Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

Halbleiterbauelemente - Teil 16-1: Integrierte Mikrowellen-Verstärker

Dispositifs à semiconducteurs - Partie 16-1: Circuits intégrés hyperfréquences - Amplificateurs

Polprevodniške naprave - 16-1. del: Mikrovalovna integrirana vezja - Ojačevalniki - Dopolnilo A2 (IEC 60747-16-1:2001/A2:2017)

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Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747

Ta slovenski standard je istoveten z: EN 60747-16-1:2002/A2:2017
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
SIST EN 60747-16-1:2004/A2:2017 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 60747-16-1:2004/A2:2017
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SIST EN 60747-16-1:2004/A2:2017
EUROPEAN STANDARD EN 60747-16-1:2002/A2
May 2017
ICS 31.080.99
English Version
Semiconductor devices -
Part 16-1: Microwave integrated circuits - Amplifiers
(IEC 60747-16-1:2001/A2:2017)
Dispositifs à semiconducteurs - Halbleiterbauelemente -

Partie 16-1: Circuits intégrés hyperfréquences - Teil 16-1: Integrierte Mikrowellen-Verstärker

Amplificateurs (IEC 60747-16-1:2001/A2:2017)
(IEC 60747-16-1:2001/A2:2017)

This amendment A2 modifies the European Standard EN 60747-16-1:2002; it was approved by CENELEC on 2017-03-22. CENELEC

members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this amendment the

status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC

Management Centre or to any CENELEC member.

This amendment exists in three official versions (English, French, German). A version in any other language made by translation under the

responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as

the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,

Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,

Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,

Switzerland, Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels

© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.

Ref. No. EN 60747-16-1:2002/A2:2017 E
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SIST EN 60747-16-1:2004/A2:2017
EN 60747-16-1:2002/A2:2017
European foreword

The text of document 47E/500/CDV, future IEC 60747-16-1:2001/A2, prepared by SC 47E "Discrete

semiconductor devices" of IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC parallel

vote and approved by CENELEC as EN 60747-16-1:2002/A2:2017.
The following dates are fixed:
(dop) 2017-12-22
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2020-03-22
standards conflicting with the
document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of patent

rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice

The text of the International Standard IEC 60747-16-1:2001/A2:2017 was approved by CENELEC as a

European Standard without any modification.
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SIST EN 60747-16-1:2004/A2:2017
EN 60747-16-1:2002/A2:2017
Annex ZA
Normative references to international publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are

indispensable for its application. For dated references, only the edition cited applies. For undated references,

the latest edition of the referenced document (including any amendments) applies.

NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD


NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:

Publication Year Title EN/HD Year

Replace the existing references to IEC 60617, IEC 60747-1, IEC 60747-4, IEC 61340-5-1 and

IEC 61340-5-2, including modifications done by A1 as follows:
IEC 60617-DB - Graphical symbols for diagrams - -
IEC 60747-1 2006 Semiconductor devices - - -
Part 1: General
+A1 2010 - -
IEC 60747-4 2007 Semiconductor devices - Discrete devices - - -
Part 4: Microwave diodes and transistors
+A1 2017 - -
IEC 61340-5-1 - Electrostatics - EN 61340-5-1 -
Part 5-1: Protection of electronic devices from
electrostatic phenomena - General
IEC/TR 61340-5-2 - Electrostatics - CLC/TR 61340-5-2 -
Part 5-2: Protection of electronic devices from
electrostatic phenomena - User guide
Replace the existing reference to IEC 60748-3 as follows:
IEC 60748-3 1986 Semiconductors devices - Integrated circuits - - -
Part 3: Analogue integrated circuits
+A1 1991 - -
+A2 1994 - -

Delete the existing references to IEC 60747-7:2000, IEC 60747-16-2:2001 and IEC 60747-16-4:2004

Add the following new reference:
IEC 60050-702 - International electrotechnical vocabulary (IEV) - -
- Chapter 702: Oscillations, signals and
related devices
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SIST EN 60747-16-1:2004/A2:2017
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SIST EN 60747-16-1:2004/A2:2017
IEC 60747-16-1
Edition 1.0 2017-02
Semiconductor devices –
Part 16-1: Microwave integrated circuits – Amplifiers
Dispositifs à semiconducteurs –
Partie 16-1: Circuits intégrés hyperfréquences – Amplificateurs
ICS 31.080.99 ISBN 978-2-8322-3873-8

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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SIST EN 60747-16-1:2004/A2:2017
– 2 – IEC 60747-16-1:2001/AMD2:2017
 IEC 2017

This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,

of IEC technical committee 47: Semiconductor devices.
The text of this amendment is based on the following documents:
CDV Report on voting
47E/500/CDV 47E/518/RVC

Full information on the voting for the approval of this amendment can be found in the report

on voting indicated in the above table.

Replace the titles of Clause 3, Subclauses 5.7 and 5.18 with the following new titles:

3 Terms and definitions
5.7 Limiting output power (P ) and limiting output power flatness (∆P )
o(ltg) o(ltg)
5.18 Power added efficiency (η )

Replace the titles of Subclauses 5.11, 5.19, 5.21, including the amendments brought to them

by Amendment 1, with the following new titles:
5.11 Intermodulation distortion (two-tone) (P /P )
n 1
5.19 nth order harmonic distortion ratio (P /P )
nth 1
5.21 Spurious intensity under specified load VSWR (P /P )
sp o

Replace the title of Subclause 5.22 added by Amendment 1 with the following new title:

5.22 Adjacent channel power ratio (P /P )
adj o(m

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