Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2021)

This part of IEC 60749 details the procedures for the measurement of the characteristic
properties of moisture diffusivity and water solubility in organic materials used in the
packaging of semiconductor components.
These two material properties are important parameters for the effective reliability
performance of plastic packaged semiconductors after exposure to moisture and being
subjected to high-temperature solder reflow.

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 39: Messung des Feuchtediffusionskoeffizienten und der Wasserlöslichkeit in organischen Werkstoffen, welche bei Halbleiter-Komponenten verwendet werden (IEC 60749-39:2021)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 39: Mesure de la diffusion d'humidité et de l'hydrosolubilité dans les matériaux organiques utilisés dans les composants à semiconducteurs (IEC 60749-39:2021)

IEC 60749-39:2021 est disponible sous forme de IEC 60749-39:2021 RLV qui contient la Norme internationale et sa version Redline, illustrant les modifications du contenu technique depuis l'édition précédente.L’IEC 60749-39:2021 détaille les modes opératoires pour la mesure des propriétés caractéristiques de la diffusivité d’humidité et de l’hydrosolubilité dans les matériaux organiques utilisés dans l’encapsulation des composants à semiconducteurs. Ces deux propriétés des matériaux sont des paramètres importants pour la performance de fiabilité réelle des semiconducteurs sous boîtier en plastique après exposition à l’humidité et qui sont soumis à une refusion à température élevée au moment du brasage. Cette édition inclut les modifications techniques majeures suivantes par rapport à l’édition précédente: - mise à jour du mode opératoire relatif à la détermination du "poids sec".

Polprevodniški elementi - Mehanske in klimatske preskusne metode - 39. del: Meritve prepuščanja vlage organskih materialov in njihove vodotopnosti za polprevodniške komponente (IEC 60749-39:2021)

Ta del standarda IEC 60749 podrobno opisuje postopke za meritve prepuščanja vlage organskih materialov in njihove vodotopnosti za polprevodniške komponente, ki se uporabljajo pri embalaži polprevodniških komponent. Ti dve lastnosti materialov sta pomembna parametra za učinkovito zanesljivost polprevodnikov, pakiranih v plastiko, po izpostavljenosti vlagi in visokotemperaturnemu pretaljevanju.

General Information

Status
Published
Publication Date
01-Feb-2022
Technical Committee
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
01-Feb-2022
Due Date
08-Apr-2022
Completion Date
02-Feb-2022

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SLOVENSKI STANDARD
SIST EN IEC 60749-39:2022
01-marec-2022
Nadomešča:
SIST EN 60749-39:2007
Polprevodniški elementi - Mehanske in klimatske preskusne metode - 39. del:
Meritve prepuščanja vlage organskih materialov in njihove vodotopnosti za
polprevodniške komponente (IEC 60749-39:2021)

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement

of moisture diffusivity and water solubility in organic materials used for semiconductor

components (IEC 60749-39:2021)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 39: Messung

des Feuchtediffusionskoeffizienten und der Wasserlöslichkeit in organischen
Werkstoffen, welche bei Halbleiter-Komponenten verwendet werden (IEC 60749-
39:2021)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie

39: Mesure de la diffusion d'humidité et de l'hydrosolubilité dans les matériaux
organiques utilisés dans les composants à semiconducteurs (IEC 60749-39:2021)
Ta slovenski standard je istoveten z: EN IEC 60749-39:2022
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
SIST EN IEC 60749-39:2022 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN IEC 60749-39:2022
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SIST EN IEC 60749-39:2022
EUROPEAN STANDARD EN IEC 60749-39
NORME EUROPÉENNE
EUROPÄISCHE NORM January 2022
ICS 31.080.01 Supersedes EN 60749-39:2006 and all of its
amendments and corrigenda (if any)
English Version
Semiconductor devices - Mechanical and climatic test methods -
Part 39: Measurement of moisture diffusivity and water solubility
in organic materials used for semiconductor components
(IEC 60749-39:2021)

Dispositifs à semiconducteurs - Méthodes d'essais Halbleiterbauelemente - Mechanische und klimatische

mécaniques et climatiques - Partie 39: Mesure de la Prüfverfahren - Teil 39: Messung des

diffusivité d'humidité et de l'hydrosolubilité dans les Feuchtediffusionskoeffizienten und der Wasserlöslichkeit in

matériaux organiques utilisés dans les composants à organischen Werkstoffen, welche bei Halbleiter-

semiconducteurs Komponenten verwendet werden
(IEC 60749-39:2021) (IEC 60749-39:2021)

This European Standard was approved by CENELEC on 2022-01-03. CENELEC members are bound to comply with the CEN/CENELEC

Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC

Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation

under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the

same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,

Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the

Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,

Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels

© 2022 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.

Ref. No. EN IEC 60749-39:2022 E
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SIST EN IEC 60749-39:2022
EN IEC 60749-39:2022 (E)
European foreword

The text of document 47/2652/CDV, future edition 2 of IEC 60749-39, prepared by IEC/TC 47

"Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved by

CENELEC as EN IEC 60749-39:2022.
The following dates are fixed:

• latest date by which the document has to be implemented at national (dop) 2022-10-03

level by publication of an identical national standard or by endorsement

• latest date by which the national standards conflicting with the (dow) 2025-01-03

document have to be withdrawn

This document supersedes EN 60749-39:2006 and all of its amendments and corrigenda (if any).

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Any feedback and questions on this document should be directed to the users’ national committee. A

complete listing of these bodies can be found on the CENELEC website.
Endorsement notice

The text of the International Standard IEC 60749-39:2021 was approved by CENELEC as a European

Standard without any modification.
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SIST EN IEC 60749-39:2022
EN IEC 60749-39:2022 (E)
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents are referred to in the text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies. For

undated references, the latest edition of the referenced document (including any amendments)

applies.

NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the

relevant EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available

here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60749-20 - Semiconductor devices - Mechanical and EN IEC 60749-20 -
climatic test methods - Part 20: Resistance
of plastic encapsulated SMDs to the
combined effect of moisture and soldering
heat
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SIST EN IEC 60749-39:2022
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SIST EN IEC 60749-39:2022
IEC 60749-39
Edition 2.0 2021-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Mechanical and climatic test methods –
Part 39: Measurement of moisture diffusivity and water solubility in organic
materials used for semiconductor components
Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et
climatiques –
Partie 39: Mesure de la diffusivité d’humidité et de l’hydrosolubilité dans les
matériaux organiques utilisés dans les composants à semiconducteurs
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.01 ISBN 978-2-8322-1046-7

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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SIST EN IEC 60749-39:2022
– 2 – IEC 60749-39:2021 © IEC 2021
CONTENTS

FOREWORD ........................................................................................................................... 3

1 Scope .............................................................................................................................. 5

2 Normative references ...................................................................................................... 5

3 Terms and definitions ...................................................................................................... 5

4 Apparatus ........................................................................................................................ 5

5 Samples .......................................................................................................................... 6

6 Procedure ........................................................................................................................ 6

6.1 Sample preparation ................................................................................................. 6

6.2 Absorption measurements below 100 °C ................................................................. 6

6.3 Solubility and diffusivity calculation ......................................................................... 9

6.4 Desorption measurements above 100 °C .............................................................. 10

7 Calculation of activation energy for moisture diffusion ................................................... 11

8 Calculation of functional fit for solubility ......................................................................... 11

9 Summary ....................................................................................................................... 11

Bibliography .......................................................................................................................... 12

Figure 1 – Example of linearly increasing mass gain ............................................................... 8

Figure 2 – Alternative intercept method to estimate the reversible Fickian moisture

mass ....................................................................................................................................... 9

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SIST EN IEC 60749-39:2022
IEC 60749-39:2021 © IEC 2021 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS –
Part 39: Measurement of moisture diffusivity and water solubility in
organic materials used for semiconductor components
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To

this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,

Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC

Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested

in the subject dealt with may participate in this preparatory work. International, governmental and non-

governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely

with the International Organization for Standardization (ISO) in accordance with conditions determined by

agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any

misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

transparently to the maximum extent possible in their national and regional publications. Any divergence

between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in

the latter.

5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity

assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any

services carried out by independent certification bodies.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and

members of its technical committees and IEC National Committees for any personal injury, property damage or

other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and

expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC

Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

IEC 60749-39 has been prepared by IEC technical committee 47: Semiconductor devices. It is

an International Standard.

This second edition, based on JEDEC document JESD22-A120B, cancels and replaces the

first edition published in 2006. lt is used with permission of the copyright holder, JEDEC Solid

State Technology Association. This edition constitutes a technical revision.

This edition includes the following significant technical changes with respect to the previous

edition:
a) updated procedure for "dry weight" determination.
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SIST EN IEC 60749-39:2022
– 4 – IEC 60749-39:2021 © IEC 2021
The text of this International Standard is based on the following documents:
Draft Report on voting
47/2652/CDV 47/2725/RVC

Full information on the voting for its approval can be found in the report on voting indicated in

the above table.
The language used for the development of this International Standard is English.

This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in

accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement,

available at www.iec.ch/members_experts/refdocs. The main document types developed by

IEC are described in greater detail at www.iec.ch/standardsdev/publications.

A list of all the parts of the IEC 60749 series, under the general title Semiconductor devices –

Mechanical and climatic test methods, can be found on the IEC website.

The committee has decided that the contents of this document will remain unchanged until the

stability date indicated on the IEC website under webstore.iec.ch in the data related to the

specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
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SIST EN IEC 60749-39:2022
IEC 60749-39:2021 © IEC 2021 – 5 –
SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS –
Part 39: Measurement of moisture diffusivity and water solubility in
organic materials used for semiconductor com
...

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