SIST EN 60747-16-3:2004/A1:2009

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002/A1:2009)

Halbleiterbauelemente - Teil 16-3: Integrierte Schaltungen zur Frequenzumsetzung von Mikrowellen (IEC 60747-16-3:2002/A1:2009)

Dispositifs à semiconducteurs - Parie 16-3: Circuits intégrés hyperfréquences - Convertisseurs de fréquence (CEI 60747-16-3:2002/A1:2009)

Polprevodniške naprave - 16-3. del: Mikrovalovna integrirana vezja - Frekvenčni pretvorniki (IEC 60747-16-3:2002/A1:2009)

General Information

• Status: Published
• Publication Date: 20-Apr-2009
• ICS: 31.080.01 - Semiconductor devices in general
• ICS: 31.200 - Integrated circuits. Microelectronics
• Technical Committee: I11 - Imaginarni 11
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 15-Apr-2009
• Due Date: 20-Jun-2009
• Completion Date: 21-Apr-2009
• Ref Project: EN 60747-16-3:2002/A1:2009 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

Relations

• Amends: SIST EN 60747-16-3:2004 - Semiconductor devices -- Part 16-3: Microwave integrated circuits - Frequency converters
• Effective Date: 01-Jun-2009

Overview

EN 60747-16-3:2002/A1:2009 (aligned with IEC 60747-16-3:2002/A1:2009) is the CENELEC amendment covering microwave integrated circuits (MICs) used as frequency converters. Amendment A1 (approved 2009‑04‑01) updates definitions, measurement procedures, electrical limits and handling precautions. This normative text is intended for manufacturers, test laboratories and engineering teams working with RF/microwave semiconductor frequency-conversion ICs.

Key topics and requirements

• Scope and status

  • Amendment A1 modifies EN 60747-16-3:2002 and was adopted for national implementation (dop 2010‑01‑01; dow 2012‑04‑01).
  • Annex ZA added to map normative international references to European publications.

• Terms and definitions

  • Revised definitions include noise figure (F) (see IEC 60050-702) and intermodulation distortion (Pn/P1) (harmonized with IEC 60747‑16‑1 amendments).

• Electrical limiting values

  • Table of electrical limits updated to list mandatory parameters such as power supply voltages/currents, terminal voltages/currents, input power, LO input power and power dissipation.

• Measurement procedures and characteristics

  • Detailed guidance on measuring conversion gain and conversion gain flatness in three modes:
    • constant LO frequency
    • constant output frequency
    • constant input frequency (new subclause 6.3.6.3)
  • Intermodulation distortion measurement methods updated (subclause 6.12) including notation corrections and equation replacement.
  • Instructions to apply specified bias conditions and to set appropriate input and LO power levels during tests.

• Mechanical, environmental and handling

  • References for mechanical and environmental clauses updated to IEC 60747‑1 sections.
  • ESD/handling precautions now reference IEC 61340‑5‑1 and IEC/TR 61340‑5‑2 (protection of electronic devices from electrostatic phenomena).

• Documentation and diagrams

  • Use of IEC 60617 graphical symbols for detailed block diagrams and package identification requirements clarified.

Applications and users

• Who uses this standard
  • RF/microwave IC designers, semiconductor manufacturers, test and calibration laboratories, quality and compliance teams, procurement/specification engineers.
• Practical uses
  • Specifying performance limits for microwave frequency converters (mixers, up/down converters).
  • Standardizing test procedures for conversion gain, flatness and intermodulation distortion.
  • Ensuring safe handling and ESD protection across production and testing.
  • Harmonizing datasheet parameters and pass/fail criteria for supplier evaluation.

Related standards

• IEC 60747‑16‑1 (Microwave ICs - Amplifiers)
• IEC 60747‑1 (Semiconductor devices - General)
• IEC 60050‑702 (IEV - oscillations/signals)
• IEC 61340‑5‑1 / IEC/TR 61340‑5‑2 (Electrostatics protection)

Keywords: EN 60747-16-3, IEC 60747-16-3, frequency converters, microwave integrated circuits, conversion gain, intermodulation distortion, noise figure, electrical limiting values, ESD handling, measurement procedures.

Standards Content (Sample)

SLOVENSKI STANDARD
01-junij-2009
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Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
(IEC 60747-16-3:2002/A1:2009)
Halbleiterbauelemente - Teil 16-3: Integrierte Schaltungen zur Frequenzumsetzung von
Mikrowellen (IEC 60747-16-3:2002/A1:2009)
Dispositifs à semiconducteurs - Parie 16-3: Circuits intégrés hyperfréquences -
Convertisseurs de fréquence (CEI 60747-16-3:2002/A1:2009)
Ta slovenski standard je istoveten z: EN 60747-16-3:2002/A1:2009
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 60747-16-3/A1
NORME EUROPÉENNE
April 2009
EUROPÄISCHE NORM
ICS 31.080.99
English version
Semiconductor devices -
Part 16-3: Microwave integrated circuits -
Frequency converters
(IEC 60747-16-3:2002/A1:2009)
Dispositifs à semiconducteurs -  Halbleiterbauelemente -
Partie 16-3: Circuits intégrés Teil 16-3: Integrierte Schaltungen zur
hyperfréquences - Frequenzumsetzung von Mikrowellen
Convertisseurs de fréquence (IEC 60747-16-3:2002/A1:2009)
(CEI 60747-16-3:2002/A1:2009)
This amendment A1 modifies the European Standard EN 60747-16-3:2002; it was approved by CENELEC on
2009-04-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which
stipulate the conditions for giving this amendment the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This amendment exists in three official versions (English, French, German). A version in any other language
made by translation under the responsibility of a CENELEC member into its own language and notified to the
Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: avenue Marnix 17, B - 1000 Brussels

© 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60747-16-3:2002/A1:2009 E

Foreword
The text of document 47E/357/CDV, future amendment 1 to IEC 60747-16-3:2002, prepared by SC 47E,
Discrete semiconductor devices, of IEC TC 47, Semiconductor devices, was submitted to the
IEC-CENELEC parallel vote and was approved by CENELEC as amendment A1 to EN 60747-16-3:2002
on 2009-04-01.
The following dates were fixed:
– latest date by which the amendment has to be
implemented at national level by publication of
(dop) 2010-01-01
an identical national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2012-04-01
with the amendment have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of amendment 1:2009 to the International Standard IEC 60747-16-3:2002 was approved by
CENELEC as an amendment to the European Standard without any modification.
__________
- 3 - EN 60747-16-3:2002/A1:2009
Replace Annex ZA of EN 60747-16-3:2002 by:
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

IEC 60050-702 1992 International Electrotechnical Vocabulary - -
(IEV) -
Chapter 702: Oscillations, signals and related
devices
IEC 60617 Data- Graphical symbols for diagrams - -
base
IEC 60747-1 2006 Semiconductor devices - - -
Part 1: General
IEC 60747-16-1 2001 Semiconductor devices - EN 60747-16-1 2002
A1 2007 Part 16-1: Microwave integrated circuits - A1 2007
Amplifiers
IEC 60748-2 1997 Semiconductor devices - Integrated circuits - - -
Part 2: Digital integrated circuits

1)
IEC 60748-3 - Semiconductors devices - Integrated circuits - - -
Part 3: Analogue integrated circuits

1)
IEC 60748-4 - Semiconductor devices - Integrated circuits - - -
Part 4: Interface integrated circuits

IEC 61340-5-1 2007 Electrostatics - EN 61340-5-1 2007
Part 5-1: Protection of electronic devices from
electrostatic phenomena - General
requirements
IEC/TR 61340-5-2 2007 Electrostatics - CLC/TR 61340-5-2 2008
Part 5-2: Protection of electronic devices from
electrostatic phenomena - User guide

1)
Undated reference.
IEC 60747-16-3 ®
Edition 1.0 2009-03
INTERNATIONAL
STANDARD
AMENDMENT 1
Semiconductor devices –
Part 16-3: Microwave integrated circuits – Frequency converters

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
F
ICS 31.080.99 ISBN 2-8318-1033-8
– 2 – 60747-16-3 Amend. 1 © IEC:2009(E)
FOREWORD
This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,
of IEC technical committee 47: Semiconductor devices.
The text of this amendment is based on the following documents:
CDV Report on voting
47E/357/CDV 47E/372/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
...