ES 59008-4-1:2000
(Main)Data requirements for semiconductor die -- Part 4-1: Specific requirements and recommendations - Test and quality
Data requirements for semiconductor die -- Part 4-1: Specific requirements and recommendations - Test and quality
D129/C113: BTTF 97-1 disbanded * Superseded by 62258 series
Zahtevani podatki za polprevodniška integrirana vezja - 4-1. del: Specifične zahteve in priporočila - Preskus in kakovost
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
SIST-TS ES 59008-4-1:2007
01-januar-2007
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Data requirements for semiconductor die -- Part 4-1: Specific requirements and
recommendations - Test and quality
Ta slovenski standard je istoveten z: ES 59008-4-1:2000
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
SIST-TS ES 59008-4-1:2007 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST-TS ES 59008-4-1:2
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