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SIST

SIST ENV 1071-1:2000

(Main)

Advanced technical ceramics - Methods of test for ceramic coatings - Part 1: Determination of coating thickness by contact probe profilometer

Advanced technical ceramics - Methods of test for ceramic coatings - Part 1: Determination of coating thickness by contact probe profilometer

Hochleistungskeramik - Verfahren zur Prüfung keramischer Schichten - Teil 1: Bestimmung der Schichtdicke mit einem Kontaktprofilometer

Céramiques techniques avancées - Méthodes d'essai pour revetements céramiques - Partie 1: Détermination de l'épaisseur du revetement par profilometre a contact

Advanced technical ceramics - Methods of test for ceramic coatings - Part 1: Determination of coating thickness by contact probe profilometer

General Information

Status
Withdrawn
Publication Date
30-Nov-2000
Withdrawal Date
31-Dec-2003
ICS
25.220.99 - Other treatments and coatings
81.060.30 - Advanced ceramics
Technical Committee
SS SPL - Technical Board for the general field
Current Stage
9900 - Withdrawal (Adopted Project)
Start Date
01-Jan-2004
Due Date
01-Jan-2004
Completion Date
01-Jan-2004
Mandate
M/BC/CEN/90/4 - Request concerning the realisation of a standardization programme in the field of advanced technical ceramics
Ref Project
ENV 1071-1:1993 - Advanced technical ceramics - Methods of test for ceramic coatings - Part 1: Determination of coating thickness by contact probe profilometer

Relations

Replaced By
SIST EN 1071-1:2004 - Advanced technical ceramics - Methods of test for ceramic coatings - Part 1: Determination of coating thickness by contact probe filometer
Effective Date
01-Jan-2004
Child
SIST ENV 1071-2:2000 - Advanced technical ceramics - Methods of test for ceramic coatings - Part 2: Determination of coating thickness by the cap grinding method
Effective Date
22-Dec-2008

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Standards Content (Sample)

SLOVENSKI STANDARD
SIST ENV 1071-1:2000
01-december-2000
Advanced technical ceramics - Methods of test for ceramic coatings - Part 1:
Determination of coating thickness by contact probe profilometer
Advanced technical ceramics - Methods of test for ceramic coatings - Part 1:
Determination of coating thickness by contact probe profilometer
Hochleistungskeramik - Verfahren zur Prüfung keramischer Schichten - Teil 1:
Bestimmung der Schichtdicke mit einem Kontaktprofilometer
Céramiques techniques avancées - Méthodes d'essai pour revetements céramiques -
Partie 1: Détermination de l'épaisseur du revetement par profilometre a contact
Ta slovenski standard je istoveten z: ENV 1071-1:1993
ICS:
25.220.99 Druge obdelave in prevleke Other treatments and
coatings
81.060.30 Sodobna keramika Advanced ceramics
SIST ENV 1071-1:2000 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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