IEC 61000-4-3:2006/AMD2:2010

Amendment 2 - Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test

Amendement 2 - Compatibilité électromagnétique (CEM) - Partie 4-3: Techniques d'essai et de mesure - Essai d'immunité aux champs électromagnétiques rayonnés aux fréquences radioélectriques

General Information

• Status: Published
• Publication Date: 09-Mar-2010
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 33.100.20 - Immunity
• Technical Committee: SC 77B - High frequency phenomena
• Drafting Committee: WG 10 - TC 77/SC 77B/WG 10
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 08-Sep-2020

Relations

• Amends: IEC 61000-4-3:2006 - Electromagnetic compatibility (EMC) - Part 4-3 : Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test
• Effective Date: 05-Sep-2023
• Revised: IEC 61000-4-3:2020 - Electromagnetic compatibility (EMC) - Part 4-3 : Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 61000-4-3 ®
Edition 3.0 2010-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
AMENDMENT 2
AMENDEMENT 2
Electromagnetic compatibility (EMC) –
Part 4-3: Testing and measurement techniques – Radiated, radio-frequency,
electromagnetic field immunity test

Compatibilité électromagnétique (CEM) –
Partie 4-3: Techniques d'essai et de mesure – Essai d'immunité aux champs
électromagnétiques rayonnés aux fréquences radioélectriques

IEC 61000-4-3:2006/A2:2010
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or
IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette
publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: [e-mail]
Web: 1Hwww.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
ƒ Catalogue of IEC publications: 2Hwww.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
ƒ IEC Just Published: 3Hwww.iec.ch/online_news/justpub
Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
ƒ Electropedia: 4Hwww.electropedia.org
The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
ƒ Customer Service Centre: 5Hwww.iec.ch/webstore/custserv
If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service
Centre FAQ or contact us:
Email: [e-mail]
Tel.: [phone]
Fax: [phone]
A propos de la CEI
La Commission Electrotechnique Internationale (CEI) est la première organisation mondiale qui élabore et publie des
normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications CEI
Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possédez
l’édition la plus récente, un corrigendum ou amendement peut avoir été publié.
ƒ Catalogue des publications de la CEI: 7Hwww.iec.ch/searchpub/cur_fut-f.htm
Le Catalogue en-ligne de la CEI vous permet d’effectuer des recherches en utilisant différents critères (numéro de référence,
texte, comité d’études,…). Il donne aussi des informations sur les projets et les publications retirées ou remplacées.
ƒ Just Published CEI: 8Hwww.iec.ch/online_news/justpub
Restez informé sur les nouvelles publications de la CEI. Just Published détaille deux fois par mois les nouvelles
publications parues. Disponible en-ligne et aussi par email.
ƒ Electropedia: 9Hwww.electropedia.org
Le premier dictionnaire en ligne au monde de termes électroniques et électriques. Il contient plus de 20 000 termes et
définitions en anglais et en français, ainsi que les termes équivalents dans les langues additionnelles. Egalement appelé
Vocabulaire Electrotechnique International en ligne.
ƒ Service Clients: 10Hwww.iec.ch/webstore/custserv/custserv_entry-f.htm
Si vous désirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du
Service clients ou contactez-nous:
Email: [e-mail]
Tél.: [phone]
Fax: [phone]
IEC 61000-4-3 ®
Edition 3.0 2010-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
AMENDMENT 2
AMENDEMENT 2
Electromagnetic compatibility (EMC) –
Part 4-3: Testing and measurement techniques – Radiated, radio-frequency,
electromagnetic field immunity test

Compatibilité électromagnétique (CEM) –
Partie 4-3: Techniques d'essai et de mesure – Essai d'immunité aux champs
électromagnétiques rayonnés aux fréquences radioélectriques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
F
CODE PRIX
ICS 33.100.20 ISBN 978-2-88910-373-7
– 2 – 61000-4-3 Amend. 2 © IEC:2010
FOREWORD
This amendment has been prepared by subcommittee 77B: High frequency phenomena, of
IEC technical committee 77: Electromagnetic compatibility.
The text of this amendment is based on the following documents:
FDIS Report on voting
77B/626/FDIS 77B/629/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
CONTENTS
Add the title of Annex J as follows:
Annex J (informative) Measurement uncertainty due to test instrumentation

Add, after Annex I, the following new Annex J:

61000-4-3 Amend. 2 © IEC:2010 – 3 –
Annex J
(informative)
Measurement uncertainty due to test instrumentation

J.1 General
This annex gives information related to measurement uncertainty (MU) of the test level setting
according to the particular needs of the test method contained in the main body of the
standard. Further information can be found in [1, 2] .
This annex shows an example of how an uncertainty budget can be prepared based upon
level setting. Other parameters of the disturbance quantity such as modulation frequency and
modulation depth, harmonics produced by the amplifier may also need to be considered in an
appropriate way by the test laboratory. The methodology shown in this annex is considered to
be applicable to all parameters of the disturbance quantity.
The uncertainty contribution for field homogeneity including test site effects is under
consideration.
J.2 Uncertainty budgets for level setting
J.2.1 Definition of the measurand
The measurand is the hypothetical test electric field strength (without an EUT) at the point of
the UFA selected according to the process of 6.2.1 step a) and 6.2.2 step a) of this standard.
J.2.2 MU contributors of the measurand
The following influence diagram (see Figure J.1) gives an example of influences upon level
setting. It applies to both calibration and test processes and it should be understood that the
diagram is not exhaustive. The most important contributors from the influence diagram have
been selected for the uncertainty budget Tables J.1 and J.2. As a minimum, the contributions
listed in Tables J.1 and J.2 shall be used for the calculation of the uncertainty budgets in
order to get comparable budgets for different test sites or laboratories. It is noted that a
laboratory may include additional contributors in the calculation of the MU, on the basis of its
particular circumstances.
___________
Figures in square brackets refer to the reference documents in Clause J.4.

– 4 – 61000-4-3 Amend. 2 © IEC:2010

Antenna location and
Power meter (PM)
absorber placement
Field probe
calibration Anisotropy
Distance of EUT front
Mismatch
Frequency from antenna during test
Linearity
PM - directional coupler
interpolation error
Uncertainty in
level setting
Stability and drift
Mismatch
Power amplifier (PA)
of signal generator
antenna - PA
short and long
term stability
Software
Field disturbance
PA compression
“window” caused by movable objects
(e.g. camera)
IEC  431/10
Figure J.1 – Example of influences upon level setting
J.2.3 Calculation examples for expanded uncertainty
It shall be recognized that the contributions that apply for calibration and for test may not be
the same. This leads to different uncertainty budgets for each process.
In this basic standard, the field inside the chamber is calibrated before the test upon an EUT.
Depending on the test setup, several contributors may not be a factor in calculating MU.
Examples include those that are compensated by level control of the amplifier output power or
that remain unchanged between calibration and test (e.g. mismatch between antenna and
amplifier).
The field probe and the power monitoring instrumentation (repeatability rather than absolute
measurement accuracy and linearity) are not included in the level control of the amplifier
output power and their contributions shall be considered in evaluating MU.
Tables J.1 and J.2 give examples of an uncertainty budget for level setting. The uncertainty
budget consists of two parts, the uncertainty for calibration and the uncertainty for test.
Table J.1 – Calibration process
Symbol Uncertainty Source X U(x ) Unit Distribution Divisor u(x ) Unit c u (y) Unit u (y)
i i i i i i
FP Field probe calibration 1,7 dB normal k =2 2 0,85 dB 1 0,85 dB 0,72
PM Power meter 0,3 dB rect 1,73 0,17 dB 1 0,17 dB 0,03
c
PA PA rapid gain variation 0,2 dB rect 1,73 0,12 dB 1 0,12 dB 0,01
c
SW
SW levelling precision 0,6 dB rect 1,73 0,35 dB 1 0,35 dB 0,12
c
u (y)
Σ 0,88
i
Σu (y) 0,94
√ i
Expanded uncertainty U(y) (CAL ) k =2 1,88 dB

61000-4-3 Amend. 2 © IEC:2010 – 5 –
Table J.2 – Level setting
Symbol Uncertainty Source X U(x ) Unit Distribution Divisor u(x ) Unit c u (y) Unit u (y)
i i i i i i
CAL Calibration 1.88 dB normal k =2 2.00 0.94 dB 1 0.94 dB 0.89
Antenna location variation
AL and absorber placement 0.38 dB k = 1 1 0.38 dB 1 0.38 dB 0.14
a)
Power meter
PM 0.3 dB rect 1.73 0.17 dB 1 0.17 dB 0.03
t
PA PA rapid gain variation 0.2 dB rect 1.73 0.12 dB 1 0.12 dB 0.01
t
SW SW levelling precision 0.6 dB rect 1.73 0.35 dB 1 0.35 dB 0.12
t
SG Signal generator stability 0.13 dB rect 1.73 0.08 dB 1 0.08 dB 0.01
u (y)
Σ
i 1.20
√Σu (y)
1.10
i
Expanded uncertainty U(y) k = 2 2.19 dB

a)
If a level control of the signal generator output level based on a power meter is used, the PM enters into the
t
table, otherwise the stability and drift of the signal generator as well as the power amplifier have to be taken
into account. In this example, the power amplifier does not contribute to the uncertainty budget because it is
part of the power amplifier output control, therefore it is sufficient to consider the power meter contribution.
J.2.4 Explanation of terms
FP is a combination of calibration uncertainty, field probe unbalance (anisotropy), field probe
frequency response and temperature sensitivity. Normally this data can be obtained from the
probe data sheet and/or calibration certificate.
PM is the uncertainty of the power meter, including its sensors, taken from either the
c
manufacturer’s specification (and treated as a rectangular distribution) or a calibration
certificate (and treated as a normal distribution). If the same power meter is used for both
calibration and test, this contribution can be reduced to the repeatability and linearity of the
power meter. This approach is applied within the table.
PA is including the uncertainty derived from rapid gain variation of the power amplifier after
c
the steady status has been reached.
SW is the uncertainty derived from the discrete step size of the frequency generator and
c
software windows for level setting during the calibration process. The software window can
usually be adjusted by the test laboratory.
CAL is the expanded uncertainty associated with the calibration process.
AL is the uncertainty derived from removal and replacement of the antenna and absorbers.
Referring to ISO/IEC Guide 98-3, the antenna location variation and absorber placement are
type A contributions, that is their uncertainty can be evaluated by statistical analysis of series
of observations. Type A contributions are normally not part of the uncertainty of measurement
equipment, however, these contributions were taken into account because of their high
importance and their close relation to the measurement equipment.
PM is the uncertainty of the power meter, including its sensors, taken from either the
t
manufacturer’s specification (and treated as a rectangular distribution) or a calibration
certificate (and treated as a normal distribution). If the same power meter is used for both
calibration and test, this contribution can be reduced to the repeatability and linearity of the
power meter. This approach is applied within the table.
This contribution can be omitted if a measuring setup without power amplifier output control is
used for the test process (in contrast to Figure 7 of this standard). In this case, the
uncertainties of the signal generator and power amplifier have to be reviewed.
PA is including the uncertainty derived from rapid gain variation of the power amplifier after
t
the steady status has been reached.

– 6 – 61000-4-3 Amend. 2 © IEC:2010
SW is the uncerta
...