SIST EN IEC 62228-3:2019

Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (IEC 62228-3:2019)

This part of IEC 62228 specifies test and measurement methods for EMC evaluation of CAN
transceiver ICs under network condition. It defines test configurations, test conditions, test
signals, failure criteria, test procedures, test setups and test boards. It is applicable for CAN
standard transceivers, CAN transceivers with partial networking functionality and CAN
transceivers with flexible data rate capability and covers
• the emission of RF disturbances,
• the immunity against RF disturbances,
• the immunity against impulses, and
• the immunity against electrostatic discharges (ESD).

Integrierte Schaltungen - Bewertung der elektromagnetischen Verträglichkeit von Sende-Empfangsgeräten - Teil 3: CAN-Sende-Empfangsgeräte (IEC 62228-3:2019)

Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 3: Émetteurs-récepteurs CAN (IEC 62228-3:2019)

La présente partie de l'IEC 62228 spécifie les méthodes d'essai et de mesure pour l'évaluation de la compatibilité électromagnétique (CEM) des circuits intégrés émetteursrécepteurs CAN placés en réseau. Elle définit les configurations d'essai, les conditions d'essai, les signaux d'essai, les critères de défaillance, les modes opératoires d'essai, les dispositions d'essai et les cartes d'essai. Elle est applicable aux émetteurs-récepteurs CAN standard, aux émetteurs-récepteurs CAN avec une fonctionnalité de mise en réseau partielle et aux émetteurs-récepteurs CAN avec une capacité de taux de transfert flexible et couvre
- l'émission de perturbations radioélectriques,
- l'immunité aux perturbations radioélectriques,
- l'immunité aux transitoires électriques, et
- l'immunité aux décharges électrostatiques (DES).

Integrirana vezja - Vrednotenje elektromagnetne združljivosti (EMC) oddajnikov-sprejemnikov - 3. del: Oddajniki-sprejemniki CAN (IEC 62228-3:2019)

Ta del standarda IEC 62228 določa preskusne in merilne metode za vrednotenje elektromagnetne združljivosti integriranih vezij oddajnikov-sprejemnikov CAN pri omrežnih pogojih. Opredeljuje konfiguracije preskusov, preskusne pogoje, preskusne signale, merila za neuspešno opravljen preskus, preskusne postopke, nastavitve preskusa in preskusne plošče. Uporablja se za standardne oddajnike-sprejemnike CAN, oddajnike-sprejemnike CAN z delno omrežno funkcijo in oddajnike-sprejemnike CAN s prilagodljivo hitrostjo podatkov ter zajema
• oddajanje radiofrekvenčnih motenj,
• odpornost na radiofrekvenčne motnje,
• odpornost na impulze in
• odpornost na elektrostatične razelektritve (ESD).

General Information

• Status: Published
• Publication Date: 22-May-2019
• ICS: 31.200 - Integrated circuits. Microelectronics
• ICS: 33.100.01 - Electromagnetic compatibility in general
• Technical Committee: I11 - Imaginarni 11
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 10-May-2019
• Due Date: 15-Jul-2019
• Completion Date: 23-May-2019
• Ref Project: EN IEC 62228-3:2019 - Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers

Relations

• Corrected By: SIST EN IEC 62228-3:2019/AC:2023 - Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (IEC 62228-3:2019/COR1:2023)
• Effective Date: 11-Jul-2023

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN IEC 62228-3:2019
01-julij-2019
Integrirana vezja - Vrednotenje elektromagnetne združljivosti (EMC) oddajnikov-
sprejemnikov - 3. del: Oddajniki-sprejemniki CAN (IEC 62228-3:2019)
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (IEC
62228-3:2019)
Integrierte Schaltungen - Bewertung der elektromagnetischen Verträglichkeit von Sende-
Empfangsgeräten - Teil 3: CAN-Sende-Empfangsgeräte (IEC 62228-3:2019)
Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 3: Émetteurs-
récepteurs CAN (IEC 62228-3:2019)
Ta slovenski standard je istoveten z: EN IEC 62228-3:2019
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
33.100.01 Elektromagnetna združljivost Electromagnetic compatibility
na splošno in general
SIST EN IEC 62228-3:2019 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN IEC 62228-3:2019

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SIST EN IEC 62228-3:2019


EUROPEAN STANDARD EN IEC 62228-3

NORME EUROPÉENNE

EUROPÄISCHE NORM
May 2019
ICS 31.200

English Version
Integrated circuits - EMC evaluation of transceivers - Part 3:
CAN transceivers
(IEC 62228-3:2019)
Circuits intégrés - Évaluation de la CEM des émetteurs- Integrierte Schaltungen - Bewertung der
récepteurs - Partie 3: Émetteurs-récepteurs CAN elektromagnetischen Verträglichkeit von Sende-
(IEC 62228-3:2019) Empfangsgeräten - Teil 3: CAN-Sende-Empfangsgeräte
(IEC 62228-3:2019)
This European Standard was approved by CENELEC on 2019-04-15. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.



European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2019 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. EN IEC 62228-3:2019 E

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SIST EN IEC 62228-3:2019
EN IEC 62228-3:2019 (E)
European foreword
The text of document 47A/1050/CDV, future edition 1 of IEC 62228-3, prepared by SC 47A "Integrated
circuits" of IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and
approved by CENELEC as EN IEC 62228-3:2019.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2020-01-15
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2022-04-15
document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice
The text of the International Standard IEC 62228-3:2019 was approved by CENELEC as a European
Standard without any modification.

In the official version, for Bibliography, the following notes have to be added for the standards
indicated:
IEC 61000-4-4 NOTE Harmonized as EN 61000-4-4
CISPR 16-1-1 NOTE Harmonized as EN 55016-1-1

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SIST EN IEC 62228-3:2019
EN IEC 62228-3:2019 (E)
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1  Where an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2  Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.

Publication Year Title EN/HD Year
IEC 61967-1 -  Integrated circuits - Measurement of EN IEC 61967-1 -
electromagnetic emissions - Part 1: General
conditions and definitions
IEC 61967-4 -  Integrated circuits - Measurement of EN 61967-4 -
electromagnetic emissions, 150 kHz to 1 GHz -
Part 4: Measurement of conducted emissions, 1
ohm/150 ohm direct coupling method
IEC 62132-1 -  Integrated circuits - Measurement of EN 62132-1 -
electromagnetic immunity - Part 1: General
conditions and definitions
IEC 62132-4 -  Integrated circuits - Measurement of EN 62132-4 -
electromagnetic immunity 150 kHz to 1 GHz - Part
4: Direct RF power injection method
IEC 62215-3 -  Integrated circuits - Measurement of impulse EN 62215-3 -
immunity - Part 3: Non-synchronous transient
injection method
IEC 62228-1 -  Integrated circuits - EMC evaluation of EN IEC 62228-1 -
transceivers - Part 1: General conditions and
definitions
ISO 7637-2 -  Road vehicles - Electrical disturbances from - -
conduction and coupling - Part 2: Electrical
transient conduction along supply lines only
ISO 10605 -  Road vehicles - Test methods for electrical - -
disturbances from electrostatic discharge
ISO 11898-1 -  Road vehicles - Controller area network (CAN) - - -
Part 1: Data link layer and physical signalling
ISO 11898-2 -  Road vehicles - Controller area network (CAN) - - -
Part 2: High-speed medium access unit

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SIST EN IEC 62228-3:2019




IEC 62228-3

®


Edition 1.0 2019-03




INTERNATIONAL



STANDARD




NORME



INTERNATIONALE
colour

inside










Integrated circuits – EMC evaluation of transceivers –

Part 3: CAN transceivers




Circuits intégrés – Évaluation de la CEM des émetteurs-récepteurs –

Partie 3: Émetteurs-récepteurs CAN
















INTERNATIONAL

ELECTROTECHNICAL

COMMISSION


COMMISSION

ELECTROTECHNIQUE


INTERNATIONALE




ICS 31.200 ISBN 978-2-8322-6639-7




Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN IEC 62228-3:2019
– 2 – IEC 62228-3:2019 © IEC 2019
CONTENTS
FOREWORD . 6
1 Scope . 8
2 Normative references . 8
3 Terms, definitions and abbreviated terms . 9
3.1 Terms and definitions . 9
3.2 Abbreviated terms . 10
4 General . 10
5 Test and operating conditions . 11
5.1 Supply and ambient conditions. 11
5.2 Test operation modes . 12
5.3 Test configuration . 12
5.3.1 General test configuration for transceiver network . 12
5.3.2 General test configuration for unpowered ESD test . 13
5.3.3 Transceiver network tests – Coupling ports and networks . 14
5.3.4 ESD tests – Coupling ports and networks . 15
5.4 Test signals . 16
5.4.1 General . 16
5.4.2 Test signals for normal operation mode . 16
5.4.3 Test signal for wake-up from low power mode . 18
5.5 Evaluation criteria . 22
5.5.1 General . 22
5.5.2 Evaluation criteria for functional operation modes . 22
5.5.3 Evaluation criteria in unpowered condition after exposure to
disturbances . 28
5.5.4 Status classes . 29
6 Test and measurement . 29
6.1 Emission of RF disturbances . 29
6.1.1 Test method . 29
6.1.2 Test setup . 29
6.1.3 Test procedure and parameters . 30
6.2 Immunity to RF disturbances . 31
6.2.1 Test method . 31
6.2.2 Test setup . 31
6.2.3 Test procedure and parameters . 32
6.3 Immunity to impulses . 37
6.3.1 Test method . 37
6.3.2 Test setup . 37
6.3.3 Test procedure and parameters . 38
6.4 Electrostatic discharge (ESD) . 41
6.4.1 Test method . 41
6.4.2 Test setup . 41
6.4.3 Test procedure and parameters . 43
7 Test report . 44
Annex A (normative) CAN test circuits . 45
A.1 General . 45
A.2 Test circuit for CAN transceivers for functional tests . 45

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A.3 Test circuit for CAN transceiver for ESD test . 49
Annex B (normative) Test circuit boards. 51
B.1 Test circuit board for functional tests . 51
B.2 ESD test . 51
Annex C (informative) Examples for test limits for CAN transceiver in automotive
application . 53
C.1 General . 53
C.2 Emission of RF disturbances . 53
C.3 Immunity to RF disturbances . 54
C.4 Immunity to impulses . 57
C.5 Electrostatic discharge (ESD) . 57
Annex D (informative) Characterization of common mode choke for CAN bus
interfaces . 58
D.1 General . 58
D.2 Abbreviations . 58
D.3 CMC test. 58
D.3.1 General . 58
D.3.2 Leakage inductance mismatch measurement . 59
D.3.3 S-parameter measurement mixed mode . 63
D.3.4 ESD damage . 68
D.3.5 Saturation test at RF disturbances . 71
Bibliography . 74

Figure 1 – General test configuration for tests in transceiver network . 13
Figure 2 – General test configuration for unpowered ESD test . 13
Figure 3 – Transceiver network tests – coupling ports and networks . 14
Figure 4 – Coupling ports and networks for ESD tests . 16
Figure 5 – Definition for trigger points and violation masks for CAN transceivers with
flexible data rate capability . 26
Figure 6 – Principal drawing of the maximum deviation on an I-V characteristic . 28
Figure 7 – Test setup for measurement of RF disturbances . 30
Figure 8 – Test setup for DPI tests. 32
Figure 9 – Test setup for impulse immunity tests . 37
Figure 10 – Test setup for direct ESD tests – principal arrangement . 42
Figure 11 – Test setup for direct ESD tests – stimulation and monitoring . 43
Figure A.1 – General drawing of the circuit diagram of test network for CAN standard
transceivers for functional test . 47
Figure A.2 – General drawing of the circuit diagram of test network for CAN PN
transceivers for functional test . 49
Figure A.3 – General drawing of the circuit diagram for direct ESD tests of CAN
transceivers in unpowered mode . 50
Figure B.1 – Example of IC interconnections of CAN signal . 51
Figure B.2 – Example of ESD test board for CAN transceivers . 52
Figure C.1 – Example of limits for RF emission – CAN with bus filter . 53
Figure C.2 – Example of limits for RF emission – other global pins . 54
Figure C.3 – Example of limits for RF emission – local supplies . 54

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SIST EN IEC 62228-3:2019
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Figure C.4 – Example of limits for RF immunity for functional status class A – CAN
IC
with bus filter . 55
Figure C.5 – Example of limits for RF immunity for functional status class A – CAN . 55
IC
Figure C.6 – Example of limits for RF immunity for functional status class A – other
IC
global pins . 56
Figure C.7 – Example of limits for RF immunity for functional status class C or D –
IC IC
CAN with bus filter . 56
Figure C.8 – Example of limits for RF immunity for functional status class C or D –
IC IC
other global pins . 57
Figure D.1 – General electrical drawing of a CMC . 59
Figure D.2 – Test setup for 2-port S-Parameter measurements for leakage inductance

evaluation . 59
Figure D.3 – Example of a two-port test board for CMC leakage inductance
characterization . 60
Figure D.4 – Example of CMC characterization measurement results. 63
Figure D.5 – Test setup for S-Parameter measurements . 64
Figure D.6 – Example test board S-Parameter measurement – mixed mode, top layer . 65
Figure D.7 – Example test board S-Parameter measurement – single ended, top layer . 65
Figure D.8 – Recommended characteristics for S (IL) . 67
dd21
Figure D.9 – Recommended characteristic for S (CMR) . 68
cc21
Figure D.10 – Recommended characteristic for S and S (DCMR) . 68
sd21 sd12
Figure D.11 – Test setup for ESD damage tests . 69
Figure D.12 – Example test board ESD, top layer . 70
Figure D.13 – Test setup for RF saturation measurements . 71
Figure D.14 – Example RF saturation / S-Parameter test board, top layer . 72

Table 1 – Overview of measurements and tests . 11
Table 2 – Supply and ambient conditions for functional operation . 12
Table 3 – Transceiver network tests – component value definitions of coupling ports
and networks . 15
Table 4 – Definitions of coupling ports for ESD tests . 16
Table 5 – Communication test signal TX1 . 17
Table 6 – Communication test signal TX2a . 17
Table 7 – Communication test signal TX2b . 18
Table 8 – Wake-up test signal TX3 . 18
Table 9 – Communication test signal TX4a . 19
Table 10 – Communication test signal TX4b . 19
Table 11 – Communication test signal TX4c . 19
Table 12 – Communication test signal TX4d . 20
Table 13 – Communication test signal TX4e . 20
Table 14 – Communication test signal TX4f1 . 20
Table 15 – Communication test signal TX4f2 . 21
Table 16 – Communication test signal TX4g . 21
Table 17 – Communication test signal TX4h . 21
Table 18 – Communication test signal TX4i . 22

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SIST EN IEC 62228-3:2019
IEC 62228-3:2019 © IEC 2019 – 5 –
Table 19 – Evaluation criteria for CAN transceiver standard functions . 23
Table 20 – Evaluation criteria for CAN transceivers with partial networking functionality . 23
Table 21 – Specific definition for test procedure for evaluation of CAN transceiver
partial networking function . 24
Table 22 – Evaluation criteria for CAN transceivers with flexible data rate capability. 25
Table 23 – Definitions for violation masks for CAN transceivers with flexible data rate
capability . 27
Table 24 – Definition of functional status classes . 29
Table 25 – Settings of the RF measurement equipment . 31
Table 26 – RF emission measurements . 31
Table 27 – Specifications for DPI tests . 33
Table 28 – DPI tests for functional status class A evaluation of CAN transceiver
IC
standard function . 34
Table 29 – DPI tests for functional status class A evaluation of CAN transceiver
IC
partial networking function . 35
Table 30 – DPI tests for functional status class A evaluation of CAN transceiver
IC
CAN FD function . 36
Table 31 – DPI tests for functional status class C or D evaluation of CAN
IC IC
transceivers . 36
Table 32 – Specifications for impulse immunity tests . 38
Table 33 – Parameters for impulse immunity test . 38
Table 34 – Impulse immunity tests for functional status class A evaluation of CAN
IC
transceiver standard function . 39
Table 35 – Impulse immunity tests for functional status class A evaluation of CAN
IC
transceiver partial networking function . 40
Table 36 – Impulse immunity tests for functional status class A evaluation of CAN
IC
transceiver CAN FD function . 40
Table 37 – Impulse immunity tests for functional status class C or D evaluation of
IC IC
CAN transceivers . 41
Table 38 – Specifications for direct ESD tests . 43
Table 39 – ESD tests in unpowered mode for functional status class D evaluation of
IC

CAN transceivers . 44
Table B.1 – Parameters of ESD test circuit board . 52
Table C.1 – Example of limits for impulse immunity for functional status class C or D . 57
IC IC
Table D.1 – Test procedure and parameters for leakage inductance evaluation . 61
Table D.2 – Leakage inductance measurements . 62
Table D.3 – Leakage inductance mismatch classes . 63
Table D.4 – Test procedure and parameters for 3-port test board characterization . 64
Table D.5 – Test procedure and parameters for S-Parameter measurements . 66
Table D.6 – Required S-Parameter measurements . 67
Table D.7 – Test parameters for ESD damage tests . 70
Table D.8 – Required ESD tests for damage . 71
Table D.9 – Test procedure and parameters for RF saturation tests . 72
Table D.10 – Required RF saturation tests. 73

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INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

INTEGRATED CIRCUITS –
EMC EVALUATION OF TRANSCEIVERS –

Part 3: CAN transceivers

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collabor
...