ES 59008-4-3:1999
(Main)Data requirements for semiconductor die -- Part 4-3: Specific requirements and recommendations - Thermal
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- 28-Nov-1999
- CLC/BTTF 97-1
Data requirements for semiconductor die -- Part 4-3: Specific requirements and recommendations - Thermal
CECC/WG KGD superseded by BTTF 97-1 * Superseded by EN 62258-6:2006
Zahtevani podatki za polprevodniška integrirana vezja - 4-3. del: Specifične zahteve in priporočila -Termični pogoji
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
SIST-TS ES 59008-4-3:2007
01-januar-2007
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]DKWHYHLQSULSRURþLOD7HUPLþQLSRJRML
Data requirements for semiconductor die -- Part 4-3: Specific requirements and
recommendations - Thermal
Ta slovenski standard je istoveten z: ES 59008-4-3:1999
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
SIST-TS ES 59008-4-3:2007 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST-TS ES 59008-4-3:2007
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