre pour analyser les critères d'aptitude à l'emploi, la méthode à suivre pour apprécier l'importance relative des différentes propriétés du système et des facteurs d'influence ainsi que pour déterminer un programme d'évaluation.

Industrial-process measurement and control - Evaluation of system properties for the purpose of system assessment - Part 2: Assessment methodology (IEC 61069-2:1993)

General Information

Status
Withdrawn
Publication Date
15-Jun-1994
Withdrawal Date
14-Mar-1995
ICS
35.240.50 - IT applications in industry
Technical Committee
CLC/TC 65X - Industrial-process measurement, control and automation
Drafting Committee
IEC/SC 65A - IEC_SC_65A
Parallel Committee
IEC/SC 65A - IEC_SC_65A
Current Stage
9960 - Withdrawal effective - Withdrawal
Start Date
28-Oct-2019
Completion Date
28-Oct-2019
Ref Project
SIST EN 61069-2:1998 - Industrial-process measurement and control - Evaluation of system properties for the purpose of system assessment -- Part 2: Assessment methodology

Relations

Replaced By
EN 61069-2:2016 - Industrial-process measurement, control and automation - Evaluation of system properties for the purpose of system assessment - Part 2: Assessment methodology
Effective Date
01-Nov-2016

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SLOVENSKI STANDARD
SIST EN 61069-2:1998
01-november-1998
Industrial-process measurement and control - Evaluation of system properties for
the purpose of system assessment - Part 2: Assessment methodology (IEC 61069-
2:1993)
Industrial-process measurement and control - Evaluation of system properties for the
purpose of system assessment -- Part 2: Assessment methodology
Leittechnik für industrielle Prozesse - Ermittlung der Systemeigenschaften zum Zweck
der Eignungsbeurteilung eines Systems -- Teil 2: Methodik der Eignungsbeurteilung
Mesure et commande dans les processus industriels - Appréciation des propriétés d'un
système en vue de son évaluation -- Partie 2: Méthodologie à appliquer pour l'évaluation
Ta slovenski standard je istoveten z: EN 61069-2:1994
ICS:
25.040.40 Merjenje in krmiljenje Industrial process
industrijskih postopkov measurement and control
35.240.50 Uporabniške rešitve IT v IT applications in industry
industriji
SIST EN 61069-2:1998 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 61069-2:1998

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SIST EN 61069-2:1998

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SIST EN 61069-2:1998

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SIST EN 61069-2:1998

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SIST EN 61069-2:1998

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SIST EN 61069-2:1998
NORME CEI
INTERNATIONALE IEC
61069-2
INTERNATIONAL
Première édition
STAN DARD
First edition
1993-03
Mesure et commande dans les processus
industriels –
Appréciation des propriétés d'un système
en vue de son évaluation –
Partie 2:
Méthodologie à appliquer pour l'évaluation
Industrial -
process measurement and control –
Evaluation of system properties for
the purpose of system assessment –
Part 2:
Assessment methodology
© IEC 1993 Droits de reproduction réservés — Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun any form or by any means, electronic or mechanical,
procédé, électronique ou mécanique, y compris la photo- including photocopying and microfilm, without permission in
copie et les microfilms, sans l'accord écrit de l'éditeur writing from the publisher.
Internationzl Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http: //www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
PRICE CODE fis(
International Electrotechnical Commission
IEC MeHitlyHaPOJaHaF1 G11eMTpoTeXHM4eCliafl HOMHCCHA
vigueur
Pour prix, voir catalogue en
•
For price, see current catalogue

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SIST EN 61069-2:1998
1069-2 © IEC: 1993 — 3 —
CONTENTS
Page
FOREWORD 5
INTRODUCTION 9
Clause
1 Scope 13
2 Normative reference 13
3 Definitions 13
4 Assessment approach 15
5 Analysis of system mission 21
5.1 General 21
5.2 Formulation of system mission 21
5.3 Analysis of system mission into tasks 21
5.4 Assignment of relative importance to tasks 23
5.5 Definition of influencing conditions 23
5.6 Documentation of system requirements 23
6 Specification of system implementation 25
6.1 General 25
6.2 System overview 25
6.3 Definition of system boundaries 25
6.4 Specification of system 27
6.5 Description of system operation 29
6.6 Statement of system implementation rationale 29
6.7 Statement of compliance with system requirements 29
6.8 Documentation of system specification 29
7 Assessment procedure 29
7.1 General 29
7.2 Collation of documented information 31
7.3 Design of assessment programme 31
7.4 Execution and reporting of the assessment 33
Annex A — Bibliography 35

---------------------- Page: 8 ----------------------

SIST EN 61069-2:1998
1069-2 © IEC: 1993 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
INDUSTRIAL-PROCESS MEASUREMENT AND CONTROL -
EVALUATION OF SYSTEM PROPERTIES FOR
THE PURPOSE OF SYSTEM ASSESSMENT
Part 2: Assessment methodology
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization
comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to
promote international cooperation on all questions concerning standardization in the electrical and
electronic fields. To this end and in addition to other activities, the IEC publishes International Standards.
Their preparation is entrusted to technical committees; any IEC National Committee interested in
the subject dealt with may participate in this preparatory work. International, governmental and
non-governmental organizations liaising with the IEC also participate in this preparation. The IEC
collaborates c
...

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