Electromagnetic compatibility (EMC) - Part 4-30: Testing and measurement techniques - Power quality measurement methods

IEC 61000-4-30:2008 defines the methods for measurement and interpretation of results for power quality parameters in 50/60 Hz a.c. power supply systems. Measurement methods are described for each relevant parameter in terms that give reliable and repeatable results, regardless of the method's implementation. This standard addresses measurement methods for in situ measurements. Measurement of parameters covered by this standard is limited to voltage phenomena that can be conducted in a power system. The power quality parameters considered in this standard are power frequency, magnitude of the supply voltage, flicker, supply voltage dips and swells, voltage interruptions, transient voltages, supply voltage unbalance, voltage harmonics and interharmonics, mains signalling on the supply voltage and rapid voltage changes. Depending on the purpose of the measurement, all or a subset of the phenomena on this list may be measured. IEC 61000-4-30:2008 gives measurement methods and appropriate performance requirements, but does not set thresholds. The effects of transducers inserted between the power system and the instrument are acknowledged but not addressed in detail in this standard. Precautions on installing monitors on live circuits are addressed. IEC 61000-4-30:2008 has the status of a basic EMC publication in accordance with IEC Guide 107. This second edition cancels and replaces the first edition published in 2003. This edition includes the following significant technical changes with respect to the previous edition: - Adjustments, clarifications, and corrections to class A and class B measurement methods. - A new category, class S, intended for survey instruments, has been added. - A new Annex C gives guidance on instruments.

Elektromagnetische Verträglichkeit (EMV) - Teil 4-30: Prüf- und Messverfahren - Verfahren zur Messung der Spannungsqualität

Compatibilité électromagnétique (CEM) - Partie 4-30: Techniques d'essai et de mesure - Méthodes de mesure de la qualité de l'alimentation

La CEI 61000-4-30:2008 définit les méthodes de mesure des paramètres de qualité de l'alimentation des réseaux à courant alternatif 50/60 Hz et la façon d'interpréter les résultats. Les méthodes de mesure sont décrites pour chaque paramètre applicable en des termes qui fournissent des résultats fiables et répétitifs indépendamment de l'implémentation de la méthode. La présente norme porte sur les méthodes de mesure destinées aux mesures in situ. La mesure des paramètres couverts par la présente norme se limite aux phénomènes en tension susceptibles de se propager sur un réseau d'énergie électrique. Les paramètres de qualité de l'alimentation pris en compte dans la présente norme sont la fréquence, l'amplitude de la tension d'alimentation, le papillotement ('flicker'), les creux et les surtensions temporaires d'alimentation, les coupures de tension, les tensions transitoires, le déséquilibre de tension d'alimentation, les harmoniques et interharmoniques de tension, les signaux transmis sur la tension d'alimentation et les variations rapides de tension. En fonction de l'objet de la mesure, les mesures peuvent porter soit sur une partie des phénomènes de cette liste, soit sur l'ensemble. La CEI 61000-4-30:2008 fournit des méthodes de mesure et des exigences de performances appropriées sans fixer de seuils. Les effets des transducteurs lorsqu'ils sont placés entre le réseau et l'appareil de mesure sont pris en compte mais non traités en détail dans la présente norme. Les précautions à prendre pour installer des appareils de mesure sur des circuits sous tension sont indiquées dans la présente norme. La CEI 61000-4-30:2008 a le statut de publication fondamentale en CEM conformément au guide 107 de la CEI. Cette deuxième édition annule et remplace la première édition parue en 2003. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: - Ajustements, clarifications et corrections sur les méthodes de mesures pour la classe A et la classe B. - Une nouvelle catégorie, la classe S, destinée aux appareils de mesure pour des campagnes statistiques, a été ajoutée. - Une nouvelle annexe C fournit des recommandations sur les appareils de mesure.

Elektromagnetna združljivost (EMC) - 4-30. del: Preskusne in merilne tehnike - Metode merjenja kakovosti napetosti (IEC 61000-4-30:2008)

General Information

Status
Withdrawn
Publication Date
13-Jan-2009
Current Stage
6060 - Document made available
Due Date
14-Jan-2009
Completion Date
14-Jan-2009

RELATIONS

Buy Standard

Standard
EN 61000-4-30:2009
English language
65 pages
sale 10% off
Preview
sale 10% off
Preview

e-Library read for
1 day

Standards Content (sample)

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Elektromagnetna združljivost (EMC) - 4-30. del: Preskusne in merilne tehnike - Metode merjenja kakovosti napetosti (IEC 61000-4-30:2008)Elektromagnetische Verträglichkeit (EMV) -- Teil 4-30: Prüf- und Messverfahren – Verfahren zur Messung der SpannungsqualitätCompatibilité Electromagnétique (CEM) -- Partie 4-30: Techniques d'essai et de mesure - Méthodes de mesure de la qualité de l'alimentationElectromagnetic compatibility (EMC) -- Part 4-30 : Testing and measurement techniques - Power quality measurement methods33.100.01Elektromagnetna združljivost na splošnoElectromagnetic compatibility in generalICS:Ta slovenski standard je istoveten z:EN 61000-4-30:2009SIST EN 61000-4-30:2009en01-september-2009SIST EN 61000-4-30:2009SLOVENSKI

STANDARDSIST EN 61000-4-30:20031DGRPHãþD
SIST EN 61000-4-30:2009
EUROPEAN STANDARD EN 61000-4-30 NORME EUROPÉENNE
EUROPÄISCHE NORM January 2009

CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: avenue Marnix 17, B - 1000 Brussels
© 2009 CENELEC -

All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 61000-4-30:2009 E
ICS 33.100.99 Supersedes EN 61000-4-30:2003
English version
Electromagnetic compatibility (EMC) -
Part 4-30: Testing and measurement techniques -
Power quality measurement methods (IEC 61000-4-30:2008)
Compatibilité électromagnétique (CEM) - Partie 4-30: Techniques d'essai
et de mesure -
Méthodes de mesure
de la qualité de l'alimentation (CEI 61000-4-30:2008)
Elektromagnetische
Verträglichkeit (EMV) -
Teil 4-30: Prüf- und Messverfahren -
Verfahren zur Messung
der Spannungsqualität (IEC 61000-4-30:2008)

This European Standard was approved by CENELEC on 2008-12-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom.

SIST EN 61000-4-30:2009
EN 61000-4-30:2009
- 2 -

Foreword The text of document 77A/660/FDIS, future edition 2 of IEC 61000-4-30, prepared by SC 77A, Low frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61000-4-30 on 2008-12-01. This European Standard supersedes EN 61000-4-30:2003. EN 61000-4-30:2009 includes the following significant technical changes with respect to EN 61000-4-30:2003. –

adjustments, clarifications, and corrections to class A and class B measurement methods; –

a new category, class S, intended for survey instruments, has been added; –

a new Annex C gives guidance on instruments. The following dates were fixed: – latest date by which the EN has to be implemented

at national level by publication of an identical
national standard or by endorsement
(dop)
2009-09-01 – latest date by which the national standards conflicting
with the EN have to be withdrawn
(dow)

2011-12-01 Annex ZA has been added by CENELEC. __________ Endorsement notice The text of the International Standard IEC 61000-4-30:2008 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60044-1 NOTE

Harmonized as EN 60044-1:1999 (modified). IEC 60044-2 NOTE
Harmonized as EN 60044-2:1999 (modified). IEC 61000-2-12 NOTE
Harmonized as EN 61000-2-12:2003 (not modified). IEC 61000-3-3 + A1 + A2 NOTE
Harmonized as EN 61000-3-3:1995 (not modified)
+ A1:2001
+ A2:2005 IEC 61000-3-11 NOTE
Harmonized as EN 61000-3-11:2000 (not modified). IEC 61010 NOTE
Harmonized in EN 61010 series (not modified). IEC 61010-2-032 NOTE
Harmonized as EN 61010-2-032:2002 (not modified). IEC 61557-12 NOTE
Harmonized as EN 61557-12:2008 (not modified). __________
SIST EN 61000-4-30:2009
- 3 - EN 61000-4-30:2009 Annex ZA (normative)

Normative references to international publications with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.

NOTE

When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.

Publication Year Title EN/HD Year
IEC 60050-161 -1) International Electrotechnical Vocabulary (IEV) -
Chapter 161: Electromagnetic compatibility - -
IEC 61000-2-2 2002 Electromagnetic compatibility (EMC) -

Part 2-2: Environment - Compatibility levels for low-frequency conducted disturbances and signalling in public low-voltage power supply systems EN 61000-2-2 20022)

IEC 61000-2-4 -1) Electromagnetic compatibility (EMC) -

Part 2-4: Environment - Compatibility levels in industrial plants for low-frequency conducted disturbances EN 61000-2-4 20022)

IEC 61000-3-8 -1) Electromagnetic compatibility (EMC) -

Part 3-8: Limits - Signalling on low-voltage electrical installations - Emission levels, frequency bands and electromagnetic disturbance levels - -

IEC 61000-4-4 2004 Electromagnetic compatibility (EMC) -

Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test EN 61000-4-4 2004

IEC 61000-4-7 A1 2002 2008 Electromagnetic compatibility (EMC) -

Part 4-7: Testing and measurement techniques - General guide on harmonics and interharmonics measurements and instrumentation, for power supply systems and equipment connected thereto EN 61000-4-7 A1 2002 200X3)

IEC 61000-4-15 -1) Electromagnetic compatibility (EMC) -

Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications EN 61000-4-15 19982)

IEC 61180 Series High-voltage test techniques for low-voltage equipment
EN 61180 Series

1) Undated reference. 2) Valid edition at date of issue. 3) To be ratified. SIST EN 61000-4-30:2009

SIST EN 61000-4-30:2009

IEC 61000-4-30Edition 2.0 2008-10INTERNATIONAL STANDARD NORME INTERNATIONALEElectromagnetic compatibility (EMC) –

Part 4-30: Testing and measurement techniques – Power quality measurement methods

Compatibilité électromagnétique (CEM) –

Partie 4-30: Techniques d’essai et de mesure – Méthodes de mesure de la qualité de l’alimentation

INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XBICS 33.100.99 PRICE CODECODE PRIXISBN 2-8318-1002-0BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM® Registered trademark of the International Electrotechnical Commission

Marque déposée de la Commission Electrotechnique Internationale SIST EN 61000-4-30:2009

– 2 – 61000-4-30 © IEC:2008

CONTENTS FOREWORD...........................................................................................................................4 INTRODUCTION.....................................................................................................................6 1 Scope...............................................................................................................................7 2 Normative references........................................................................................................7 3 Terms and definitions.......................................................................................................8 4 General..........................................................................................................................12 4.1 Classes of measurement methods.........................................................................12 4.2 Organization of the measurements.........................................................................13 4.3 Electrical values to be measured............................................................................13 4.4 Measurement aggregation over time intervals........................................................14 4.5 Measurement aggregation algorithm......................................................................14 4.5.1 Requirements............................................................................................14 4.5.2 150/180 cycle aggregation.........................................................................14 4.5.3 10 min aggregation....................................................................................15 4.5.4 2 hour aggregation.....................................................................................18 4.6 Real time clock (RTC) uncertainty..........................................................................18 4.7 Flagging concept...................................................................................................18 5 Power quality parameters................................................................................................19 5.1 Power frequency....................................................................................................19 5.1.1 Measurement method................................................................................19 5.1.2 Measurement uncertainty and measuring range..........................................19 5.1.3 Measurement evaluation............................................................................19 5.1.4 Aggregation...............................................................................................19 5.2 Magnitude of the supply voltage.............................................................................20 5.2.1 Measurement method................................................................................20 5.2.2 Measurement uncertainty and measuring range..........................................20 5.2.3 Measurement evaluation............................................................................20 5.2.4 Aggregation...............................................................................................20 5.3 Flicker...................................................................................................................20 5.3.1 Measurement method................................................................................20 5.3.2 Measurement uncertainty and measuring range..........................................20 5.3.3 Measurement evaluation............................................................................21 5.3.4 Aggregation...............................................................................................21 5.4 Supply voltage dips and swells...............................................................................21 5.4.1 Measurement method................................................................................21 5.4.2 Detection and evaluation of a voltage dip...................................................22 5.4.3 Detection and evaluation of a voltage swell................................................22 5.4.4 Calculation of a sliding reference voltage...................................................23 5.4.5 Measurement uncertainty and measuring range..........................................23 5.4.6 Aggregation...............................................................................................24 5.5 Voltage interruptions..............................................................................................24 5.5.1 Measurement method................................................................................24 5.5.2 Evaluation of a voltage interruption............................................................24 5.5.3 Measurement uncertainty and measuring range..........................................25 5.5.4 Aggregation...............................................................................................25 5.6 Transient voltages.................................................................................................25 SIST EN 61000-4-30:2009

61000-4-30 © IEC:2008 – 3 –

5.7 Supply voltage unbalance......................................................................................25 5.7.1 Measurement method................................................................................25 5.7.2 Measurement uncertainty and measuring range..........................................26 5.7.3 Measurement evaluation............................................................................26 5.7.4 Aggregation...............................................................................................26 5.8 Voltage harmonics.................................................................................................26 5.8.1 Measurement method................................................................................26 5.8.2 Measurement uncertainty and measuring range..........................................27 5.8.3 Measurement evaluation............................................................................27 5.8.4 Aggregation...............................................................................................27 5.9 Voltage interharmonics..........................................................................................27 5.9.1 Measurement method................................................................................27 5.9.2 Measurement uncertainty and measuring range..........................................28 5.9.3 Measurement evaluation............................................................................28 5.9.4 Aggregation...............................................................................................28 5.10 Mains signalling voltage on the supply voltage.......................................................28 5.10.1 Measurement method................................................................................28 5.10.2 Measurement uncertainty and measuring range..........................................29 5.10.3 Measurement evaluation............................................................................29 5.10.4 Aggregation...............................................................................................29 5.11 Rapid Voltage Changes (RVC)...............................................................................29 5.12 Measurement of underdeviation and overdeviation parameters...............................29 5.12.1 Measurement method................................................................................29 5.12.2 Measurement uncertainty and measuring range..........................................30 5.12.3 Aggregation...............................................................................................30 6 Range of influence quantities and steady-state verification..............................................30 6.1 Range of influence quantities.................................................................................30 6.2 Steady-state performance verification....................................................................32 Annex A (informative)

Power quality measurements – Issues and guidelines.........................34 Annex B (informative)

Power quality measurement – Guidance for applications....................47 Annex C (informative)

Guidance on instruments...................................................................59 Bibliography..........................................................................................................................62

Figure 1 – Measurement chain..............................................................................................13 Figure 2 – Synchronization of aggregation intervals for Class A.............................................15 Figure 3 – Synchronization of aggregation intervals for class S: parameters for which gaps are not permitted..........................................................................................................16 Figure 4 – Synchronization of aggregation intervals for class S: parameters for which gaps are permitted (see 4.5.2)...............................................................................................17 Figure 5 – Example of supply voltage unbalance uncertainty..................................................26 Figure A.1 – Frequency spectrum of typical representative transient test waveforms..............40

Table 1 – Influence quantity range.........................................................................................31 Table 2 – Uncertainty steady-state verification for class A and class S...................................33 Table C.1 – Summary of requirements...................................................................................60

SIST EN 61000-4-30:2009
– 4 – 61000-4-30 © IEC:2008
INTERNATIONAL ELECTROTECHNICAL COMMISSION ____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-30: Testing and measurement techniques –
Power quality measurement methods

FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61000-4-30 has been prepared by subcommittee 77A: Low- frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility. This standard forms part 4-30 of IEC 61000. It has the status of a basic EMC publication in accordance with IEC Guide 107. This second edition cancels and replaces the first edition published in 2003. This edition includes the following significant technical changes with respect to the previous edition. – Adjustments, clarifications, and corrections to class A and class B measurement methods. – A new category, class S, intended for survey instruments, has been added. – A new Annex C gives guidance on instruments. SIST EN 61000-4-30:2009

61000-4-30 © IEC:2008 – 5 –

The text of this standard is based on the following documents: FDIS Report on voting 77A/660/FDIS 77A/666/RVD

Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 61000 series, under the general title Electromagnetic compatibility (EMC), can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to the specific publication. At this date, the publication will be • reconfirmed, • withdrawn, • replaced by a revised edition, or • amended. SIST EN 61000-4-30:2009

– 6 – 61000-4-30 © IEC:2008

INTRODUCTION IEC 61000 is published in separate parts according to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Limits Emission limits Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and devices Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided into several parts, published either as International Standards or as Technical Specifications or Technical Reports, some of which have already been published as sections. Others will be published with the part number followed by a dash and completed by a second number identifying the subdivision (example: IEC 61000-6-1). SIST EN 61000-4-30:2009

61000-4-30 © IEC:2008 – 7 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-30: Testing and measurement techniques –
Power quality measurement methods

1 Scope This part of IEC 61000-4 defines the methods for measurement and interpretation of results for power quality parameters in 50/60 Hz a.c. power supply systems. Measurement methods are described for each relevant parameter in terms that give reliable and repeatable results, regardless of the method’s implementation. This standard addresses measurement methods for in situ measurements. Measurement of parameters covered by this standard is limited to voltage phenomena that can be conducted in a power system. The power quality parameters considered in this standard are power frequency, magnitude of the supply voltage, flicker, supply voltage dips and swells, voltage interruptions, transient voltages, supply voltage unbalance, voltage harmonics and interharmonics, mains signalling on the supply voltage and rapid voltage changes. Depending on the purpose of the measurement, all or a subset of the phenomena on this list may be measured. NOTE 1 Information about current parameters may be found in A.3 and A.5. This standard gives measurement methods and appropriate performance requirements, but does not set thresholds. The effects of transducers inserted between the power system and the instrument are acknowledged but not addressed in detail in this standard. Precautions on installing monitors on live circuits are addressed. NOTE 2 Some guidance about effects of transducers may be found in IEC 61557-12. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161: Electro-magnetic compatibility IEC 61000-2-2:2002, Electromagnetic compatibility (EMC) – Part 2-2: Environment – Compatibility levels for low-frequency conducted disturbances and signalling in public low-voltage power supply systems IEC 61000-2-4, Electromagnetic compatibility (EMC) – Part 2-4: Environment – Compatibility levels in industrial plants for low-frequency conducted disturbances IEC 61000-3-8, Electromagnetic compatibility (EMC) – Part 3: Limits – Section 8: Signalling on low-voltage electrical installations – Emission levels, frequency bands and electromagnetic disturbance levels SIST EN 61000-4-30:2009

– 8 – 61000-4-30 © IEC:2008

IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and measure-ment techniques – Electrical fast transient/burst immunity test IEC 61000-4-7:2002, Electromagnetic compatibility (EMC) – Part 4-7: Testing and measure-ment techniques – General guide on harmonics and interharmonics measurements and instrumentation, for power supply systems and equipment connected thereto Amendment 1 (2008) IEC 61000-4-15, Electromagnetic compatibility (EMC) – Part 4: Testing and measurement techniques – Section 15: Flickermeter – Functional and design specifications IEC 61180 (all parts), High-voltage test techniques for low voltage equipment 3 Terms and definitions For the purpose of this document, the definitions of IEC 60050-161, as well as the following, apply. 3.1

channel individual measurement path through an instrument NOTE “Channel” and “phase” are not the same. A voltage channel is by definition the difference in potential between 2 conductors. Phase refers to a single conductor. On polyphase systems, a channel may be between 2 phases, or between a phase and neutral, or between a phase and earth, or between neutral and earth. 3.2

Coordinated Universal Time

UTC time scale which forms the basis of a coordinated radio dissemination of standard frequencies and time signals. It corresponds exactly in rate with international atomic time, but differs from it by an integral number of seconds. NOTE 1 Coordinated universal time is established by the International Bureau of Weights and Measures (BIPM) and the International Earth Rotation Service (IERS). NOTE 2 The UTC scale is adjusted by the insertion or deletion of seconds, so called positive or negative leap seconds, to ensure approximate agreement with UT1. [IEV 713-05-20] 3.3

declared input voltage
Udin value obtained from the declared supply voltage by a transducer ratio 3.4
declared supply voltage

Uc declared supply voltage Uc is normally the nominal voltage Un of the system. If, by agreement between the supplier and the customer, a voltage different from the nominal voltage is applied to the terminal, then this voltage is the declared supply voltage Uc 3.5

dip threshold voltage magnitude specified for the purpose of detecting the start and the end of a voltage dip SIST EN 61000-4-30:2009

61000-4-30 © IEC:2008 – 9 –
3.6

flagged data data that has been marked to indicate that its measurement or its aggregation may have been affected by interruptions, dips, or swells NOTE Flagging enables other methods that may prevent a single event from being counted as several different types of events. Flagging is supplemental information about a measurement or aggregation. Flagged data is not removed from the data set. In some applications, flagged data may be excluded from further analysis but in other applications, the fact that data was flagged may be unimportant. The user, application, regulation, or other standards determine the use of flagged data. See 4.7 for further explanation. 3.7

flicker impression of unsteadiness of visual sensation induced by a light stimulus whose luminance or spectral distribution fluctuates with time [IEV 161-08-13] 3.8

fundamental component component whose frequency is the fundamental frequency [IEV 101-14-49, modified] 3.9

fundamental frequency frequency in the spectrum obtained from a Fourier transform of a time function, to which all the frequencies of the spectrum are referred [IEV 101-14-50, modified] NOTE In case of any remaining risk of ambiguity, the fundamental frequency may be derived from the number of poles and speed of rotation of the synchronous generator(s) feeding the system. 3.10

harmonic component any of the components having a harmonic frequency [IEC 61000-2-2:2002, 3.2.4, modified] NOTE Its value is normally expressed as an r.m.s. value. For brevity, such

...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.