EN 61967-8:2011

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This publication is to be read in conjunction with  IEC 61967-1:2002.

Integrierte Schaltungen - Messung von elektromagnetischen Aussendungen - Teil 8: Messung der abgestrahlten Aussendungen - IC-Streifenleiterverfahren

Circuits intégrés - Mesure des émissions électromagnétiques - Partie 8: Mesure des émissions rayonnées - Méthode de la ligne TEM à plaques (stripline) pour CI

La CEI 61967-8:2011 définit une méthode en vue de mesurer l'émission électromagnétique rayonnée d'un circuit intégré (CI) utilisant une ligne TEM à plaques (stripline) pour CI dans la plage de fréquences comprise entre 150 kHz et 3 GHz. Le CI évalué est monté sur une carte d'essai CEM (CCI, Carte de Circuit Imprimé) entre le conducteur actif et le plan de masse de l'agencement de la ligne TEM à plaques (stripline) pour CI. Cette publication doit être lue conjointement avec la  CEI 61967-1:2002.

Integrirana vezja - Meritve elektromagnetnega sevanja od 150 kHz do 1 GHz - 8. del: Merjenje sevanega oddajanja - Metoda z IC na tračnem valovodu

Postopek merjenja tega dela IEC 61967 definira metodo za merjenje oddajanja elektromagnetnega sevanja iz integriranih vezij (IC) z uporabo IC na tračnem valovodu v frekvenčnem razponu od 150 kHz do 3 GHz. IC, ki se ocenjuje, je pritrjen na EMC-preskusno ploščo (PCB) med aktivnim prevodnikom in ozemljitveno ploščo postavitve IC na tračnem valovodu.

General Information

• Status: Published
• Publication Date: 13-Oct-2011
• Withdrawal Date: 14-Sep-2014
• ICS: 31.200 - Integrated circuits. Microelectronics
• Technical Committee: CLC/SR 47A - Integrated circuits
• Drafting Committee: IEC/SC 47A - IEC_SC_47A
• Parallel Committee: IEC/SC 47A - IEC_SC_47A
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 14-Oct-2011
• Completion Date: 14-Oct-2011
• Directive: 2004/108/EC - Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Directive: 2004/108/EU - DIRECTIVE 2004/108/EC OF THE EUROPEAN PARLIAMENT AND OF THE COUNCIL of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Directive: 2014/30/EU - Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)
• Ref Project: SIST EN 61967-8:2012 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 8: Measurement of radiated emissions - IC stripline method

Relations

• Replaced By: EN IEC 61967-8:2023 - Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
• Effective Date: 23-Jan-2023

Standards Content (Sample)

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.XIntegrierte Schaltungen - Messung von elektromagnetischen Aussendungen - Teil 8: Messung der abgestrahlten Aussendungen - IC-StreifenleiterverfahrenCircuits intégrés - Mesure des émissions électromagnétiques -- Partie 8: Mesure des émissions rayonnées - Méthode de la ligne TEM à plaques (stripline) pour CIIntegrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 8: Measurement of radiated emissions - IC stripline method31.200Integrirana vezja, mikroelektronikaIntegrated circuits. MicroelectronicsICS:Ta slovenski standard je istoveten z:EN 61967-8:2011SIST EN 61967-8:2012en,fr,de01-januar-2012SIST EN 61967-8:2012SLOVENSKI
STANDARD



SIST EN 61967-8:2012



EUROPEAN STANDARD EN 61967-8 NORME EUROPÉENNE
EUROPÄISCHE NORM October 2011
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2011 CENELEC -
All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61967-8:2011 E
ICS 31.200
English version
Integrated circuits -
Measurement of electromagnetic emissions -
Part 8: Measurement of radiated emissions -
IC stripline method (IEC 61967-8:2011)
Circuits intégrés -
Mesure des émissions électromagnétiques -
Partie 8: Mesure des émissions rayonnées -
Méthode de la ligne TEM à plaques (stripline) pour CI (CEI 61967-8:2011)
Integrierte Schaltungen -
Messung von elektromagnetischen Aussendungen -
Teil 8: Messung der abgestrahlten Aussendungen -
IC-Streifenleiterverfahren (IEC 61967-8:2011)
This European Standard was approved by CENELEC on 2011-09-15. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom.
SIST EN 61967-8:2012



EN 61967-8:2011 - 2 -
Foreword The text of document 47A/868/FDIS, future edition 1 of IEC 61967-8, prepared by SC 47A, "Integrated circuits", of IEC TC 47, "Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61967-8:2011.
The following dates are fixed: • latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2012-06-15 • latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2014-09-15
This standard is to be used in conjunction with EN 61967-1. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent rights.
Endorsement notice The text of the International Standard IEC 61967-8:2011 was approved by CENELEC as a European Standard without any modification. SIST EN 61967-8:2012



- 3 - EN 61967-8:2011
Annex ZA
(normative)
Normative references to international publications with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
NOTE
When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
Publication Year Title EN/HD Year
IEC 60050-131 - International Electrotechnical Vocabulary (IEV) -
Part 131: Circuit theory - -
IEC 60050-161 - International Electrotechnical Vocabulary (IEV) -
Chapter 161: Electromagnetic compatibility - -
IEC 61000-4-20 - Electromagnetic compatibility (EMC) -
Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides EN 61000-4-20 -
IEC 61967-1 - Integrated circuits - Measurement of electromagnetic emissions,
150 kHz to 1 GHz -
Part 1: General cond
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