IEC TS 62607-5-1:2014
(Main)Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements
Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements
IEC TS 62607-5-1:2014(E) provides a standardized sample structure for characterizing charge transport properties in thin-film organic/nano electronic devices and a format to report details of the structure which shall be provided with the measurement results. The standardized OTFT testing structure with a contact-area-limited doping can mitigate contact resistance and enable reliable measurement of the charge carrier mobility. The purpose of this Technical Specification is to provide test sample structures for determining the intrinsic charge transport properties of organic thin-film devices. The intention is to provide reliable materials information for OTFTs and to set guidelines for making test sample structures so that materials information is clear and consistent throughout the research community and industry.
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IEC TS 62607-5-1
®
Edition 1.0 2014-09
TECHNICAL
SPECIFICATION
colour
inside
Nanomanufacturing – Key control characteristics –
Part 5-1: Thin-film organic/nano electronic devices – Carrier transport
measurements
IEC TS 62607-5-1:2014-09(en)
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IEC TS 62607-5-1
®
Edition 1.0 2014-09
TECHNICAL
SPECIFICATION
colour
inside
Nanomanufacturing – Key control characteristics –
Part 5-1: Thin-film organic/nano electronic devices – Carrier transport
measurements
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ICS 07.030 ISBN 978-2-8322-1812-9
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® Registered trademark of the International Electrotechnical Commission
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– 2 – IEC TS 62607-5-1:2014 © IEC 2014
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms, definitions and abbreviations . 6
3.1 Terms and definitions. 6
3.2 Symbols and abbreviated terms . 7
4 Sample structures of OTFTs . 8
4.1 Typical device structures of OTFTs . 8
4.2 Contact-area
...
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