IEC 61926-1:1999

Design automation - Part 1: Standard test language for all systems - Common abbreviated test language for all systems (C/ATLAS)

Defines a high order language for electronics testing independent of any specific test system. Can be implemented on automatic test equipement (ATE)

General Information

• Status: Published
• Publication Date: 17-Oct-1999
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 35.240.50 - IT applications in industry
• Technical Committee: TC 91 - Electronics assembly technology
• Drafting Committee: WG 15 - TC 91/WG 15
• Current Stage: PPUB - Publication issued
• Start Date: 15-Nov-1999
• Completion Date: 18-Oct-1999

Standards Content (Sample)

INTERNATIONAL IEC
STANDARD
61926-1
First edition
1999-10
Design automation –
Part 1:
Standard test language for all systems –
Common abbreviated test language
for all systems (C/ATLAS)
Automatisation de la conception –
Partie 1:
Langage de test normalisé pour tout système –
Langage de test commun/abrégé pour tout système
(C/ATLAS)
Reference number
IEC 61926-1:1999(E)

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Numbering
As from 1 January 1997 all IEC publications are issued with a designation in the
60000 series.
Consolidated publications
Consolidated versions of some IEC publications including amendments are
available. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the
base publication, the base publication incorporating amendment 1 and the base
publication incorporating amendments 1 and 2.
Validity of this publication
The technical content of IEC publications is kept under constant review by the IEC,
thus ensuring that the content reflects current technology.
Information relating to the date of the reconfirmation of the publication is available
in the IEC catalogue.
Information on the subjects under consideration and work in progress undertaken
by the technical committee which has prepared this publication, as well as the list
of publications issued, is to be found at the following IEC sources:
• IEC web site*
•
Catalogue of IEC publications
Published yearly with regular updates
(On-line catalogue)*
• IEC Bulletin
Available both at the IEC web site* and as a printed periodical
Terminology, graphical and letter symbols
For general terminology, readers are referred to IEC 60050: International
Electrotechnical Vocabulary (IEV).
For graphical symbols, and letter symbols and signs approved by the IEC for
general use, readers are referred to publications IEC 60027: Letter symbols to be
used in electrical technology, IEC 60417: Graphical symbols for use on equipment.
Index, survey and compilation of the single sheets and IEC 60617: Graphical symbols
for diagrams.
* See web site address on title page.

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INTERNATIONAL IEC


STANDARD 61926-1



First edition
1999-10



Design automation –
Part 1:
Standard test language for all systems –
Common abbreviated test language
for all systems (C/ATLAS)

Automatisation de la conception –
Partie 1:
Langage de test normalisé pour tout système –
Langage de test commun/abrégé pour tout système
(C/ATLAS)

© IEC 1999 – Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: [phone] e-mail: [e-mail] IEC web site http://www.iec.ch
Commission Electrotechnique Internationale
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XH
International Electrotechnical Commission


For price, see current catalogue

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– 2 – 61926-1 © IEC:1999(E)
Contents
Clause Page
1.0 Scope and object. 12
2.0 Normative references . 13
2.1 References . 13
2.2 Document precedence.14
2.3 Document organization and conventions . 14
2.3.1 Extensibility. 14
 2.3.2 Organization of syntax specification . 14
2.3.3 Guide to the use of the C/ATLAS language . 15
3.0 Complete C/ATLAS test program. 16
3.1 . 16
3.1.1 . 16
3.1.2 . 17
3.1.3 . 17
3.2 Basic statement elements. 17
3.2.1 Flag field. 18
3.2.2 Statement number field.
...