EN 61788-15:2011
(Main)Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.
Supraleitfähigkeit - Teil 15: Messungen der elektronischen Charakteristik - Oberflächenimpedanz von Supraleiterschichten bei Mikrowellenfrequenzen
Supraconductivité - Partie 15: Mesures de caractéristiques électroniques - Impédance de surface intrinsèque de films supraconducteurs aux fréquences micro-ondes
La CEI 61788-15:2011 décrit les mesures de l'impédance de surface intrinsèque (Zs) des films HTS aux fréquences micro-ondes par une méthode modifiée du résonateur diélectriques en mode deux résonances. L'objet de la mesure est d'obtenir la dépendance de l'impédance intrinsèque Zs vis-à-vis de la température à la fréquence de résonance f0.
Superprevodnost - 15. del: Meritve elektronskih karakteristik - Lastna površinska impedanca superprevodnih plasti pri mikrovalovnih frekvencah
Ta del standarda IEC 61788 opisuje meritve lastne površinske impedance (ZS) visokotemperaturnih superprevodnih (HTS) plasti pri mikrovalovnih frekvencah z metodo modificiranega dvoresonančnega dielektričnega resonatorja [13, 14]. Z meritvijo se ugotavlja temperaturna odvisnost lastne površinske impedance pri resonančni frekvenci f0. Razpon frekvence in debeline ter ločljivost meritev za lastno površinsko impedanco visokotemperaturnih superprevodnih plasti je: – frekvenca: do 40 GHz; – debelina plasti: večja od 50 nm; – ločljivost meritve: 0,01 mO pri 10 GHz. Poročati je treba o podatkih v zvezi z lastno površinsko impedanco pri izmerjeni frekvenci in pri prilagojeni frekvenci 10 GHz ob predpostavki pravila f2 za lastno površinsko upornost RS (f < 40 GHz) ter pravila f za lastno površinsko reaktanco XS za primerjavo.
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
01-marec-2012
Superprevodnost - 15. del: Meritve elektronskih karakteristik - Lastna površinska
impedanca superprevodnih plasti pri mikrovalovnih frekvencah
Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface
impedance of superconductor films at microwave frequencies
Supraleitfähigkeit - Teil 15: Messungen der elektronischen Charakteristik -
Oberflächenimpedanz von Supraleiterschichten bei Mikrowellenfrequenzen
Supraconductivité - Partie 15: Mesures de caractéristiques électroniques - Impédance de
surface intrinsèque de films supraconducteurs aux fréquences micro-ondes
Ta slovenski standard je istoveten z: EN 61788-15:2011
ICS:
17.220.20 0HUMHQMHHOHNWULþQLKLQ Measurement of electrical
PDJQHWQLKYHOLþLQ and magnetic quantities
29.050 Superprevodnost in prevodni Superconductivity and
materiali conducting materials
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD
EN 61788-15
NORME EUROPÉENNE
December 2011
EUROPÄISCHE NORM
ICS 29.050
English version
Superconductivity -
Part 15: Electronic characteristic measurements -
Intrinsic surface impedance of superconductor films at microwave
frequencies
(IEC 61788-15:2011)
Supraconductivité - Supraleitfähigkeit -
Partie 15: Mesures de caractéristiques Teil 15: Messungen der elektronischen
électroniques - Charakteristik -
Impédance de surface intrinsèque de films Oberflächenimpedanz von
supraconducteurs aux fréquences micro- Supraleiterschichten bei
ondes Mikrowellenfrequenzen
(CEI 61788-15:2011) (IEC 61788-15:2011)
This European Standard was approved by CENELEC on 2011-11-28. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the CEN-CENELEC Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the CEN-CENELEC Management Centre has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
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Spain, Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61788-15:2011 E
Foreword
The text of document 90/280/FDIS, future edition 1 of IEC 61788-15, prepared by IEC/TC 90
"Superconductivity" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
The following dates are fixed:
(dop) 2012-08-28
• latest date by which the document has
to be implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2014-11-28
• latest date by which the national
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent
rights.
Endorsement notice
The text of the International Standard IEC 61788-15:2011 was approved by CENELEC as a European
Standard without any modification.
- 3 - EN 61788-15:2011
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
IEC 60050-815 2000 International Electrotechnical Vocabulary - -
(IEV) -
Part 815: Superconductivity
IEC 61788-7 2006 Superconductivity - EN 61788-7 2006
Part 7: Electronic characteristic
measurements - Surface resistance of
superconductors at microwave frequencies
IEC 61788-15 ®
Edition 1.0 2011-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Superconductivity –
Part 15: Electronic characteristic measurements – Intrinsic surface impedance
of superconductor films at microwave frequencies
Supraconductivité –
Partie 15: Mesures de caractéristiques électroniques – Impédance de surface
intrinsèque de films supraconducteurs aux fréquences micro-ondes
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX X
ICS 29.050 ISBN 978-2-88912-710-8
– 2 – 61788-15 IEC:2011
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Requirements . 8
5 Apparatus . 9
5.1 Measurement equipment . 9
5.2 Measurement apparatus . 9
5.3 Dielectric rods . 13
5.4 Superconductor films and copper cavity . 14
6 Measurement procedure . 14
6.1 Set-up . 14
6.2 Measurement of the reference level. 14
6.3 Measurement of the R of oxygen-free high purity copper . 14
S
6.4 Determination of the effective R of superconductor films and tanδ of
S
standard dielectric rods . 17
6.5 Determination of the penetration depth . 18
6.6 Determination of the intrinsic surface impedance . 20
7 Uncertainty of the test method . 21
7.1 Measurement of unloaded quality factor . 21
7.2 Measurement of loss tangent. 21
7.3 Temperature . 22
7.4 Specimen and holder support structure . 22
8 Test Report . 22
8.1 Identification of test specimen . 22
8.2 Report of the intrinsic Z values . 22
S
8.3 Report of the test conditions . 22
Annex A (informative) Additional information relating to clauses 1 to 8 . 24
Annex B (informative) Uncertainty considerations . 41
Bibliography . 45
Figure 1 – Schematic diagram for the measurement equipment for the intrinsic Z of
S
HTS films at cryogenic temperatures . 10
Figure 2 – Schematic diagram of a dielectric resonator with a switch for thermal
connection . 10
Figure 3 – Typical dielectric resonator with a movable top plate . 11
Figure 4 – Switch block for thermal connection . 12
Figure 5 – Dielectric resonator assembled with a switch block for thermal connection . 13
Figure 6 – A typical resonance peak. Insertion attenuation IA, resonant frequency f
and half power bandwidth ∆f are defined . 16
3dB
Figure 7 – Reflection scattering parameters S and S . 18
11 22
Figure 8 – Definitions for terms in Table 5 . 22
Figure A.1 – Schematic diagram for the measurement system . 24
Figure A.2 – A motion stage using step motors . 25
61788-15 IEC:2011 – 3 –
Figure A.3 – Cross-sectional view of a dielectric resonator . 26
Figure A.4 – A diagram for simplied cross-sectional view of a dielectric resonator . 30
Figure A.5 – Mode chart for a sapphire resonator . 33
Figure A.6 – Frequency response of the sapphire resonator . 34
Figure A.7 – Q versus temperature for the TE and the TE modes of the sapphire
U 021 012
resonator with 360 nm-thick YBCO films . 35
Figure A.8 – The resonant frequency f versus temperature for the TE and TE
0 021 012
modes of the sapphire resonator with 360 nm-thick YBCO films . 35
Figure A.9 – The temperature dependence of the R of YBCO films with the
Se
thicknesses of 70 nm to 360 nm measured at ~40 GHz . 36
Figure A.10 – The temperature dependence of ∆λ for the YBCO films with the
e
thicknesses of 70 nm and 360 nm measured at ~40 GHz . 36
Figure A.11 – The penetration depths λ of the 360 nm-thick YBCO film measured at
10 kHz by using the mutual inductance method and at ~40 GHz by using sapphire
resonator . 37
Figure A.12 – The temperature dependence of the intrinsic surface resistance R of
S
YBCO films with the thicknesses of 70 nm to 360 nm measured at ~40 GHz . 37
Figure A.13 – Comparison of the temperature-dependent value of each term in
Equation (A.35) for the TE mode of the standard sapphire resonator . 38
Figure A.14 – Comparison of the temperature-dependent value of each term in
Equation (A.35) for the TE mode of the standard sapphire resonator . 38
Figure A.15 – Temperature dependence of uncertainty in the measured intrinsic R of
S
YBCO films . 39
Table 1 – Typical dimensions of a sapphire rod . 14
Table 2 – Typical dimensions of OFHC cavities and HTS films . 14
Table 3 – Geometrical factors and filling factors calculated for the standard sapphire
resonator . 17
Table 4 – Specifications of vector network analyzer . 21
Table 5 – Type B uncertainty for the specifications on the sapphire rod . 21
Table A.1 – Geometrical factors and filling factors calculated for the standard sapphire
resonator . 31
Table B.1 – Output signals from two nominally identical
...
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