EN 60747-5-3:2001
(Main)Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
Einzel-Halbleiterbauelemente und integrierte Schaltungen - Teil 5-3: Optoelektrische Bauelemente - Messverfahren
Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-3: Dispositifs optoélectroniques - Méthodes de mesure
Décrit les méthodes de mesure applicables aux dispositifs optoélectroniques qui ne sont pas prévus pour être utilisés dans les systèmes ou sous-systèmes à fibres optiques.
Discrete semiconductor devices and integrated circuits - Optoelectronic devices - Measuring methods (IEC 60747-5-3:1997)
General Information
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Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN 60747-5-3:2002
01-september-2002
Discrete semiconductor devices and integrated circuits - Optoelectronic devices -
Measuring methods (IEC 60747-5-3:1997)
Discrete semiconductor devices and integrated circuits -- Part 5-3: Optoelectronic
devices - Measuring methods
Einzel-Halbleiterbauelemente und integrierte Schaltungen -- Teil 5-3: Optoelektrische
Bauelemente - Messverfahren
Dispositifs discrets à semiconducteurs et circuits intégrés -- Partie 5-3: Dispositifs
optoélectroniques - Méthodes de mesure
Ta slovenski standard je istoveten z: EN 60747-5-3:2001
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
SIST EN 60747-5-3:2002 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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EUROPEAN STANDARD EN 60747-5-3
NORME EUROPÉENNE
EUROPÄISCHE NORM July 2001
ICS 31.260
English version
Discrete semiconductor devices and integrated circuits
Part 5-3: Optoelectronic devices -
Measuring methods
(IEC 60747-5-3:1997)
Dispositifs discrets à semiconducteurs et Einzel-Halbleiterbauelemente und
circuits intégrés integrierte Schaltungen
Partie 5-3: Dispositifs optoélectroniques - Teil 5-3: Optoelektronische Bauelemente -
Méthodes de mesure Meßverfahren
(CEI 60747-5-3:1997) (IEC 60747-5-3:1997)
This European Standard was approved by CENELEC on 2000-12-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway,
Portugal, Spain, Sweden, Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2001 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60747-5-3:2001 E
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EN 60747-5-3:2001 - 2 -
Foreword
The text of the International Standard IEC 60747-5-3:1997, prepared by SC 47C, Flat panel display
devices, of IEC TC 47, Semiconductor devices, was submitted to the Unique Acceptance Procedure
and was approved by CENELEC as EN 60747-5-3 on 2000-12-01 without any modification.
This standard should be read jointly with IEC 60747-1, EN 62007-1 and EN 62007-2.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2002-01-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2004-01-01
Annexes designated "normative" are part of the body of the standard.
Annexes designated "informative" are given for information only.
In this standard, annex ZA is normative and annex A is informative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60747-5-3:1997 was approved by CENELEC as a
European Standard without any modification.
__________
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- 3 - EN 60747-5-3:2001
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
1)
IEC 60068-1 1988 Environmental testing EN 60068-1 1994
Part 1: General and guidance
IE
...
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