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31.080.10 - Diodes

ICS 31.080.10 Details

Diodes

Dioden

Diodes

Diode

General Information

Parent
31.080 - Semiconductor devices

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Standardization Organization
Technical Committee
Directive
Mandate
50
SIST
SIST EN IEC 61643-341:2020(Main)
Components for low-voltage surge protection -Part 341: Performance requirements and test circuits for thyristor surge suppressors (TSS)
EN IEC 61643-341:2020

This part of IEC 61643 specifies standard test circuits and methods for thyristor surge
suppressor (TSS) components. These surge protective components, SPCs, are specially
formulated thyristors designed to limit overvoltages and divert surge currents by clamping and
switching actions. These SPCs are used in the construction of surge protective devices
(SPDs) and equipment used in Information & Communications Technologies (ICT) networks
with voltages up to AC 1 000 V and DC 1 500 V. This document is applicable to gated or nongated
TSS components with third quadrant (-v and –i) characteristics of blocking, conducting
or switching.
This document contains information on
• terminology;
• letter symbols;
• essential ratings and characteristics;
• rating verification and characteristic measurement;
This document does not apply to the conventional three-terminal thyristors as covered by
IEC 60747-6.

  • Standard
    79 pages
    English language
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CLC
EN IEC 61643-341:2020(Main)
Components for low-voltage surge protection - Part 341: Performance requirements and test circuits for thyristor surge suppressors (TSS)
SIST EN IEC 61643-341:2020

IEC 61643-341:2020 specifies standard test circuits and methods for thyristor surge suppressor (TSS) components. These surge protective components, SPCs, are specially formulated thyristors designed to limit overvoltages and divert surge currents by clamping and switching actions. These SPCs are used in the construction of surge protective devices (SPDs) and equipment used in Information & Communications Technologies (ICT) networks with voltages up to AC 1 000 V and DC 1 500 V. This document is applicable to gated or non-gated TSS components with third quadrant (-v and –i) characteristics of blocking, conducting or switching. This document contains information on - terminology; - letter symbols; - essential ratings and characteristics; - rating verification and characteristic measurement; This document does not apply to the conventional three-terminal thyristors as covered by IEC 60747-6. This second edition of IEC 61643-341 cancels and replaces the first edition published in 2001. This edition constitutes a technical revision.This edition includes the following significant technical changes with respect to the previous edition: Addition of performance values.

  • Standard
    79 pages
    English language
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IEC
IEC 61643-341:2020(Main)
Components for low-voltage surge protection - Part 341: Performance requirements and test circuits for thyristor surge suppressors (TSS)

IEC 61643-341:2020 specifies standard test circuits and methods for thyristor surge suppressor (TSS) components. These surge protective components, SPCs, are specially formulated thyristors designed to limit overvoltages and divert surge currents by clamping and switching actions. These SPCs are used in the construction of surge protective devices (SPDs) and equipment used in Information & Communications Technologies (ICT) networks with voltages up to AC 1 000 V and DC 1 500 V. This document is applicable to gated or non-gated TSS components with third quadrant (-v and –i) characteristics of blocking, conducting or switching. This document contains information on
- terminology;
- letter symbols;
- essential ratings and characteristics;
- rating verification and characteristic measurement;
This document does not apply to the conventional three-terminal thyristors as covered by IEC 60747-6. This second edition of IEC 61643-341 cancels and replaces the first edition published in 2001. This edition constitutes a technical revision.This edition includes the following significant technical changes with respect to the previous edition: Addition of performance values.

  • Standard
    158 pages
    English and French language
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IEC
IEC 60747-4:2007/AMD1:2017(Amendment)
Amendment 1 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
  • Standard
    9 pages
    English and French language
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IEC
IEC 60747-2:2016(Main)
Semiconductor devices - Part 2: Discrete devices - Rectifier diodes

IEC 60747-2:2016 provides standards for the following categories or sub-categories of rectifier diodes, including:
- line rectifier diodes;
- avalanche rectifier diodes;
- fast-switching rectifier diodes;
- Schottky barrier diodes.
This edition includes the following significant technical changes with respect to the previous edition:
a) Schottky barrier diodes and its properties are added;
b) Clauses 3, 4, 5 and 7 were amended with some deletions of information no longer in use or already included in other parts of the IEC 60747 series, and with some necessary additions;
c) Clause 6 was moved and added to Clause 7 of this third edition;
d) some parts of Clause 7 were moved and added to Clause 7 of this third edition;
e) Annex A was deleted.
This publication is to be read in conjunction with IEC 60747-1:2006.

  • Standard
    91 pages
    English and French language
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IEC
IEC 60747-3:2013(Main)
Semiconductor devices - Part 3: Discrete devices: Signal, switching and regulator diodes

IEC 60747-3:2013 gives the requirements for the following devices:
- signal diodes (excluding diodes designed to operate at frequencies above several hundred MHz);
- switching diodes (excluding high power rectifier diodes);
- voltage-regulator diodes; voltage-reference diodes;
- current-regulator diodes.
This edition includes the following significant technical changes with respect to the previous edition:
a) All clauses were re-edited to latest IEC publication format and style with all contents from previous publication.
b) All clauses have been amended by suitable additions and deletions.
This publication should be read in conjunction with IEC 60747-1:2006.

  • Standard
    69 pages
    English and French language
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IEC
IEC TR 61602:1996/COR1:2008(Corrigendum)
Corrigendum 1 - Connectors used in the field of audio, video and audiovisual engineering
  • Technical report
    10 pages
    English and French language
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IEC
IEC 60747-4:2007(Main)
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors

Provides requirements for the following categories of discrete devices: variable capacitance diodes and snap-off diodes, mixer diodes and detector diodes, avalanche diodes, gunn diodes,bipolar transistors and field-effect transistors. This second edition cancels and replaces the first edition, published in 1991, its amendments 1, 2 and 3 (1993, 1999 and 2001, respectively), and constitutes a technical revision.

  • Standard
    276 pages
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  • Standard
    548 pages
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CLC
EN 61643-321:2002(Main)
Components for low-voltage surge protective devices - Part 321: Specifications for Avalanche Breakdown Diode (ABD)
SIST EN 61643-321:2002

Is applicable to avalanche breakdown diodes (ABDs) which represent one type of surge protective device component (hereinafter referred to as SPDC) used in the design and construction of surge protective devices connected to low-voltage power distribution systems, transmission, and signalling networks. Test specifications in this standard are for single ABDs consisting of two terminals. However, multiple ABDs may be assembled within a single package defined as a diode array. Each diode within the array can be tested to this specification. This standard contains a series of test criteria for determining the electrical characteristics of the ABD. From the standard test methods described herein, the performance characteristics and ratings of the ABD can be verified or established for specific packaged designs.

  • Standard
    19 pages
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SIST
SIST EN 61643-321:2002(Main)
Components for low-voltage surge protective devices -- Part 321: Specifications for Avalanche Breakdown Diode (ABD)
EN 61643-321:2002

Is applicable to avalanche breakdown diodes (ABDs) which represent one type of surge protective device component (hereinafter referred to as SPDC) used in the design and construction of surge protective devices connected to low-voltage power distribution systems, transmission, and signalling networks. Test specifications in this standard are for single ABDs consisting of two terminals. However, multiple ABDs may be assembled within a single package defined as a diode array. Each diode within the array can be tested to this specification. This standard contains a series of test criteria for determining the electrical characteristics of the ABD. From the standard test methods described herein, the performance characteristics and ratings of the ABD can be verified or established for specific packaged designs.

  • Standard
    19 pages
    English language
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IEC
IEC 61643-321:2001(Main)
Components for low-voltage surge protective devices - Part 321: Specifications for avalanche breakdown diode (ABD)

Is applicable to avalanche breakdown diodes (ABDs) which represent one type of surge protective device component (hereinafter referred to as SPDC) used in the design and construction of surge protective devices connected to low-voltage power distribution systems, transmission, and signalling networks. Test specifications in this standard are for single ABDs consisting of two terminals. However, multiple ABDs may be assembled within a single package defined as a diode array. Each diode within the array can be tested to this specification. This standard contains a series of test criteria for determining the electrical characteristics of the ABD. From the standard test methods described herein, the performance characteristics and ratings of the ABD can be verified or established for specific packaged designs.

  • Standard
    31 pages
    English and French language
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IEC
IEC 61643-341:2001(Main)
Components for low-voltage surge protective devices - Part 341: Specification for thyristor surge suppressors (TSS)

Is a test specification standard for thyristor surge suppressor (TSS) components designed to limit overvoltages and divert surge currents by clipping and crowbarring actions. Such components are used in the construction of surge protective devices, particularly as they apply to telecommunications. This standard contains information on -terms, letter symbols, and definitions -basic functions, configurations and component structure -service conditions and fault modes -rating verification and characteristic measurement.

  • Standard
    123 pages
    English and French language
    sale 15% off
IEC
IEC 60747-4:1991(Main)
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors

Gives standards for the following categories of discrete devices: variable capacitance diodes and snap-off diodes, mixer diodes and detector diodes, avalanche diodes, gunn diodes, bipolar transistor and field-effet transistors.

  • Standard
    219 pages
    English and French language
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IEC
IEC 60747-2:2000(Main)
Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes

Gives standards for rectifier diodes such as avalanche, controlled avalanche or fast-switching rectifier diodes.

  • Standard
    129 pages
    English and French language
    sale 15% off
SIST
SIST EN 61643-341:2005(Main)
Components for low-voltage surge protective devices -- Part 341: Specification for thyristor surge suppressors (TSS)
EN 61643-341:2001

Is a test specification standard for thyristor surge suppressor (TSS) components designed to limit overvoltages and divert surge currents by clipping and crowbarring actions. Such components are used in the construction of surge protective devices, particularly as they apply to telecommunications. This standard contains information on -terms, letter symbols, and definitions -basic functions, configurations and component structure -service conditions and fault modes -rating verification and characteristic measurement.

  • Standard
    66 pages
    English language
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SIST
SIST EN 150015:2002(Main)
Blank Detail Specification: Unidirectional transient overvoltage suppressor diodes
EN 150015:1992

D114/033: Withdrawn

  • Standard
    14 pages
    English language
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SIST
SIST EN 150001:2002(Main)
Blank Detail Specification: General purpose semiconductor diodes
EN 150001:1991

D114/033: Withdrawn

  • Standard
    9 pages
    English language
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SIST
SIST EN 150014:2002(Main)
Blank Detail Specification: Thyristor-diodes, transient overvoltage suppressor
EN 150014:1996

D114/033: Withdrawn

  • Standard
    13 pages
    English language
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SIST
SIST EN 150006:2002(Main)
Blank Detail Specification: Variable capacitance diodes
EN 150006:1991

D114/033: Withdrawn

  • Standard
    8 pages
    English language
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SIST
SIST EN 150013:2002(Main)
Blank Detail Specification: Current regulator and current reference diodes
EN 150013:1991

D114/033: Withdrawn

  • Standard
    11 pages
    English language
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IEC
IEC PAS 62612:2009(Main)
Self-ballasted LED-lamps for general lighting services - Performance requirements

IEC/PAS 62612:2009(E) specifies the performance requirements for self-ballasted LED lamps with a supply voltage up to 250 V, together with the test methods and conditions required, intended for domestic and similar general lighting purposes, having:
- a rated wattage up to 60 W;
- a rated voltage of up to 250 V AC or DC.

  • Technical specification
    15 pages
    English language
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IEC
IEC 60747-4-2:2000(Main)
Semiconductor devices - Discrete devices - Part 4-2: Microwave diodes and transistors - Integrated-circuit microwave amplifiers - Blank detail specification
  • Standard
    17 pages
    English language
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IEC
IEC 60747-12-3:1998(Main)
Semiconductor devices - Part 12-3: Optoelectronic devices - Blank detail specification for light-emitting diodes- Display application
  • Standard
    12 pages
    English language
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IEC
IEC 60747-12-6:1997(Main)
Semiconductor devices - Part 12-6: Optoelectronic devices - Blank detail specification for avalanche photodiodes with/without pigtail, for fibre optic systems or subsystems
  • Standard
    29 pages
    English and French language
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CLC
EN 61643-341:2001(Main)
Components for low-voltage surge protective devices - Part 341: Specification for thyristor surge suppressors (TSS)
SIST EN 61643-341:2005

Is a test specification standard for thyristor surge suppressor (TSS) components designed to limit overvoltages and divert surge currents by clipping and crowbarring actions. Such components are used in the construction of surge protective devices, particularly as they apply to telecommunications. This standard contains information on -terms, letter symbols, and definitions -basic functions, configurations and component structure -service conditions and fault modes -rating verification and characteristic measurement.

  • Standard
    66 pages
    English language
    sale 10% off
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    1 day
CLC
EN 150014:1996(Main)
Blank Detail Specification: Thyristor-diodes, transient overvoltage suppressor
SIST EN 150014:2002

D114/033: Withdrawn

  • Standard
    13 pages
    English language
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50