Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method

Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.

Integrierte Schaltungen - Messung von elektromagnetischen Aussendungen im Frequenzbereich von 150 kHz bis 1 GHz - Teil 4: Messung der leitungsgeführten Aussendungen - Messung mit direkter 1 Ohm/150 Ohm-Kopplung

Circuits intégrés - Mesure des émissions électromagnétiques, 150 kHz à 1 GHz - Partie 4: Mesure des émissions conduites - Méthode par couplage direct 1 ohm/150 ohm

Spécifie une méthode de mesure de l'émission électromagnétique conduite des circuits intégrés par mesure directe des courants RF avec une sonde résistive de 1 ohm et mesure des tensions RF en utilisant un réseau de couplage de 150 ohm. Ces méthodes garantissent un degré élevé de répétabilité, ainsi que la corrélation des mesures.

Integrirana vezja – Meritve elektromagnetnega sevanja, od 150 kHz do 1 GHz – 4. del: Meritve prevajanega sevanja – Metoda neposrednega sklopa 1 ohm/150 ohmov (IEC 61967-4:2002)

Določa metodo za meritve prevajanega sevanja integriranih vezij z neposrednim merjenjem radiofrekvenčnega toka z 1-ohmsko uporovno sondo in meritvijo radiofrekvenčne napetosti z omrežjem z neposrednim sklopom 150 ohmov. Ta metoda zagotavlja visoko stopnjo ponovljivosti in korelacije meritev.
Vsebina popravka 1 iz junija 2017 je vključena v tej različici.

General Information

Status
Published
Publication Date
13-Jun-2002
Withdrawal Date
31-May-2005
Drafting Committee
Parallel Committee
Current Stage
6060 - Document made available - Publishing
Start Date
14-Jun-2002
Completion Date
14-Jun-2002

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SLOVENSKI SIST EN 61967-4:2005

STANDARD
december 2005
Integrirana vezja – Meritve elektromagnetnega sevanja, od 150 kHz do 1 GHz –
4. del: Meritve prevajanega sevanja – Metoda neposrednega sklopa 1 ohm/150
ohmov (IEC 61967-4:2002)
Integrated circuits – Measurement of electromagnetic emissions, 150 kKHz to 1
GHz – Part 4: Measurement of conducted emissions – 1 ohm/150 ohm direct
coupling method (IEC 61967-4:2002)
ICS 31.200 Referenčna številka
SIST EN 61967-4:2005(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

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EUROPEAN STANDARD EN 61967-4
NORME EUROPÉENNE
EUROPÄISCHE NORM June 2002
ICS 31.200
English version
Integrated circuits -
Measurement of electromagnetic emissions, 150 kHz to 1 GHz
Part 4: Measurement of conducted emissions -
1 ohm/150 ohm direct coupling method
(IEC 61967-4:2002)
Circuits intégrés - Integrierte Schaltungen -
Mesure des émissions électromagnétiques, Messung von elektromagnetischen
150 kHz à 1 GHz Aussendungen im Frequenzbereich
Partie 4: Mesure des émissions conduites - von 150 kHz bis 1 GHz
Méthode par couplage direct Teil 4: Messung der leitungsgeführten
1 ohm/150 ohm Aussendungen -
(CEI 61967-4:2002) Messung mit direkter
1 Ohm/150 Ohm-Kopplung
(IEC 61967-4:2002)
This European Standard was approved by CENELEC on 2002-06-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta,
Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2002 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61967-4:2002 E

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EN 61967-4:2002 - 2 -
Foreword
The text of document 47A/636/FDIS, future edition 1 of IEC 61967-4, prepared by SC 47A, Integrated
circuits, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and
was approved by CENELEC as EN 61967-4 on 2002-06-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2003-03-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2005-06-01
Annexes designated "normative" are part of the body of the standard.
Annexes designated "informative" are given for information only.
In this standard, annexes A and ZA are normative and annexes B, C, D and E are informative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61967-4:2002 was approved by CENELEC as a European
Standard without any modification.
__________

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- 3 - EN 61967-4:2002
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
1) 2)
IEC 61000-4-6 - Electromagnetic compatibility (EMC) EN 61000-4-6 1996
Part 4-6: Testing and measurement
techniques - Immunity to conducted
disturbances, induced by radio-
frequency fields
1) 2)
IEC 61967-1 - Integrated circuits - Measurement of EN 61967-1 2002
electromagnetic emissions, 150 kHz to
1 GHz
Part 1: Gene
...

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