EN 60749-5:2003
(Main)Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 5: Essai continu de durée de vie sous température et humidité avec polarisation
Décrit un essai continu de durée de vie utilisant la température et l'humidité avec polarisation pour évaluer la fiabilité des dispositifs à semiconducteurs sous boîtier non hermétique dans les environnements humides.
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2003)
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SLOVENSKI SIST EN 60749-5:2004
STANDARD
julij 2004
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-
state temperature humidity bias life test (IEC 60749-5:2003)
ICS 31.080.01 Referenčna številka
SIST EN 60749-5:2004(en)
© Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno
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EUROPEAN STANDARD EN 60749-5
NORME EUROPÉENNE
EUROPÄISCHE NORM March 2003
ICS 31.080.01
English version
Semiconductor devices -
Mechanical and climatic test methods
Part 5: Steady-state temperature humidity bias life test
(IEC 60749-5:2003)
Dispositifs à semiconducteurs - Halbleiterbauelemente -
Méthodes d'essais mécaniques Mechanische und klimatische Prüfverfahren
et climatiques Teil 5: Lebensdauerprüfung bei
Partie 5: Essai continu de durée konstanter Temperatur und Feuchte
de vie sous température et humidité unter elektrischer Beanspruchung
avec polarisation (IEC 60749-5:2003)
(CEI 60749-5:2003)
This European Standard was approved by CENELEC on 2003-03-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta,
Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60749-5:2003 E
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EN 60749-5:2003 - 2 -
Foreword
The text of document 47/1661/FDIS, future edition 1 of IEC 60749-5, prepared by IEC TC 47,
Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 60749-5 on 2003-03-01.
This mechanical and climatic test method, as is relates to steady-state temperature humidity bias life
test, is a complete rewrite of the test contained in Clause 4B, Chapter 3 of EN 60749:1999.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2003-12-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2006-03-01
Annexes designated "normative" are part of the body of the standard.
In this standard, annex ZA is normative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60749-5:2003 was approved by CENELEC as a European
Standard without any modification.
__________
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- 3 - EN 60749-5:2003
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
1) 2)
IEC 60749-4 - Semiconductor devices - Mechanical EN 60794-4 2002
and climatic test methods
Part 4: Damp heat, steady-state, highly
accelerated stress test (HAST)
1)
Undated reference.
2)
Valid edition at date of issue.
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NORME CEI
INTERNATIONALE IEC
60749-5
INTERNATIONAL
Première édition
STANDARD
First edition
20
...
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