SIST EN 60747-16-4:2005/A1:2011

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004/A1:2009)

Provides new measuring methods, terminology and letter symbols, as well as essential ratings and characteristics for integrated circuit microwave switches. Switches in this standard are based on SPDT single pole double throw. However, this standard is applicable to the other types of switches.

Halbleiterbauelemente - Teil 16-4: Integrierte Mikrowellenschaltkreise - Schalter (IEC 60747-16-4:2004/A1:2009)

Dispositifs à semiconducteurs - Partie 16-4: Circuits intégrés hyperfréquences - Commutateurs (CEI 60747-16-4:2004/A1:2009)

Polprevodniški elementi - 16-4. del: Mikrovalovna integrirana vezja - Stikala - Dopolnilo A1 (IEC 60747-16-4:2004/A1:2009)

Podaja metode merjenja, terminologijo in črkovne oznake ter potrebne ocene in značilnosti za stikala za mikrovalovna integrirana vezja. Stikala v tem standardu temeljijo na enopolnih kontaktih SPDT z dvema legama. Vendar ta standard velja tudi za druge tipe stikal.

General Information

• Status: Published
• Publication Date: 09-Feb-2011
• ICS: 31.080.01 - Semiconductor devices in general
• ICS: 31.200 - Integrated circuits. Microelectronics
• Technical Committee: I11 - Imaginarni 11
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 20-Jan-2011
• Due Date: 27-Mar-2011
• Completion Date: 10-Feb-2011
• Ref Project: EN 60747-16-4:2004/A1:2011 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

Relations

• Amends: SIST EN 60747-16-4:2005 - Semiconductor devices -- Part 16-4: Microwave integrated circuits - Switches
• Effective Date: 01-Mar-2011

Overview

SIST EN 60747-16-4:2005/A1:2011 is a European standard issued by CLC that governs semiconductor devices, specifically focusing on microwave integrated circuits (MICs) - switches. This amendment (A1) updates the original 2004 edition by incorporating revisions approved by CENELEC in 2011. It aligns with the international standard IEC 60747-16-4:2004/A1:2009 and provides detailed definitions, testing methods, and measurement principles related to microwave integrated circuit switches used in semiconductor applications.

The standard is vital for manufacturers, designers, and quality assurance teams working with semiconductor microwave switches, ensuring harmonized specifications and improved product reliability in high-frequency electronic components.

Key Topics

• Microwave Integrated Circuits (MICs) - Switches: Focus on switches within microwave integrated circuits which are crucial in signal routing and modulation within microwave systems.
• Terminology and Definitions: Updated terms such as insertion loss, isolation, and nth order harmonic distortion ratio, essential for comprehending MIC switch performance.
• Measurement Principles: Standardized procedures for evaluating key electrical parameters including:
  • Insertion loss and isolation ratios defined as input to output power ratios in dB.
  • nth order harmonic distortion measurement to assess signal quality and distortion.
  • Adjacent channel power ratio for interference control.
• Electrical Characteristics: Detailed parameters and typical value ranges facilitating consistent quality assessment across products.
• Handling and Environmental Ratings: Updated guidelines on thermal conditions including operating temperature, storage temperature, channel temperature, and lead temperature, combined with electrostatic discharge (ESD) handling precautions referencing IEC 61340 series standards.
• Package Identification and Block Diagrams: Clear instructions on component identification using graphical symbols from IEC 60617 standards, aiding in design and documentation processes.

Applications

SIST EN 60747-16-4:2005/A1:2011 serves as a critical resource for applications involving high-frequency microwave semiconductor switches, including:

• Communication systems: Switching and routing microwave signals in wireless infrastructure and satellite communication.
• Radar equipment: Reliable microwave switching for signal processing in military and civilian radar systems.
• Test and measurement devices: Ensuring switch fidelity and low distortion in high-frequency test instrumentation.
• Consumer electronics: Microwave circuit components in devices requiring signal switching at gigahertz frequencies.
• Aerospace and defense electronics: High-performance and ruggedized integrated microwave switches complying with stringent international standards.

By adhering to this standard, manufacturers optimize microwave switch performance, reduce design variability, and improve device interoperability.

Related Standards

Those working with SIST EN 60747-16-4:2005/A1:2011 should consider related standards that impact semiconductor microwave devices:

• IEC 60747-1: General standards for semiconductor devices, providing foundational testing and definitions.
• IEC 60747-16-1: Microwave integrated circuits - amplifiers, relevant for complementary MIC components.
• IEC 60747-4: Semiconductor devices - microwave diodes and transistors, offering broader coverage on microwave components.
• IEC 60617: Graphical symbols for electrical diagrams, essential for schematic documentation.
• IEC 61340-5-1 / 5-2: Protection against electrostatic discharge (ESD) for semiconductor devices, ensuring device integrity during handling and assembly.

Utilizing these interconnected standards ensures comprehensive compliance across semiconductor microwave integrated circuits, enhancing product quality and regulatory adherence.

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Keywords: semiconductor devices, microwave integrated circuits, MIC switches, insertion loss, isolation, harmonic distortion, microwave switches standard, EN 60747-16-4, IEC 60747-16-4, microwave signal switching, electrostatic discharge protection, semiconductor microwave components, integrated circuit testing standards.

Standards Content (Sample)

SLOVENSKI STANDARD
01-marec-2011
Polprevodniški elementi - 16-4. del: Mikrovalovna integrirana vezja - Stikala -
Dopolnilo A1 (IEC 60747-16-4:2004/A1:2009)
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-
16-4:2004/A1:2009)
Halbleiterbauelemente - Teil 16-4: Integrierte Mikrowellenschaltkreise - Schalter (IEC
60747-16-4:2004/A1:2009)
Dispositifs à semiconducteurs - Partie 16-4: Circuits intégrés hyperfréquences -
Commutateurs (CEI 60747-16-4:2004/A1:2009)
Ta slovenski standard je istoveten z: EN 60747-16-4:2004/A1:2011
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 60747-16-4/A1
NORME EUROPÉENNE
January 2011
EUROPÄISCHE NORM
ICS 31.080.99
English version
Semiconductor devices -
Part 16-4: Microwave integrated circuits -
Switches
(IEC 60747-16-4:2004/A1:2009)
Dispositifs à semiconducteurs -  Halbleiterbauelemente -
Partie 16-4: Circuits intégrés Teil 16-4: Integrierte
hyperfréquences - Mikrowellenschaltkreise -
Commutateurs Schalter
(CEI 60747-16-4:2004/A1:2009) (IEC 60747-16-4:2004/A1:2009)

This amendment A1 modifies the European Standard EN 60747-16-4:2004; it was approved by CENELEC on
2011-01-02. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which
stipulate the conditions for giving this amendment the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This amendment exists in three official versions (English, French, German). A version in any other language
made by translation under the responsibility of a CENELEC member into its own language and notified to the
Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels

© 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60747-16-4:2004/A1:2011 E

Foreword
The text of document 47E/358/CDV, future amendment 1 to IEC 60747-16-4:2004, prepared by SC 47E,
Discrete semiconductor devices, of IEC TC 47, Semiconductor devices, was submitted to the IEC-
CENELEC parallel vote and was approved by CENELEC as amendment A1 to EN 60747-16-4:2004 on
2011-01-02.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the amendment has to be
implemented at national level by publication of
an identical national standard or by endorsement (dop) 2011-10-02
– latest date by which the national standards conflicting
with the amendment have to be withdrawn (dow) 2014-01-02
__________
Endorsement notice
The text of amendment 1:2009 to the International Standard IEC 60747-16-4:2004 was approved by
CENELEC as an amendment to the European Standard without any modification.
__________
- 3 - EN 60747-16-4:2004/A1:2011
Replace the existing Annex ZA as follows:
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

IEC 60617 - Standard data element types with - -
associated classification scheme for electric
components -
Part 4: IEC reference collection of standard data
element types and component classes

IEC 60747-1 2006 Semiconductor devices - - -
Part 1: General
IEC 60747-4 - Semiconductor devices - Discrete devices - - -
Part 4: Microwave diodes and transistors

IEC 60747-16-1 2001 Semiconductor devices - EN 60747-16-1 2002
+ A1 2007 Part 16-1: Microwave integrated + A1 2007
circuits - Amplifiers
IEC 60748-2-1 - Semiconductors devices - Integrated circuits - - -
Part 2: Digital integrated circuits - Section one -
Blank detail specification for bipolar monolithic
digital integrated circuit gates (excluding
uncommitted logic arrays)
IEC 60748-3 - Semiconductors devices - Integrated circuits - - -
Part 3: Analogue integrated circuits

IEC 60748-4 - Semiconductor devices - Integrated circuits - - -
Part 4: Interface integrated circuits

IEC 61340-5-1 2007 Electrostatics - EN 61340-5-1 2007
Part 5-1: Protection of electronic devices from
electrostatic phenomena - General
requirements
IEC/TR 61340-5-2 2007 Electrostatics - CLC/TR 61340-5-2 2008
Part 5-2: Protection of electronic devices from
electrostatic phenomena - User guide

IEC 60747-16-4 ®
Edition 1.0 2009-03
INTERNATIONAL
STANDARD
AMENDMENT 1
Semiconductor devices –
Part 16-4: Microwave integrated circuits – Switches

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
F
ICS 31.080.99 ISBN 978-2-88910-283-9
– 2 – 60747-16-4 Amend. 1 © IEC:2009(E)
FOREWORD
This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,
of IEC technical committee 47: Semiconductor devices.
The text of this amendment is based on the following documents:
CDV Report on voting
47E/358/CDV 47E/373/RVC
Full information on the voting for the approval of this amendment can
...