SIST EN 61000-4-29:2003

Electromagnetic compatibility (EMC) -- Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure.

Elektromagnetische Verträglichkeit (EMV) -- Teil 4-29: Prüf- und Messverfahren - Prüfungen der Störfestigkeit gegen Spannungseinbrüche, Kurzzeitunterbrechungen und Spannungsschwankungen an Gleichstrom-Netzeingängen

Compatibilité électromagnétique (CEM) -- Partie 4-29: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et variations de tension sur les accès d'alimentation en courant continu

Etablit une référence commune et reproductible pour les essais des équipements électriques et électroniques en leur appliquant des creux de tension, des coupures brèves et des variations de tension au niveau des ports d'entrée du courant continu. Cette norme définit: - la gamme des niveaux d'essai; - le générateur d'essai; - les matériels d'essai; - la procédure d'essai.

Electromagnetic compatibility (EMC) -- Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests (IEC 61000-4-29:2000)

General Information

• Status: Published
• Publication Date: 28-Feb-2003
• ICS: 33.100.20 - Immunity
• Technical Committee: EMC - Electromagnetic compatibility
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 01-Mar-2003
• Due Date: 01-Mar-2003
• Completion Date: 01-Mar-2003
• Directive: 2014/32/EU - Directive 2014/32/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to the making available on the market of measuring instruments
• Directive: 89/336/EEC - Electromagnetic compatibility (EMC)
• Ref Project: EN 61000-4-29:2000 - Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 61000-4-29:2003
01-marec-2003
Electromagnetic compatibility (EMC) -- Part 4-29: Testing and measurement
techniques - Voltage dips, short interruptions and voltage variations on d.c. input
power port immunity tests (IEC 61000-4-29:2000)
Electromagnetic compatibility (EMC) -- Part 4-29: Testing and measurement techniques -
Voltage dips, short interruptions and voltage variations on d.c. input power port immunity
tests
Elektromagnetische Verträglichkeit (EMV) -- Teil 4-29: Prüf- und Messverfahren -
Prüfungen der Störfestigkeit gegen Spannungseinbrüche, Kurzzeitunterbrechungen und
Spannungsschwankungen an Gleichstrom-Netzeingängen
Compatibilité électromagnétique (CEM) -- Partie 4-29: Techniques d'essai et de mesure -
Essais d'immunité aux creux de tension, coupures brèves et variations de tension sur les
accès d'alimentation en courant continu
Ta slovenski standard je istoveten z: EN 61000-4-29:2000
ICS:
33.100.20 Imunost Immunity
SIST EN 61000-4-29:2003 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 61000-4-29:2003

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SIST EN 61000-4-29:2003
EUROPEAN STANDARD EN 61000-4-29
NORME EUROPÉENNE
EUROPÄISCHE NORM November 2000

ICS 33.100.20


English version


Electromagnetic compatibility (EMC)
Part 4-29: Testing and measurement techniques -
Voltage dips, short interruptions and voltage variations
on d.c. input power port immunity tests
(IEC 61000-4-29:2000)


Compatibilité électromagnétique (CEM) Elektromagnetische Verträglichkeit (EMV)
Partie 4-29: Techniques d'essai et de Teil 4-29: Prüf- und Messverfahren -
mesure - Prüfungen der Störfestigkeit gegen
Essais d'immunité aux creux de tension, Spannungseinbrüche,
coupures brèves et variations de tension Kurzzeitunterbrechungen und
sur les accès d'alimentation en courant Spannungsschwankungen an
continu Gleichstrom-Netzeingängen
(CEI 61000-4-29:2000) (IEC 61000-4-29:2000)


This European Standard was approved by CENELEC on 2000-11-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway,
Portugal, Spain, Sweden, Switzerland and United Kingdom.


CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2000 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

  Ref. No. EN 61000-4-29:2000 E

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SIST EN 61000-4-29:2003
Page 2
EN 61000-4-29:2000
Foreword
The text of document 77A/307/FDIS, future edition 1 of IEC 61000-4-29, prepared by SC 77A, Low-
frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC
parallel vote and was approved by CENELEC as EN 61000-4-29 on 2000-11-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2001-08-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2003-11-01

Annexes designated "normative" are part of the body of the standard.
Annexes designated "informative" are given for information only.
In this standard, annexes B and ZA are normative and annex A is informative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61000-4-29:2000 was approved by CENELEC as a European
Standard without any modification.
__________

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SIST EN 61000-4-29:2003
Page 3
EN 61000-4-29:2000
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other publications.
These normative references are cited at the appropriate places in the text and the publications are listed
hereafter. For dated references, subsequent amendments to or revisions of any of these publications
apply to this European Standard only when incorporated in it by amendment or revision. For undated
references the latest edition of the publication referred to applies (including amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
IEC 60050-161 1990 International Electrotechnical Vocabulary - -
(IEV) - Chapter 161: Electromagnetic
compatibility

IEC 61000-4-11 1994 Electromagnetic compatibility (EMC) EN 61000-4-11 1994
Part 4-11: Testing and measurement
techniques - Voltage dips, short interruptions
and voltage variations immunity tests

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SIST EN 61000-4-29:2003

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SIST EN 61000-4-29:2003
NORME CEI
INTERNATIONALE IEC
61000-4-29
INTERNATIONAL
Première édition
STANDARD
First edition
2000-08
PUBLICATION FONDAMENTALE EN CEM
BASIC EMC PUBLICATION
Compatibilité électromagnétique (CEM) –
Partie 4-29:
Techniques d'essai et de mesure –
Essais d'immunité aux creux de tension,
coupures brèves et variations de tension
sur les accès d'alimentation en courant continu
Electromagnetic compatibility (EMC) –
Part 4-29:
Testing and measurement techniques –
Voltage dips, short interruptions and voltage
variations on d.c. input power port immunity tests
 IEC 2000 Droits de reproduction réservés  Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun procédé, any form or by any means, electronic or mechanical,
électronique ou mécanique, y compris la photocopie et les including photocopying and microfilm, without permission in
microfilms, sans l'accord écrit de l'éditeur. writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: [phone] e-mail: [e-mail] IEC web site http://www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
R
PRICE CODE
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue

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SIST EN 61000-4-29:2003
61000-4-29  IEC:2000 – 3 –
CONTENTS
Page
FOREWORD . 5
INTRODUCTION .9
Clause
1 Scope and object . 11
2 Normative references . 13
3 Definitions. 13
4 General. 15
5 Test levels . 15
6 Test generator . 19
6.1 Characteristics and performances of the generator. 19
6.2 Verification of the characteristics of the generator . 21
7 Test set-up. 23
8 Test procedure. 23
8.1 Laboratory reference conditions . 25
8.2 Execution of the test . 25
9 Evaluation of test results . 27
10 Test report . 27
Annex A (informative) Example of test generators and test set-up . 31
Annex B (normative) Inrush current measurement. 35
Figure A.1 – Example of test generator based on two power sources with internal switching . 33
Figure A.2 – Example of test generator based on a programmable power supply. 33
Figure B.1 – Circuit for measuring the peak inrush current drive capability of a test
generator. 37
Figure B.2 – Circuit for measuring the peak inrush current of an EUT. 37
Table 1a – Preferred test levels and durations for voltage dips . 17
Table 1b – Preferred test levels and durations for short interruptions. 17
Table 1c – Preferred test levels and durations for voltage variations. 17

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SIST EN 61000-4-29:2003
61000-4-29  IEC:2000 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-29: Testing and measurement techniques –
Voltage dips, short interruptions
and voltage variations on d.c. input power port immunity tests
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international cooperation on all questions concerning standardisation in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International
Standardization Organization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use published in the form of
standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard an the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-29 has been prepared by subcommittee 77A: Low-
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
This standard forms part 4-29 of IEC 61000. It has the status of a basic EMC publication in
accordance with IEC Guide 107.
The text of this standard is based on the following documents:
FDIS Report on voting
77A/307/FDIS 77A/313/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.
Annex A is for information only.
Annex B forms an integral part of this standard.

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SIST EN 61000-4-29:2003
61000-4-29  IEC:2000 – 7 –
The committee has decided that the contents of this publication will remain unchanged until
2002. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.

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SIST EN 61000-4-29:2003
61000-4-29  IEC:2000 – 9 –
INTRODUCTION
IEC 61000 is published in separate parts, according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as International Standards,
technical specifications or technical reports, some of which have already been published as
sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: 61000-6-1).
This part is an International Standard which gives test procedures related to voltage dips, short
interruptions and voltage variations on d.c. input power ports.

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SIST EN 61000-4-29:2003
61000-4-29  IEC:2000 – 11 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-29: Testing and measurement techniques –
Voltage dips, short interruptions
and voltage variations on d.c. input power port immunity tests
1 Scope and object
This part of IEC 61000 defines test methods for immunity to voltage dips, short interruptions
and voltage variations at the d.c. input power port of electrical or electronic equipment.
This standard is applicable to low voltage d.c. power ports of equipment supplied by external
d.c. networks.
The object of this standard is to establish a common and reproducible basis for testing
electrical and electronic equipment when subjected to voltage dips, short interruptions or
voltage variations on d.c. input power ports.
This standard defines:
– the range of test levels;
– the test generator;
– the test set-up;
– the test procedure.
The test described hereinafter applies to electrical and electronic equipment and systems. It
also applies to modules or subsystems whenever the EUT (equipment under test) rated power
is greater than the test generator capacity specified in clause 6.
The ripple at the d.c. input power port is not included in the scope of this part of IEC 61000. It
1)
is covered by IEC 61000-4-17
This standard does not specify the tests to be applied to particular apparatus or systems. Its
main aim is to give a general basic reference to IEC product committees. These product
committees (or users and manufacturers of equipment) remain responsible for the appropriate
choice of the tests and the severity level to be applied to their equipment.
———————
1)
IEC 61000-4-17, Electromagnetic compatibility (EMC) – Part 4-17: Testing and measurement techniques –
Ripple on d.c. input power port immunity test

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SIST EN 61000-4-29:2003
61000-4-29  IEC:2000 – 13 –
2 Normative references
The following normative documents contain provisions which, through reference in this text,
constitute provisions of this part of IEC 61000. For dated references, subsequent amendments
to, or revisions of, any of these publications do not apply. However, parties to agreements
based on this part of IEC 61000 are encouraged to investigate the possibility of applying the
most recent editions of the normative documents indicated below. For undated references, the
latest edition of the normative document referred to applies. Members of ISO and IEC maintain
registers of currently valid International Standards.
IEC 60050(161), International Electrotechnical Vocabulary (IEV) – Chapter 161: Electro-
magnetic compatibility
IEC 61000-4-11, Electromagnetic compatibility (EMC) – Part 4: Testing and measuring
techniques – Section 11: Voltage dips, short interruptions and voltage variations immunity tests
3 Definitions
For the purposes of this part of IEC 61000 the definitions of IEC 60050(161) and the following
definitions and terms apply.
3.1
EUT
equipment under test
3.2
immunity (to a disturbance)
the ability of a device, equipment or system to perform without degradation in the presence of
an electromagnetic disturbance
[IEV 161-01-20]
3.3
voltage dip
a sudden reduction of the voltage at a point in the low voltage d.c. distribution system, followed
by voltage recovery after a short period of time, from a few milliseconds up to a few seconds
[IEV 161-08-10, modified]
3.4
short interruption
the disappearance of the supply voltage at a point of the low voltage d.c. distributed system for
a period of time typically not exceeding 1 min. In practice, a dip with amplitude at least 80 % of
the rated voltage may be considered as an interruption.
3.5
voltage variation
a gradual change of the supply voltage to a higher or lower value than the rated voltage. The
duration of the change can be short or long.
3.6
malfunction
the termination of the ability of an equipment to carry out intended functions, or the execution
of unintended functions by the equipment.

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SIST EN 61000-4-29:2003
61000-4-29  IEC:2000 – 15 –
4 General
The operation of electrical or electronic equipment may be affected by voltage dips, short
interruptions or voltage variations of the power supply.
Voltage dips and short interruptions are mainly caused by faults in the d.c. distribution system,
or by sudden large changes of load. Is also possible for two or more consecutive dips or
interruptions to occur.
Faults in the d.c. distribution system may inject transient overvoltages into the distribution
network; this particular phenomenon is not covered by this standard.
Voltage interruptions are primarily caused by the switching of mechanical relays when changing
from one source to another (e.g. from generator set to battery).
During a short interruption, the d.c. supply network may present either a "high impedance" or
"low impedance" condition. The first condition can be due to switching from one source to
another; the second condition can be due to the clearing of an overload or fault condition on
the supply
...