EN 61788-16:2013
(Main)Superconductivity - Part 16: Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave frequencies
Superconductivity - Part 16: Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave frequencies
IEC 61788-16:2013 involves describing the standard measurement method of power-dependent surface resistance of superconductors at microwave frequencies by the sapphire resonator method. The measuring item is the power dependence of Rs at the resonant frequency. This method is the applicable for a frequency in the range of 10 GHz, for an input microwave power lower than 37 dBm (5 W). The aim is to report the surface resistance data at the measured frequency and that scaled to 10 GHz. Keyword: superconductivity
Supraleitfähigkeit - Teil 16: Messungen der elektronischen Charakteristik - Leistungsabhängiger Oberflächenwiderstand von Supraleitern bei Mikrowellenfrequenzen
Supraconductivité - Partie 16: Mesures de caractéristiques électroniques - Résistance de surface des supraconducteurs aux hyperfréquences en fonction de la puissance
La CEI 61788-16:2013 décrit la méthode de mesure normale de la résistance de surface des supraconducteurs aux hyperfréquences en fonction de la puissance par la méthode du résonateur au saphir. La grandeur de mesure est la dépendance en fonction de la puissance de Rs à la fréquence de résonance. Cette méthode est applicable à des fréquences de l'ordre de 10 GHz pour une puissance d'entrée inférieure à 37 dBm (5 W). Il s'agit de consigner dans un rapport les données de résistance de surface à la fréquence mesurée et celles qui sont ramenées à une échelle de 10 GHz. Mot clé: supraconductivité
Superprevodnost - 16. del: Meritve elektronskih karakteristik - Površinska upornost superprevodnikov, odvisna od moči, pri mikrovalovnih frekvencah
Ta del IEC 61788 vključuje opis standardne merilne metode od napajanja odvisne površinske upornosti superprevodnikov pri mikrovalovnih frekvencah po metodi safirskega resonatorja. Predmet meritve je odvisnost napajanja Rs pri resonančni frekvenci. Spodaj je naveden ustrezen merilni obseg površinskih upornosti za to metodo:
Frekvenca: f ~ 10 GHz
Vhodna mikrovalovna moč: Pin < 37 dBm (5 W)
Namen je sporočiti podatke o površinski upornosti pri izmerjeni frekvenci, prilagojeni do 10 GHz, s pomočjo primerjalnega razmerja Rs f2.
General Information
Standards Content (Sample)
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.RYUãLQVNDNYHQFDKSupraleitfähigkeit - Teil 16: Messung der elektronischen Eigenschaften - Leistungsabhängiger Oberflächenwiderstand bei MikrowellenfrequenzenSupraconductivité - Partie 16: Mesures de caractéristiques électroniques - Résistance de surface des supraconducteurs aux hyperfréquences en fonction de la puissanceSuperconductivity - Part 16: Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave frequencies29.050Superprevodnost in prevodni materialiSuperconductivity and conducting materials17.220.20Measurement of electrical and magnetic quantitiesICS:Ta slovenski standard je istoveten z:EN 61788-16:2013SIST EN 61788-16:2013en01-julij-2013SIST EN 61788-16:2013SLOVENSKI
STANDARD
EUROPEAN STANDARD EN 61788-16 NORME EUROPÉENNE
EUROPÄISCHE NORM April 2013
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2013 CENELEC -
All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61788-16:2013 E
ICS 17.220.20; 29.050
English version
Superconductivity -
Part 16: Electronic characteristic measurements -
Power-dependent surface resistance of superconductors at microwave frequencies (IEC 61788-16:2013)
Supraconductivité -
Partie 16: Mesures de caractéristiques électroniques -
Résistance de surface des supraconducteurs aux hyperfréquences en fonction de la puissance (CEI 61788-16:2013)
Supraleitfähigkeit -
Teil 16: Messung der elektronischen Eigenschaften -
Leistungsabhängiger Oberflächenwiderstand bei Mikrowellenfrequenzen (IEC 61788-16:2013)
This European Standard was approved by CENELEC on 2013-02-20. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
Foreword The text of document 90/309/FDIS, future edition 1 of IEC 61788-16, prepared by IEC TC 90, "Superconductivity" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61788-16:2013.
The following dates are fixed: • latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2013-11-20 • latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2016-02-20
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61788-16:2013 was approved by CENELEC as a European Standard without any modification. SIST EN 61788-16:2013
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Annex ZA
(normative)
Normative references to international publications with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
NOTE
When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
Publication Year Title EN/HD Year
IEC 60050 Series International electrotechnical vocabulary
- -
IEC 61788-15 - Superconductivity -
Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies EN 61788-15 -
IEC 61788-16 Edition 1.0 2013-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Superconductivity –
Part 16: Electronic characteristic measurements – Power-dependent surface resistance of superconductors at microwave frequencies
Supraconductivité –
Partie 16: Mesures de caractéristiques électroniques – Résistance de surface des supraconducteurs aux hyperfréquences en fonction de la puissance
INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE V ICS 17.220.20; 29.050 PRICE CODE CODE PRIX ISBN 978-2-83220-582-2
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CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope . 7 2 Normative references . 7 3 Terms and definitions . 7 4 Requirements . 8 5 Apparatus . 8 5.1 Measurement system . 8 5.1.1 Measurement system for the tan δ of the sapphire rod . 8 5.1.2 Measurement system for the power dependence of the surface resistance of superconductors at microwave frequencies . 9 5.2 Measurement apparatus . 10 5.2.1 Sapphire resonator . 10 5.2.2 Sapphire rod . 10 5.2.3 Superconductor films . 11 6 Measurement procedure . 11 6.1 Set-up . 11 6.2 Measurement of the tan δ of the sapphire rod . 11 6.2.1 General . 11 6.2.2 Measurement of the frequency response of the TE021 mode . 11 6.2.3 Measurement of the frequency response of the TE012 mode . 13 6.2.4 Determination of tan δ of the sapphire rod . 13 6.3 Power dependence measurement . 14 6.3.1 General . 14 6.3.2 Calibration of the incident microwave power to the resonator. 15 6.3.3 Measurement of the reference level . 15 6.3.4 Surface resistance measurement as a function of the incident microwave power . 15 6.3.5 Determination of the maximum surface magnetic flux density . 15 7 Uncertainty of the test method . 16 7.1 Surface resistance. 16 7.2 Temperature . 17 7.3 Specimen and holder support structure . 18 7.4 Specimen protection . 18 8 Test report . 18 8.1 Identification of the test specimen . 18 8.2 Report of power dependence of Rs values. 18 8.3 Report of test conditions . 18 Annex A (informative)
Additional information relating to Clauses 1 to 7 . 19 Annex B (informative)
Uncertainty considerations . 24 Bibliography . 29
Figure 1 – Measurement system for tan δ of the sapphire rod . 9 Figure 2 – Measurement system for the microwave power dependence of the surface resistance . 9 SIST EN 61788-16:2013
61788-16 © IEC:2013 – 3 –
Figure 3 – Sapphire resonator (open type) to measure the surface resistance of superconductor films . 10 Figure 4 – Reflection scattering parameters (|S11| and |S22|) . 13 Figure 5 – Term definitions in Table 3 . 17 Figure A.1 – Three types of sapphire rod resonators . 19 Figure A.2 – Mode chart for a sapphire resonator (see IEC 61788-15) . 20 Figure A.3 – Loaded quality factor QL measurements using the conventional 3 dB method and the circle fit method . 21 Figure A.4 – Temperature dependence of tan δ of a sapphire rod measured using the two-resonance mode dielectric resonator method [3] . 22 Figure A.5 – Dependence of the surface resistance Rs on the maximum surface magnetic flux density Bs max [3] . 23
Table 1 – Typical dimensions of the sapphire rod . 11 Table 2 – Specifications of the vector network analyzer . 16 Table 3 – Specifications of the sapphire rods . 17 Table B.1 – Output signals from two nominally identical extensometers . 25 Table B.2 – Mean values of two output signals . 25 Table B.3 – Experimental standard deviations of two output signals . 25 Table B.4 – Standard uncertainties of two output signals . 26 Table B.5 – Coefficient of Variations of two output signals . 26
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INTERNATIONAL ELECTROTECHNICAL COMMISSION ____________
SUPERCONDUCTIVITY –
Part 16: Electronic characteristic measurements –
Power-dependent surface resistance
of superconductors at microwave frequencies
FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote interna
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