SIST EN IEC 60749-20:2020
(Main)Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
This part of IEC 60749 provides a means of assessing the resistance to soldering heat of
semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is
destructive.
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 20: Beständigkeit kunststoffverkappter oberflächenmontierbarer Bauelemente (SMD) gegenüber der kombinierten Beanspruchung von Feuchte und Lötwärme
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 20: Résistance des CMS à boîtiers plastique à l'effet combiné de l'humidité et de la chaleur de brasage
IEC 60749-20:2020 est disponible sous forme de IEC 60749-20:2020 RLV qui contient la Norme internationale et sa version Redline, illustrant les modifications du contenu technique depuis l'édition précédente.
L’IEC 60749-20:2020 fournit des moyens d’évaluer la résistance à la chaleur de brasage des semiconducteurs sous emballage comme les composants à boîtier plastique pour montage en surface (CMS). Cet essai est destructif. Cette édition inclut les modifications techniques majeures suivantes par rapport à l’édition précédente:
- incorporation d’un corrigendum de l’IEC 60749-20:2008 (deuxième édition),
- inclusion d’un nouvel Article 3,
- inclusion de notes explicatives.
Polprevodniške naprave - Metode za mehansko in klimatsko preskušanje - 20. del: Odpornost elementov SMD v plastičnih ohišjih proti kombiniranemu učinkovanju vlage in spajkalne vročine
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN IEC 60749-20:2020
01-december-2020
Nadomešča:
SIST EN 60749-20:2010
Polprevodniške naprave - Metode za mehansko in klimatsko preskušanje - 20. del:
Odpornost elementov SMD v plastičnih ohišjih proti kombiniranemu učinkovanju
vlage in spajkalne vročine
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of
plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 20:
Beständigkeit kunststoffverkappter oberflächenmontierbarer Bauelemente (SMD)
gegenüber der kombinierten Beanspruchung von Feuchte und Lötwärme
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie
20: Résistance des CMS à boîtiers plastique à l'effet combiné de l'humidité et de la
chaleur de brasage
Ta slovenski standard je istoveten z: EN IEC 60749-20:2020
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
SIST EN IEC 60749-20:2020 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN IEC 60749-20:2020
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SIST EN IEC 60749-20:2020
EUROPEAN STANDARD EN IEC 60749-20
NORME EUROPÉENNE
EUROPÄISCHE NORM
October 2020
ICS 31.080.01 Supersedes EN 60749-20:2009 and all of its
amendments and corrigenda (if any)
English Version
Semiconductor devices - Mechanical and climatic test methods -
Part 20: Resistance of plastic encapsulated SMDs to the
combined effect of moisture and soldering heat
(IEC 60749-20:2020)
Dispositifs à semiconducteurs - Méthodes d'essais Halbleiterbauelemente - Mechanische und klimatische
mécaniques et climatiques - Partie 20 : Résistance des Prüfverfahren - Teil 20: Beständigkeit kunststoffverkappter
CMS à boîtier plastique à l'effet combiné de l'humidité et de oberflächenmontierbarer Bauelemente (SMD) gegenüber
la chaleur de brasage der kombinierten Beanspruchung von Feuchte und
(IEC 60749-20:2020) Lötwärme
(IEC 60749-20:2020)
This European Standard was approved by CENELEC on 2020-10-05. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2020 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 60749-20:2020 E
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SIST EN IEC 60749-20:2020
EN IEC 60749-20:2020 (E)
European foreword
The text of document 47/2634(F)/FDIS, future edition 3 of IEC 60749-20, prepared by IEC/TC 47
“Semiconductor devices” was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN IEC 60749-20:2020.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2021-07-05
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2023-10-05
document have to be withdrawn
This document supersedes EN 60749-20:2009 and all of its amendments and corrigenda (if any).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Endorsement notice
The text of the International Standard IEC 60749-20:2020 was approved by CENELEC as a European
Standard without any modification.
2
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SIST EN IEC 60749-20:2020
EN IEC 60749-20:2020 (E)
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the
relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60068-2-20 2008 Environmental testing - Part 2–20: Tests EN 60068-2-20 2008
- Test T: Test methods for solderability
and resistance to soldering heat of
devices with leads
IEC 60749-3 - Semiconductor devices - Mechanical EN 60749-3 -
and climatic test methods - Part 3:
External visual examination
IEC 60749-30 - Semiconductor devices - Mechanical EN IEC 60749-30 -
and climatic test methods - Part 30:
Preconditioning of non-hermetic surface
mount devices prior to reliability testing
IEC 60749-35 - Semiconductor devices - Mechanical EN 60749-35 -
and climatic test methods - Part 35:
Acoustic microscopy for plastic
encapsulated electronic components
3
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SIST EN IEC 60749-20:2020
IEC 60749-20
®
Edition 3.0 2020-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Mechanical and climatic test methods –
Part 20: Resistance of plastic encapsulated SMDs to the combined effect of
moisture and soldering heat
Dispositifs à semiconducteurs – Méthodes d’essais mécaniques
et climatiques –
Partie 20: Résistance des CMS à boîtier plastique à l’effet combiné
de l’humidité et de la chaleur de brasage
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.01 ISBN 978-2-8322-8727-9
Warning! Make sure that you obtained this publication from an authorized distributor.
Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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SIST EN IEC 60749-20:2020
– 2 – IEC 60749-20:2020 © IEC 2020
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 General description . 7
5 Test apparatus and materials . 7
5.1 Humidity chamber . 7
5.2 Reflow soldering apparatus . 8
5.3 Holder . 8
5.4 Wave-soldering apparatus . 8
5.5 Solvent for vapour-phase reflow soldering. 8
5.6 Flux . 8
5.7 Solder . 8
6 Procedure . 9
6.1 Initial measurements . 9
6.1.1 Visual inspection . 9
6.1.2 Electrical measurement . 9
6.1.3 Internal inspection by acoustic tomography . 9
6.2 Drying . 9
6.3 Moisture soak . 9
6.3.1 General . 9
6.3.2 Conditions for non-dry-packed SMDs . 9
6.3.3 Moisture soak for dry-packed SMDs . 10
6.4 Soldering heat . 11
6.4.1 General . 11
6.4.2 Method of heating by infrared convection or convection reflow soldering . 12
6.4.3 Method of heating by vapour-phase reflow soldering . 13
6.4.4 Method of heating by wave-soldering . 13
6.5 Recovery . 14
6.6 Final measurements . 15
6.6.1 Visual inspection . 15
6.6.2 Electrical measurement . 15
6.6.3 Internal inspection by acoustic tomography . 15
7 Information to be given in the relevant specification . 15
Annex A (informative) Details and description of test method on resistance of plastic
encapsulated SMDs to the combined effect of moisture and soldering heat . 17
A.1 Description of moisture soak . 17
A.1.1 Guidance for moisture soak . 17
A.1.2 Considerations on which the condition of moisture soak is based . 17
A.2 Procedure for moisture content measurement . 22
A.3 Soldering heat methods . 23
A.3.1 Temperature profile of infrared convection and convection reflow
soldering . 23
A.3.2 Temperature profile of vapour-phase soldering . 25
A.3.3 Heating method by wave-soldering . 26
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Figure 1 – Method of measuring the temperature profile of a specimen . 8
Figure 2 – Heating by wave-soldering . 14
Figure A.1 – Process of moisture diffusion at 85 °C, 85 % RH. 18
Figure A.2 – Definition of resin thickness and the first interface . 18
Figure A.3 – Moisture soak time to saturation at 85 °C as a function of resin thickness . 18
Figure A.4 – Temperature dependence of saturated moisture content of resin . 19
Figure A.5 – Dependence of moisture content of resin at the first interface on resin
thickness under various soak conditions . 20
Figure A.6 – Dependence of moisture content of resin at the first interface on resin
thickness related to method A of moisture soak . 20
Figure A.7 – Dependence of the moisture content of resin at the first interface on resin
thickness related to method B of moisture soak . 21
Figure A.8 – Dependence of moisture content of resin at the first interface on resin
thickness related to condition B2 of method B of moisture soak . 22
Figure A.9 – Temperature profile of infrared convection and convection reflow
soldering for Sn-Pb eutectic assembly . 23
Figure A.10 – Temperature profile of infrared convection and convection reflow
soldering for lead-free assembly . 24
Figure A.11 – Classification profile . 25
Figure A.12 – Temperature profile of vapour-phase soldering (condition II-A) . 25
Figure A.13 – Immersion method into solder bath . 26
Figure A.14 – Relation between the infrared convection reflow soldering and wave-
soldering . 27
Figure A.15 – Temperature in the body of the SMD during wave-soldering . 27
Table 1 – Moisture soak conditions for non-dry-packed SMDs . 9
Table 2 – Moisture soak conditions for dry-packed SMDs (method A) . 10
Table 3 – Moisture soak conditions for dry-packed SMDs (method B) . 11
Table 4 – SnPb eutectic process – Classification reflow temperatures (T ) . 12
c
Table 5 – Pb-free process – Classification reflow temperatures (T ) . 13
c
Table 6 – Heating condition for vapour-phase soldering . 13
Table 7 – Immersion conditions for wave-soldering . 14
Table A.1 – Comparison of actual storage conditions and equivalent moisture soak
conditions before soldering heat . 19
Table A.2 – Classification profiles . 24
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INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS –
Part 20: Resistance of plastic encapsulated SMDs to
the combined effect of moisture and soldering heat
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60749-20 has been prepared by IEC technical committee 47:
Semiconductor devices.
This third edition cancels and replaces the second edition published in 2008. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) incorporation of a technical corrigendum to IEC 60749-20:2008 (second edition );
b) inclusion of new Clause 3;
c) inclusion of explanatory notes.
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SIST EN IEC 60749-20:2020
IEC 60749-20:2020 © IEC 2020 – 5 –
The text of this International Standard is based on the following documents:
FDIS Report on voting
47/2634/FDIS 47/2646/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60749 series, published under the general title Semiconductor
devices – Mechanical and climatic test methods, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
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SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS –
Part 20: Resistance of plastic encapsulated SMDs to
the combined effect of moisture and soldering heat
1 Scope
This part of IEC 60749 provides a means of assessing the resistance to soldering heat of
semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is
destructive.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60068-2-20:2008, Environmental testing – Part 2-20: Tests – Test T: Test methods for
solderability and resistance to soldering heat of devices with leads
IEC 60749-3, Semiconductor devices – Mechanical and climatic test methods – Part 3:
External visual examination
IEC 60749-30, Semiconductor devices – Mechanical and climatic test methods – Part 30:
Preconditioning of non-hermetic surface mount devices prior to reliability testing
IEC 60749-35, Semiconductor devices – Mechanical and climatic test methods – Part 35:
Acoustic microscopy for plastic encapsulated electronic components
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1
acoustic tomography
determination of the physical qualities of a known substance by measuring how long it takes
sound to travel through it
3.2
classification reflow temperature
T
c
maximum body temperature for which the component moisture sensitivity level (MSL) is
verified by the component manufacturer and as noted on the caution and/or bar code label
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IEC 60749-20:2020 © IEC 2020 – 7 –
3.3
crack
separation within a bulk material
Note 1 to entry: See also delamination (3.5).
3.4
dead-bug orientation
orientation of a package with the terminals facing upwards
3.5
delamination
interfacial separation between two materials intended to be bonded
Note 1 to entry: See also crack (3.3).
3.6
floor life
allowable time period after removal from a moisture barrier bag, dry storage, or dry bake and
before the solder reflow process
Note 1 to entry: For the purposes of this document "‘unlimited" floor life only refers to moisture/reflow related
failures and does not take into consideration other failure mechanisms or shelf life issues due to long term storage.
3.7
live-bug orientation
orientation of a package when resting on its terminals
3.8
moisture sensitivity level
MSL
rating indicating a component’s susceptibility to damage due to absorbed moisture when
subjected to reflow soldering
3.9
soak
exposure of a component for a specified time at a specified temperature and humidity
4 General description
Package cracking and electrical failure in plastic encapsulated SMDs can result when
soldering heat raises the vapour pressure of moisture which has been absorbed into SMDs
during storage. These problems are assessed. In this test method, SMDs are evaluated for
heat resistance after being soaked in an environment which simulates moisture being
absorbed while under storage in a warehouse or dry pack. Moisture sensitivity level (MSL)
ratings generated by this document are utilized to determine the soak conditions for
preconditioning in accordance with IEC 60749-30.
5 Test apparatus and materials
5.1 Humidity chamber
The humidity chamber shall provide an environment complying with the temperature and
relative humidity defined in 6.3.
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5.2 Reflow soldering apparatus
The infrared convection, the convection and the vapour-phase reflow soldering apparatus
shall provide temperature profiles complying with the conditions of soldering heat defined in
6.4.2 and 6.4.3. The settings of the reflow soldering apparatus shall be adjusted by
temperature profiling of the top surface of the specimen while it is undergoing the soldering
heat process, measured as shown in Figure 1.
The adhesive agent or thin tape should have good thermal conductivity.
Figure 1 – Method of measuring the temperature profile of a specimen
5.3 Holder
Unless otherwise detailed in the relevant specification, any board material, such as epoxy
fibreglass or polyimide, may be used for the holder. The specimen shall be placed on the
holder by the usual means and in a position as shown in Figure 1. If the position of the
specimen, as shown in Figure 1, necessitates changing the shape of terminations and results
in subsequent electrical measurement anomalies, a position that avoids changing the shape
of terminations may be chosen, and this shall be specified in the relevant specification.
5.4 Wave-soldering apparatus
The wave-soldering apparatus shall comply with conditions given in 6.4.4. Molten solder shall
usually be flowed.
5.5 Solvent for vapour-phase reflow soldering
Perfluorocarbon (perfluoroisobutylene) shall be used.
5.6 Flux
Unless otherwise detailed in the relevant specification, the flux shall consist of 25 % by weight
of colophony in 75 % by weight of isopropyl alcohol, both as specified in Annex B of
IEC 60068-2-20:2008.
5.7 Solder
A solder of the composition as specified in Table 1 of IEC 60068-2-20:2008 shall be used.
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IEC 60749-20:2020 © IEC 2020 – 9 –
6 Procedure
6.1 Initial measurements
6.1.1 Visual inspection
Visual inspection, as specified in IEC 60749-3, shall be performed before the test. Special
attention shall be paid to external cracks and swelling, which will be looked for under a
magnification of 40X.
6.1.2 Electrical measurement
Electrical testing shall be performed as required by the relevant specification.
6.1.3 Internal inspection by acoustic tomography
Unless otherwise detailed in the relevant specification, internal cracks and delamination in the
specimen shall be inspected by acoustic tomography in accordance with IEC 60749-35.
6.2 Drying
Unless otherwise detailed in the relevant specification, the specimen shall be baked at
125 °C ± 5 °C for at least 24 h.
NOTE 1 This time/temperature is modified if desorption data on the particular device under test shows that a
different condition is required to obtain a "dry" package when starting in the wet condition for 85 °C/85 % RH.
NOTE 2 If a bake test is interrupted for more than 15 min, then the total time of the interruption is excluded from
the bake time. The interruption time is taken into account (if no greater than 1 h) then re-incorporated to ensure a
minimum of 24 h. For instance, if the interruption was 45 min, then the total bake test time would be 24 h and
45 min. If greater than 1 h the bake is restarted for a full 24 h.
6.3 Moisture soak
6.3.1 General
Unless otherwise detailed in the relevant specification, moisture soak conditions shall be
selected on the basis of the packing method of the specimen (see A.1.1, Annex A). If baking
the specimen before soldering is detailed in the relevant specification, the specimen shall be
baked instead of being subjected to moisture soak.
6.3.2 Conditions for non-dry-packed SMDs
The moisture soak condition shall be selected from Table 1, in accordance with the
permissible limit of actual storage (see A.1.2.1).
Table 1 – Moisture soak conditions for non-dry-packed SMDs
Temperature Relative humidity Duration time
Permissible limit on
Condition
actual storage
°C % h
A1 or B1 85
...
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