ISO 26824:2013
(Main)Particle characterization of particulate systems — Vocabulary
Particle characterization of particulate systems — Vocabulary
ISO 26824:2013 establishes a vocabulary of terms and definitions relevant to the particle characterization of particulate systems. It covers such fields as the representation of results of particle size analysis, the descriptive and quantitative representation of particle shape and morphology, sample preparation, specific surface area and porosity characterization and measurement methods including sedimentation, classification, acoustic methods, laser diffraction, dynamic light scattering, single particle light interaction methods, differential electrical mobility analysis and image analysis, in a size scale from nanometre to millimetre.
Caractérisation des particules dans les systèmes particulaires — Vocabulaire
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Standards Content (Sample)
INTERNATIONAL ISO
STANDARD 26824
First edition
2013-07-15
Particle characterization of particulate
systems — Vocabulary
Caractérisation des particules dans les systèmes particulaires —
Vocabulaire
Reference number
©
ISO 2013
© ISO 2013
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ii © ISO 2013 – All rights reserved
Contents Page
Foreword .iv
Introduction .v
Scope. 1
1 General terms, representation of particle size and classification analysis .1
2 Sedimentation analysis . 5
3 Pore size distribution, porosity and surface area analysis . 6
4 Representation of particle shape analysis .11
5 Electrical sensing methods .13
6 Laser diffraction methods .14
7 Dynamic light scattering .17
8 Image analysis methods .18
9 Single particle light interaction methods .21
10 Small angle X-Ray scattering method .22
11 Sample preparation and reference materials .23
12 Electrical mobility and number concentration analysis for aerosol particles .24
13 Electrical charge conditioning .27
14 Acoustic methods .28
15 Focused beam methods .31
16 Characterization of particle dispersion in liquids .31
17 Methods for zeta potential determination .33
17.2 Electrokinetic phenomena .35
17.3 Electroacoustic phenomena .36
Annex A (informative) Alphabetical index .39
Bibliography .49
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
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electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2. www.iso.org/directives
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any
patent rights identified during the development of the document will be in the Introduction and/or on
the ISO list of patent declarations received. www.iso.org/patents
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For an explanation on the meaning of ISO specific terms and expressions related to conformity
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Barriers to Trade (TBT) see the following URL: http://www.iso.org/iso/home/standards_development/
resources-for-technical-work/foreword.htm
The committee responsible for this document is ISO/TC 24, Particle characterization including sieving,
Subcommittee SC 4, Particle characterization.
iv © ISO 2013 – All rights reserved
Introduction
Since 1995, some 20 International Standards have been published by ISO/TC 24/SC 4, and at the time of
publication of this International Standard, about 12 projects were under development, not to mention
revisions of existing standards. Therefore it was not before time that terms defined in standards that
were relevant for others be collected and adjusted into a single, uniform vocabulary.
In particular, the interdisciplinary application fields of particle and particulate systems characterization
— from mining and construction, the pharmaceutical and food industries, medicine and life sciences, the
chemical industry, microelectronics and nanotechnology — need clear and unambiguous terminology.
The development of international trade, not only in measurement devices for particle characterization,
but also of process equipment for the production and treatment of particulate systems, underlines the
need for comparability of quality and performance parameters, as well as in international health, safety
and environmental protection regulations.
The structuring and presentation rules applied to the terminological entries, based on a clause structure,
represents the methods of results presentation and the analysis methods, and starts with general terms
in each clause.
INTERNATIONAL STANDARD ISO 26824:2013(E)
Particle characterization of particulate systems —
Vocabulary
Scope
This International Standard establishes a vocabulary of terms and definitions relevant to the particle
characterization of particulate systems. It covers such fields as the representation of results of particle
size analysis, the descriptive and quantitative representation of particle shape and morphology, sample
preparation, specific surface area and porosity characterization and measurement methods including
sedimentation, classification, acoustic methods, laser diffraction, dynamic light scattering, single
particle light interaction methods, differential electrical mobility analysis and image analysis, in a size
scale from nanometre to millimetre.
1 General terms, representation of particle size and classification analysis
1.1
particle
minute piece of matter with defined physical boundaries
Note 1 to entry: A physical boundary can also be described as an interface.
Note 2 to entry: A particle can move as a unit.
Note 3 to entry: This general particle definition applies to nano-objects.
[SOURCE: ISO 14644-6:2007, 2.102, modified — The subject field “” has been removed and the
notes added.]
1.2
agglomerate
collection of weakly or medium strongly bound particles where the resulting external surface area is
similar to the sum of the surface areas of the individual components
Note 1 to entry: The forces holding an agglomerate together are weak forces, for example van der Waals forces or
simple physical entanglement.
Note 2 to entry: Agglomerates are also termed secondary particles and the original source particles are termed
primary particles.
[SOURCE: ISO/TS 27687:2008, 3.2, modified.]
1.3
aggregate
particle comprising strongly bonded or fused particles where the resulting external surface area is
significantly smaller than the sum of surface areas of the individual components
Note 1 to entry: The forces holding an aggregate together are strong forces, for example covalent bonds, or those
resulting from sintering or complex physical entanglement, or otherwise combined former primary particles.
Note 2 to entry: Aggregates are also termed secondary particles and the original source particles are termed
primary particles.
[SOURCE: ISO/TS 27687:2008, 3.3, modified.]
1.4
primary particle
original source particle of agglomerates or aggregates or mixtures of the two
Note 1 to entry: Constituent particles of agglomerates or aggregates at a certain actual state may be primary
particles, but often the constituents are aggregates.
Note 2 to entry: Agglomerates and aggregates are also termed secondary particles.
1.5
particle size
x
d
linear dimension of a particle determined by a specified measurement method and under specified
measurement conditions
Note 1 to entry: Different methods of analysis are based on the measurement of different physical properties.
Independent of the particle property actually measured, the particle size is reported as a linear dimension, e.g. as
the equivalent spherical diameter.
Note 2 to entry: Examples of size descriptors are those based at the opening of a sieve or a statistical diameter, e.g.
the Feret diameter, measured by image analysis.
Note 3 to entry: In ISO 9276-1:1998, the symbol x is used to denote the particle size. However, it is recognized that
the symbol d is also widely used to designate these values. Therefore the symbol x may be replaced by d.
[SOURCE: ISO 9276-1:1998, 4.2, modified.]
1.6
equivalent spherical diameter
x
d
diameter of a sphere having the same physical properties as the particle in the measurement
Note 1 to entry: Physical properties are for instance the same settling velocity or electrolyte solution displacing
volume or projection area under a microscope.
Note 2 to entry: The physical property to which the equivalent diameter refers shall be indicated using a suitable
subscript, for example x for equivalent surface area diameter or x for equivalent volume diameter.
S V
[SOURCE: ISO 9276-1:1998, 4.2, modified.]
1.7
type of quantity
r
specification of the quantity of a distribution, a cumulative or a density measure
Note 1 to entry: The type is indicated by the general subscript, r, or by the appropriate value of r as follows:
— number: r = 0
— length: r = 1
— area: r = 2
— volume or mass: r = 3
[SOURCE: ISO 9276-1:1998, 4.3, modified.]
2 © ISO 2013 – All rights reserved
1.8
cumulative distribution
Q (x)
r
distribution of the fraction of material smaller (undersize) than given particle sizes
Note 1 to entry: If the cumulative distribution, Q (x), is calculated from histogram data, only individual points
r
Q = Q (x ) are obtained. Each individual point of the distribution, Q (x ), defines the relative amount of particles
r,i r i r i
smaller than or equal to x . The continuous curve is calculated by suitable interpolation algorithms. The normalized
i
cumulative distribution extends between 0 and 1, i.e. 0 and 100 %.
i i
QQ==Δ qxΔ with 1≤≤vi≤n
r,iv∑∑r, r,v v
v==11v
where
i (subscript) number of the size class with upper limit x
i
ν (integer, see subscript i)
n total number of size classes
Q relative amount of particles in size class with upper limit x
r,ν ν
Note 2 to entry: When plotted on a graph paper with a logarithmic abscissa the cumulative values, Q , i.e. the
r,i
ordinates of a cumulative distribution, do not change. However, the course of the cumulative distribution curve
changes but the relative amounts smaller than a certain parti
...
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