Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:1982)

Metall- und Oxidschichten - Schichtdickenmessung - Mikroskopische Methode (ISO 1463:1982)

Diese Europäische Norm legt ein Verfahren zur Messung der Örtlichen Dicke von Metall-, Oxid- und Emailschichten durch mikroskopische Untersuchung von Querschliffen mit einem Lichtmikroskop fest. Das Verfahren ergibt bei Verwendung eines Lichtmikroskops eine absolute Messgenauigkeit von 0,8 microm. Es ist damit für die Messung dünner Schichten geeignet.

Revetements métalliques et couches d'oxyde - Mesurage de l'épaisseur - Méthode par coupe micrographique (ISO 1463:1982)

Kovinske in oksidne prevleke - Merjenje debeline prevleke - Mikroskopska metoda (ISO 1463:1982)

General Information

Status
Withdrawn
Publication Date
30-Sep-1999
Withdrawal Date
30-Nov-2004
Current Stage
9900 - Withdrawal (Adopted Project)
Start Date
01-Dec-2004
Due Date
01-Dec-2004
Completion Date
01-Dec-2004

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SLOVENSKI STANDARD
SIST EN ISO 1463:1999
01-oktober-1999
Kovinske in oksidne prevleke - Merjenje debeline prevleke - Mikroskopska metoda
(ISO 1463:1982)

Metallic and oxide coatings - Measurement of coating thickness - Microscopical method

(ISO 1463:1982)
Metall- und Oxidschichten - Schichtdickenmessung - Mikroskopische Methode (ISO
1463:1982)

Revetements métalliques et couches d'oxyde - Mesurage de l'épaisseur - Méthode par

coupe micrographique (ISO 1463:1982)
Ta slovenski standard je istoveten z: EN ISO 1463:1994
ICS:
17.040.20 Lastnosti površin Properties of surfaces
25.220.20 Površinska obdelava Surface treatment
25.220.40 Kovinske prevleke Metallic coatings
SIST EN ISO 1463:1999 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN ISO 1463:1999
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SIST EN ISO 1463:1999
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SIST EN ISO 1463:1999
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SIST EN ISO 1463:1999
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SIST EN ISO 1463:1999
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SIST EN ISO 1463:1999
International Standard

INTERNATIONAL ORGANIZATION FOR STANDARDIZATIONWlE~YHAPO~HAR OPI-AHM3ALMR t-l0 CTAHAAPTl43A~Wl.ORGANISATION INTERNATIONALE DE NORMALISATION

Metallic and Oxide coatings - Measurement of coating
- Microscopical method
thickness

Revetements m&alliques et couches d’oxyde - Mesurage de l’bpaisseur - IWthode par coupe micrographique

Second edition - 1982-07-01
Ref. No. ISO VW-1982 (E)
UDC 621.793/ .795 : 531.717 : 53.08722

vitreous enamels, Oxide coatings, dimensional measurement, thickness, metallography,

Descriptors : metal coatings, porcelain enamels,
microscopic analysis.
Price based on 5 pages
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SIST EN ISO 1463:1999
Foreword

ISO (the International Organization for Standardization) is a worldwide federation of

national Standards institutes (ISO member bodies). The work of developing Inter-
national Standards is carried out through ISO technical committees. Every member

body interested in a subject for which a technical committee has been set up has the

right to be represented on that committee. International organizations, governmental

and non-governmental, in liaison with ISO, also take part in the work.

Draft International Standards adopted by the technical committees are circulated to

the member bodies for approval before their acceptance as International Standards by

the ISO Council.
International Standard ISO 1463 was developed by Technical Committee ISO/TC 107,

Meta//ic and other non-organic coatings, and was circulated to the member bodies in

November 1980.
lt has been approved by the member bodies of the following countries :
Spain
Australia Italy
Bulgaria Japan Sweden
Czechoslovakia Netherlands Switzerland
United Kingdom
Egypt, Arab Rep. of New Zealand
France Poland USA
Germany, F. R. Portugal USSR
Venezuela
Hungary Romania
India South Africa, Rep. of
No member body expressed disapproval of the document.
This second edition cancels and replaces the first edition (i.e. ISO 1463-1973).
0 International Organkation for Standardkation, 1982
Printed in Switzerland
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SIST EN ISO 1463:1999
ISO 1463-1982 (E)
INTERNATIONAL STANDARD
Metallic and Oxide coatings - Measurement of coating
thickness - Microscopical method
5.2 Taper of Cross-section
1 Scope and field of application
If the plane of the Cross-section is not perpendicular to the
This International Standard specifies a method for the

measurement of the local thickness of metallic coatings, Oxide plane of the coating, the measured thickness will be greater

layers, and porcelain or vitreous enamel coatings, by the than the true thickness. For example, an inclination of 10° to

microscopical examination of Cross-sections using an Optical the perpendicular will contribute a 1,5 % error.

microscope.
5.3 Deformation of coating
Under good conditions, when using an Optical microscope, the
method is capable of giving an absolute measuring accuracy of
Detrimental deformation of the coating tan be caused by ex-
0,8 Pm; this will determine the suitability of the method for
cessive temperature or pressure during mounting and prepara-
measuring the thickness of thin coatings.
tion of Cross-sections of soft coatings or coatings melting at
low temperatures, and also by excessive abrasion of brittle
materials during preparation of Cross-sections.
2 Reference
5.4 Rounding of edge of coating
ISO 2064, Metallic and other non-organic coatings - Defini-
If the edge of the coating Cross-section is rounded, i.e. if the
tions and conventions concerning the measurement of
coating cross-section is not completely flat up to its edges, the
thickness.
true thickness cannot be observed microscopically. Edge roun-
ding tan be caused by improper mounting, grinding, polishing
or etching. lt is usually minimized by overplating the test
specimen before mounting. (See annex A, clause A. 1.)
3 Definition
local thickness : The mean of the thickness measurements,
5.5 Overplating
of which a specified number is made within a reference area.
(See ISO 2064.)
Overplating of the test specimen serves to protect the coating
edges during preparation of Cross-sections and thus to prevent
an erroneous measurement. Removal of coating material dur-
ing surface preparation for overplating tan Cause a low
4 Principle
thickness measurement.
Cutting out a Portion of the test specimen, mounting it, and
5.6 Etching
preparing the mounted Cross-section by suitable techniques of
grinding, polishing, and etching. Measurement of the thickness
Optimum etching will produce a clearly defined and narrow
of the coating Cross-section by means of a calibrated scale.
dark line at the interface of two metals. Excessive etching
produces a poorly defined or wide I ine which may result in an
NOTE - These techniques will be familiar to experienced
erroneous measurement.
but some guidance is given in clause 5 and in
metallographers,
annex A for less experienced Operators.
5.7 Smearing
Improper polishing may leave one metal smeared over the other
5 Factors relating to the measuring accuracy
metal so as to obscure the true boundary between the two
metals. The apparent boundary may be poorly defined or very
irregular instead of straight and well defined. To verify the
5.1 Surface roughness
absence of smearing, the coating thickness should be
measured and the polishing, etching, and thickness measure-
If the coating or its Substrate has a rough surface, one or both
ment repeated. A significant Change in apparent thickness in-
of the interfaces bounding the coating Cross-section may be
dicates that smearing was probably present during one of the
too irregular to permit accurate measurement. (See annex A,
clause A.4.) measurements.
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SIST EN ISO 1463:1999
ISO 14634982 (E)
5.14 Orientation of eyepiece
5.8 Magnification
The movement of the hairline of the eyepiece for alignment has
For any given coating thickness, measurement errors generally
to be perpendicular to the boundaries of the coating cross-
increase with decreasing magnification. If possible, the
section. For example, 10° misalignment will contribute a 1,5 %
magnification should be Chosen so that the field of view is bet-
error.
ween 1,5 and 3 times the coating thickness.
5.15 Tube length
5.9 Calibration of Stage micrometer
A Change in tube length Causes a Change in magnification and,
Any error in calibration of the Stage micrometer will be re-
if this Change occurs between the time of calibration and the
flected in the measurement of the specimen. Errors of several
time of measurement, the measurement will be in error. A
per cent are not unrealistic unless the scale has been calibrated

or has been certified by a responsible supplier. A generally Change in tube length may occur when the eyepiece is re-

positioned within the tube, when the focus of the eyepiece
satisfactory means of calibration is to assume that the stated

length of the full scale is correct, to measure each subdivision tube is changed, and, for some microscopes, when the fine

with a filar micrometer, and to calculate the length of each sub- focus is adjusted.

division by simple proportion.
5.10 Calibration of micrometer eyepiece 6 Preparation of Cross-sections
A filar micrometer eyepiece generally provides the most
Prepare, mount, grind, polish, and etch the specimen so that :
satisfactory means of making the measurement of the
specimen. The measurement will be no more accurate than the
a) the Cross-section is perpendicular to the coating;
calibration of the eyepiece. As calibration is Operator depen-
b) the surface is flat and the entire width of the coating
dent, the eyepiece shall be calibrated by the person making the
measurement. image is simultaneously in focus at the magnification to be
used for the measurement;
Repeated calibrations of the micrometer eyepiece tan be
reasonably expected to have a spread of less than 1 %. The
c) all material deformed by cutting or Cross-sectioning is
distance between the two lines of a Stage micrometer used for
removed;
the calibration shall be known to within 02 ym or 0,l %,
whichever is the greater. (The accuracy of some Stage
d) the boundaries of the coating Cross-section are sharply
micrometers is certified by the manufacturer. Other Stage
defined by no more than contrasting appearance, or by a
micrometers have been found to be in error by 1 or 2 Fm for a
narrow, well defined, line.
...

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