Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-504: General test methods for materials and assemblies - Process ionic contamination testing (PICT)

IEC 61189-5-504:2020 is a test method designed to determine the proportion of soluble ionic residues present upon a circuit board, electronic component or assembly. The conductivity of the solution used to dissolve the ionic residues is measured to evaluate the level of ionic residues.

Prüfverfahren für Elektromaterialien, Leiterplatten und andere Verbindungsstrukturen und Baugruppen – Teil 5-504: Allgemeine Prüfverfahren für Materialien und Baugruppen – Prüfung der ionischen Verunreinigung bei Prozessen (PICT)

Méthodes d’essai pour les matériaux électriques, les cartes imprimées et autres structures d’interconnexion et ensembles - Partie 5-504: Méthodes d’essai générales pour les matériaux et les ensembles - Essai de contamination ionique des procédés (PICT)

L'IEC 61189-5-504:2020 est une méthode d'essai conçue pour déterminer la proportion de résidus ioniques solubles sur une carte à circuit imprimé, un composant électronique ou un ensemble. La conductivité de la solution utilisée pour dissoudre les résidus ioniques est mesurée afin d'évaluer le niveau des résidus ioniques.

Preskusne metode za električne materiale, tiskane plošče ter druge povezovalne strukture in sestave - 5-504. del: Splošne preskusne metode za materiale in sestave – Preskušanje procesa ionskega onesnaženja (PICT)

General Information

Status
Published
Publication Date
11-Jun-2020
Current Stage
6060 - Document made available - Publishing
Start Date
12-Jun-2020
Completion Date
12-Jun-2020

Buy Standard

Standard
EN IEC 61189-5-504:2020 - BARVE
English language
29 pages
sale 10% off
Preview
sale 10% off
Preview
e-Library read for
1 day

Standards Content (Sample)


SLOVENSKI STANDARD
01-oktober-2020
Preskusne metode za električne materiale, tiskane plošče ter druge povezovalne
strukture in sestave - 5-504. del: Splošne preskusne metode za materiale in
sestave – Preskušanje procesa ionskega onesnaženja (PICT)
Test methods for electrical materials, printed boards and other interconnection structures
and assemblies - Part 5-504: General test methods for materials and assemblies -
Process ionic contamination testing (PICT)
Ta slovenski standard je istoveten z: EN IEC 61189-5-504:2020
ICS:
31.180 Tiskana vezja (TIV) in tiskane Printed circuits and boards
plošče
31.190 Sestavljeni elektronski Electronic component
elementi assemblies
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 61189-5-504

NORME EUROPÉENNE
EUROPÄISCHE NORM
June 2020
ICS 31.180
English Version
Test methods for electrical materials, printed board and other
interconnection structures and assemblies - Part 5-504: General
test methods for materials and assemblies - Process ionic
contamination testing (PICT)
(IEC 61189-5-504:2020)
Méthodes d'essai pour les matériaux électriques, les cartes Prüfverfahren für Elektromaterialien, Leiterplatten und
imprimées et autres structures d'interconnexion et andere Verbindungsstrukturen und Baugruppen - Teil 5-
ensembles - Partie 5-504: Méthodes d'essai générales pour 504: Allgemeine Prüfverfahren für Materialien und
les matériaux et les ensembles - Essai de contamination Baugruppen - Prüfung der ionischen Verunreinigung bei
ionique des procédés (PICT) Prozessen (PICT)
(IEC 61189-5-504:2020) (IEC 61189-5-504:2020)
This European Standard was approved by CENELEC on 2020-05-26. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2020 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 61189-5-504:2020 E

European foreword
The text of document 91/1639/FDIS, future edition 1 of IEC 61189-5-504, prepared by IEC/TC 91
"Electronics assembly technology" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN IEC 61189-5-504:2020.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2021-02-26
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2023-05-26
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice
The text of the International Standard IEC 61189-5-504:2020 was approved by CENELEC as a
European Standard without any modification.

Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1  Where an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2  Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60068-1 - Environmental testing - Part 1: General and EN 60068-1 -
guidance
IEC 60068-2-20 - Environmental testing - Part 2-20: Tests - EN 60068-2-20 -
Test T: Test methods for solderability and
resistance to soldering heat of devices with
leads
IEC 60068-2-58 - Environmental testing - Part 2-58: Tests - EN 60068-2-58 -
Test Td: Test methods for solderability,
resistance to dissolution of metallization
and to soldering heat of surface mounting
devices (SMD)
IEC 60079-7 - Explosive atmospheres - Part 7: Equipment EN 60079-7 -
protection by increased safety "e"
IEC 60194 - Printed board design, manufacture and - -
assembly - Terms and definitions
IEC 61189-5-502 - Test methods for electrical materials, - -
printed boards and other interconnection
structures and assemblies - Part 5-502:
General test methods for materials and
assemblies - Surface insulation resistance
(SIR) testing of assemblies
IEC 61190-1-3 - Attachment materials for electronic EN IEC 61190-1-3 -
assembly - Part 1-3: Requirements for
electronic grade solder alloys and fluxed
and non-fluxed solid solder for electronic
soldering applications
IPC-TM-650 - Surface Insulation Resistance - -
method 2.6.3.7
IPC 9202 - Material and Process Characterisation / - -
Qualification Test Protocol for Assessing
Electrochemical Performance
IPC 9203 - Users Guide to IPC 9202 and the IPC-B-52 - -
Standard Test Vehicle
IEC 61189-5-504 ®
Edition 1.0 2020-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Test methods for electrical materials, printed board and other interconnection

structures and assemblies –
Part 5-504: General test methods for materials and assemblies – Process ionic

contamination testing (PICT)
Méthodes d'essai pour les matériaux électriques, les cartes imprimées et autres

structures d'interconnexion et ensembles –

Partie 5-504: Méthodes d'essai générales pour les matériaux et les ensembles –

Essai de contamination ionique des procédés (PICT)

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.180 ISBN 978-2-8322-8111-6

– 2 – IEC 61189-5-504:2020  IEC 2020
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 7
4 General description of the test . 7
5 Test apparatus . 7
6 Materials . 8
6.1 Test solution . 8
6.1.1 General . 8
6.1.2 Deionised water (DI) . 8
6.1.3 Propan-2-ol . 9
6.2 Calibration solution . 9
6.3 Test chamber . 9
6.4 Regeneration filter column . 9
6.5 Recirculating pump . 9
6.6 Measurement system capability . 9
7 Test procedure . 9
7.1 Test apparatus . 9
7.2 Closed loop . 10
7.3 Open loop . 11
7.4 System verification . 12
7.4.1 General . 12
7.4.2 Polishing the test solution . 12
7.4.3 Recording test solution temperature and specific gravity. 12
7.4.4 Checking conductivity accuracy . 13
7.5 Procedure . 14
7.5.1 Specimen handling . 14
7.5.2 General . 14
7.5.3 Closed loop . 14
7.5.4 Open loop . 15
7.5.5 Influence of CO . 15
8 Measurement Methods . 16
8.1 Method 1. 16
8.2 Method 2. 17
Annex A (normative) Test technique . 18
A.1 Conductivity signal . 18
A.2 DI water correction . 18
A.3 Conductivity of the ionic solution . 19
A.3.1 General . 19
A.3.2 Conductivity differences. 20
A.4 Test solution temperature . 20
A.4.1 General . 20
A.4.2 Linear temperature . 20
A.4.3 Leaching effects . 20
A.5 Conversion of conductivity to contamination . 21
A.6 Calibration . 21

IEC 61189-5-504:2020  IEC 2020 – 3 –
Annex B (informative) Measurement methods . 22
B.1 Method 1. 22
B.2 Method 2. 24
Bibliography . 25

Figure 1 – Typical test instrument . 8
Figure 2 – Closed-loop method in regeneration mode . 10
Figure 3 – Closed loop in test mode .
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.