SIST EN 62435-1:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General (IEC 62435-1:2017)

This part of IEC 62435 on long-term-storage covers the terms, definitions and principles of
long-term-storage that can be used in as an obsolescence mitigation strategy. Long-term
storage refers to a duration that can be more than 12 months for products scheduled for long
duration storage. Philosophy, good working practice, and general means to facilitate the
successful long-term-storage of electronic components are also addressed.

Elektronische Bauteile - Langzeitlagerung elektronischer Halbleiterbauelemente - Teil 1: Allgemeines

Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 1: Généralités (IEC 62435-1:2017)

   L’IEC 62435-1:2017 relative au stockage de longue durée couvre les termes, les définitions et les principes du stockage de longue durée qui peuvent être utilisés dans le cadre d’une stratégie de réduction de l’obsolescence. Le stockage de longue durée fait référence à une durée qui peut être supérieure à 12 mois, pour un produit destiné à être stocké pendant une durée prolongée. Les concepts, les bonnes pratiques et les moyens généraux de nature à faciliter la réussite d’un stockage de longue durée de composants électroniques sont aussi abordés.
   La présente norme annule et remplace l'IEC/PAS 62435 publié en 2005. Cette première édition constitue une révision technique.

Elektronske komponente - Dolgoročno skladiščenje elektronskih polprevodniških elementov - 1. del: Splošno (IEC 62435-1:2017)

Ta del standarda IEC 62435 o dolgoročnem skladiščenju zajema določila, definicije in načela dolgoročnega skladiščenja, ki jih je mogoče uporabiti kot strategijo ublažitve zastarelosti. Dolgoročno skladiščenje se nanaša na obdobje, ki je lahko daljše od 12 mesecev, za izdelke, namenjene za dolgoročno skladiščenje. Obravnavana so tudi načela, dobra delovna praksa in splošna sredstva za lažjo uspešno dolgoročno skladiščenje elektronskih komponent.

General Information

• Status: Published
• Publication Date: 15-May-2017
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: I11 - Imaginarni 11
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 03-May-2017
• Due Date: 08-Jul-2017
• Completion Date: 16-May-2017
• Ref Project: EN 62435-1:2017 - Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 62435-1:2017
01-junij-2017
(OHNWURQVNHNRPSRQHQWH'ROJRURþQRVNODGLãþHQMHHOHNWURQVNLKSROSUHYRGQLãNLK
HOHPHQWRYGHO6SORãQR,(&
Electronic components - Long-term storage of electronic semiconductor devices - Part 1:
General (IEC 62435-1:2017)
Composants électroniques - Stockage de longue durée des dispositifs électroniques à
semiconducteurs - Partie 1: Généralités (IEC 62435-1:2017)
Ta slovenski standard je istoveten z: EN 62435-1:2017
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
SIST EN 62435-1:2017 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 62435-1:2017

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SIST EN 62435-1:2017


EUROPEAN STANDARD EN 62435-1

NORME EUROPÉENNE

EUROPÄISCHE NORM
April 2017
ICS 31.020

English Version
Electronic components - Long-term storage of electronic
semiconductor devices - Part 1: General
(IEC 62435-1:2017)
Composants électroniques - Stockage de longue durée des Elektronische Bauteile - Langzeitlagerung elektronischer
dispositifs électroniques à semiconducteurs - Halbleiterbauelemente - Teil 1: Allgemeines
Partie 1: Généralités (IEC 62435-1:2017)
(IEC 62435-1:2017)
This European Standard was approved by CENELEC on 2017-02-24. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.


European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. EN 62435-1:2017 E

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SIST EN 62435-1:2017
EN 62435-1:2017
European foreword
The text of document 47/2326/FDIS, future edition 1 of IEC 62435-1, prepared by IEC/TC 47
"Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN 62435-1:2017.
The following dates are fixed:
(dop) 2017-11-24
• latest date by which the document has to be implemented at
national level by publication of an identical national
standard or by endorsement
(dow) 2020-02-24
• latest date by which the national standards conflicting with
the document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 62435-1:2017 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60068-2-17:1994 NOTE Harmonized as EN 60068-2-17:1994 (not modified).
IEC 60068-2-20:2008 NOTE Harmonized as EN 60068-2-20:2008 (not modified).
IEC 60749-20-1 NOTE Harmonized as EN 60749-20-1.
IEC 60749-21 NOTE Harmonized as EN 60749-21.
IEC 61340-5-1:2007 NOTE Harmonized as EN 61340-5-1:2007 (not modified).
IEC/TR 61340-5-2:2007 NOTE Harmonized as CLC/TR 61340-5-2:2008 (not modified).
IEC 62258 NOTE Harmonized in EN 62258 / CLC/TR 62258 series.
IEC/TR 62258-3 NOTE Harmonized as CLC/TR 62258-3.
IEC 62402 NOTE Harmonized as EN 62402.
IEC 62435-2 NOTE Harmonized as EN 62435-2.
IEC 62435-5 NOTE Harmonized as EN 62435-5.
ISO 14644 NOTE Harmonized in EN ISO 14644 series.
2

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SIST EN 62435-1:2017
EN 62435-1:2017
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is
available here: www.cenelec.eu.

Publication Year Title EN/HD Year
IEC 60749-20-1 -  Semiconductor devices - Mechanical EN 60749-20-1 -
and climatic test methods - Part 20-1:
Handling, packing, labelling and
shipping of surface-mount devices
sensitive to the combined effect of
moisture and soldering heat

3

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SIST EN 62435-1:2017

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SIST EN 62435-1:2017



IEC 62435-1

®


Edition 1.0 2017-01




INTERNATIONAL



STANDARD




NORME



INTERNATIONALE











Electronic components – Long-term storage of electronic semiconductor

devices –

Part 1: General




Composants électroniques – Stockage de longue durée des dispositifs

électroniques à semiconducteurs –


Partie 1: Généralités













INTERNATIONAL

ELECTROTECHNICAL

COMMISSION


COMMISSION

ELECTROTECHNIQUE


INTERNATIONALE




ICS 31.020 ISBN 978-2-8322-3835-6



Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN 62435-1:2017
– 2 – IEC 62435-1:2017 © IEC 2017

CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 8
2 Normative references . 8
3 Terms definitions and abbreviated terms . 8
3.1 Terms and definitions . 8
3.2 Abbreviations . 9
4 Purpose of long-term storage . 9
4.1 General . 9
4.2 Storage decision criteria . 10
4.2.1 Advantages . 10
4.2.2 Hazards . 10
4.2.3 Storage cost . 11
4.2.4 Decision criteria . 12
4.3 Reasons and methodology . 12
4.4 Market forces . 13
4.5 Risk mitigation and insurance . 13
4.6 Obsolescence mitigation . 13
5 Logistics . 13
5.1 Procurement requirements . 13
5.1.1 List of components . 13
5.1.2 Quantity of components to be stored . 14
5.1.3 When is it worth keeping in stock? . 14
5.1.4 Procurement recommendations . 14
5.2 Elementary storage unit . 15
5.3 Stock management . 15
5.4 Redundancy . 15
5.5 Storage regimen . 15
5.5.1 Storage concerns . 15
5.5.2 Identification and traceability . 15
5.6 Removal from storage . 16
5.6.1 Precautions . 16
5.6.2 Stock rotation . 16
5.7 Periodic check of the components . 16
5.7.1 General . 16
5.7.2 Objectives . 17
5.7.3 Periodicity . 17
5.7.4 Tests during periodic check . 17
6 Storage considerations for devices after card (or other) attachment. 17
7 Handling . 18
8 Inspection . 18
9 Inventory control process . 18
10 Transportation . 18
11 Lead finishes . 18
12 Kitting and lot control . 18

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SIST EN 62435-1:2017
IEC 62435-1:2017 © IEC 2017 – 3 –
13 Validation . 19
14 Unplanned storage and types of storage . 19
14.1 Types of storage . 19
14.2 Unplanned storage . 19
15 Other things to store in addition to the components . 20
15.1 Relevant data . 20
15.2 Equipment . 20
16 Storage facility . 20
16.1 Cost of ownership . 20
16.2 Physical security and safety . 20
16.3 Location and ambient environment . 20
17 Policies . 21
17.1 General . 21
17.2 Supply chain . 21
17.3 Re-starting the manufacturing chain . 21
18 Legislation and environmental issues . 21
Annex A (informative) Example checklist for project managers . 22
Annex B (normative) Example checklist for long-term storage facilities . 24
Annex C (informative) Example of a component list . 26
C.1 Component list . 26
C.2 Data description . 27
Annex D (informative) Examples of periodic and/or de-stocking tests . 28
Annex E (informative) Parameters influencing the quantity of components to be stored . 30
Bibliography . 31

Table 1 – Storage hazards . 11
Table A.1 – Example checklist for project managers . 22
Table B.1 – Example checklist for storage facilities . 24
Table C.1 – Component list . 26
Table D.1 – Periodic and/or de-stocking tests . 28

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SIST EN 62435-1:2017
– 4 – IEC 62435-1:2017 © IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

ELECTRONIC COMPONENTS –
LONG-TERM STORAGE OF ELECTRONIC
SEMICONDUCTOR DEVICES –

Part 1: General

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62435-1 has been prepared by IEC technical committee 47:
Semiconductor devices.
This standard cancels and replaces IEC/PAS 62435 published in 2005. This first edition
constitutes a technical revision.
The text of this standard is based on the following documents:
FDIS Report on voting
47/2326/FDIS 47/2349/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

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SIST EN 62435-1:2017
IEC 62435-1:2017 © IEC 2017 – 5 –
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 62435 series, published under the general title Electronic
components – Long-term storage of electronic semiconductor devices, can be found on the
IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC website under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

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SIST EN 62435-1:2017
– 6 – IEC 62435-1:2017 © IEC 2017
INTRODUCTION
This document applies to the long-term storage of electronic components.
This is a document for long-term storage (LTS) of electronic devices drawing on the best long-
term storage practices currently known. For the purposes of this document, LTS is defined as
any device storage whose duration can be more than 12 months for product scheduled for
long duration storage. While intended to address the storage of unpackaged semiconductors
and packaged electronic devices, nothing in this standard precludes the storage of other
items under the storage levels defined herein.
Although it has always existed to some extent, obsolescence of electronic components and
particularly of integrated circuits, has become increasingly intense over the last few years.
Indeed, with the existing technological boom, the commercial life of a component has become
very short compared with the life of industrial equipment such as that encountered in the
aeronautical field, the railway industry or the energy sector.
The many solutions enabling obsolescence to be resolved are now identified. However,
selecting one of these solutions should be preceded by a case-by-case technical and
economic feasibility study, depending on whether storage is envisaged for field service or
production, for example:
• remedial storage as soon as components are no longer marketed;
• preventive storage anticipating declaration of obsolescence.
Taking into account the expected life of some installations, sometimes covering several
decades, the qualification times, and the unavailability costs, which can also be very high, the
solution to be adopted to resolve obsolescence should often be rapidly implemented. This is
why the solution retained in most cases consists in systematically storing components which
are in the process of becoming obsolescent.
The technical risks of this solution are, a priori, fairly low. However, it requires perfect mastery
of the implemented process and especially of the storage environment, although this mastery
becomes critical when it comes to long-term storage.
All handling, protection, storage and test operations are recommended to be performed
according to the state of the art.
The application of the approach proposed in this standard in no way guarantees that the
stored components are in perfect operating condition at the end of this storage. It only
comprises a means of minimizing potential and probable degradation factors.
Some electronic device users have the need to store electronic devices for long periods of
time. Lifetime buys are commonly made to support production runs of assemblies that well
exceed the production timeframe of its individual parts. This puts the user in a situation
requiring careful and adequate storage of such parts to maintain the as-received solderability
and minimize any degradation effects to the part over time. Major degradation concerns are
moisture, electrostatic fields, ultra-violet light, large variations in temperature, air-borne
contaminants, and outgassing.
Warranties and sparing also present a challenge for the user or repair agency as some
systems have been designated to be used for long periods of time, in some cases for up to
40 years or more. Some of the devices needed for repair of these systems will not be
available from the original supplier for the lifetime of the system or the spare assembly may
be built with the original production run but then require long-term storage. This document
was developed to provide a standard for storing electronic devices for long periods of time.

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SIST EN 62435-1:2017
IEC 62435-1:2017 © IEC 2017 – 7 –
For storage of devices that are moisture sensitive but that do not need to be stored for long
periods of time, refer to IEC TR 62258-3.
Long-term storage assumes that the device is going to be placed in uninterrupted storage for
a number of years. It is essential that it is useable after storage. Particular attention should be
paid to storage media surrounding the devices together with the local environment.
These guidelines do not imply any warranty of product or guarantee of operation beyond the
storage time given by the manufacturer.
The IEC 62435 series is intended to ensure that adequate reliability is achieved for devices in
user applications after long-term storage. Users are encouraged to request data from
suppliers to applicable specifications to demonstrate a successful storage life as requested by
the user. These standards are not intended to address built-in failure mechanisms that would
take place regardless of storage conditions.
These standards are intended to give practical guide to methods of long-duration storage of
electronic components where this is intentional or planned storage of product for a number of
years. Storage regimes for work-in-progress production are managed according to company
internal process requirements and are not detailed in this series of standards.
The overall standard is split into a number of parts. Parts 1 to 4 apply to any long-term
1
storage and contain general requirements and guidance, whereas Parts 5 to 9 are specific to
the type of product being stored. It is intended that the product specific part should be read
alongside the general requirements of Parts 1 to 4.
Electronic components requiring different storage conditions are covered separately starting
with Part 5.
The structure of the IEC 62435 series as currently conceived is as follows:
Part 1 – General
Part 2 – Deterioration mechanisms
Part 3 – Data
Part 4 – Storage
Part 5 – Die and wafer devices
Part 6 – Packaged or finished devices
Part 7 – MEMS
Part 8 – Passive electronic devices
Part 9 – Special cases

_____________
1
 Under preparation.

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SIST EN 62435-1:2017
– 8 – IEC 62435-1:2017 © IEC 2017
ELECTRONIC COMPONENTS –
LONG-TERM STORAGE OF ELECTRONIC
SEMICONDUCTOR DEVICES –

Part 1: General



1 Scope
This part of IEC 62435 on long-term-storage covers the terms, definitions and principles of
long-term-storage that can be used in as an obsolescence mitigation strategy. Long-term
storage refers to a duration that can be more than 12 months for products scheduled for long
duration storage. Philosophy, good working practice, and general means to facilitate the
successful long-term-storage of electronic components are also addressed.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60749-20-1, Semiconductor devices – Mechanical and climatic test methods – Part 20-1:
Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined
effect of moisture and soldering heat
3 Terms definitions and abbreviated terms
For the purposes of this document, the following terms, definitions and abbreviated terms
apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1 Terms and definitions
3.1.1
storage environment
specially controlled storage area, with particular control of temperature, humidity, atmosphere
and any other conditions depending on the product requirements
3.1.2
long-term storage
LTS
planned storage of components to extend the life-cycle for a duration with the intention of
supporting future use
Note 1 to entry: Allowable storage durations will vary by form factor (e.g., packing materials, shape) and storage
conditions. In general, long-term storage is longer than 12 months.

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SIST EN 62435-1:2017
IEC 62435-1:2017 © IEC 2017 – 9 –
3.1.3
electronic device
packaged electrical, electronic, electro-mechanical (EEE) item, or assemblies using such
items
3.1.4
moisture barrier bag
MBB
storage bag manufactured with a flexible laminated vapour barrier film that restricts the
transmission of water vapour
Note 1 to entry: Refer to IEC60749-20-1 for packaging of moisture sensitive products.
3.1.5
humidity indicator card
HIC
card printed with a moisture sensitive chemical (cobalt bromide) that changes from blue to
pink in the presence of water vapour
3.2 Abbreviations
ESD electro-static discharge
4 Purpose of long-term storage
4.1 General
LTS is intended as any device storage for more than 12 months but typically much longer.
Annexes A to E provide useful
...