EN 62433-3:2017

EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)

IEC 62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model - Radiated Emission, ICEM-RE. The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.

EMV-IC-Modellierung - Teil 3: Modelle integrierter Schaltungen für die Simulation des Verhaltens bei elektromagnetischer Beeinflussung - Modellierung von abgestrahlten Aussendungen (ICEM-RE)

Modèles de circuits intégrés pour la CEM - Partie 3: Modèles de circuits intégrés pour la simulation du comportement lors de perturbations électromagnétiques - Modélisation des émissions rayonnées (ICEM-RE)

L'IEC 62433-3:2017 présente une méthode pour déterminer un macromodèle permettant de simuler les niveaux d'émissions rayonnées d'un circuit intégré. Ce modèle est habituellement appelé: modèle des émissions de circuits intégrés - Emissions rayonnées (ICEM-RE: Integrated Circuit Emission Model – Radiated Emission). Le modèle est destiné à être utilisé pour modéliser un circuit intégré complet, avec ou sans son boîtier, un bloc fonctionnel et un bloc à propriété intellectuelle (IP) de circuits intégrés analogiques et numériques (broches d'entrée/sortie, cœur numérique et alimentation), lorsque les données mesurées ou simulées ne peuvent pas être importées directement dans des outils de simulation.

Modeliranje integriranih vezij (IC) za elektromagnetno združljivost (EMC) - 3. del: Modeli integriranih vezij za simulacijo obnašanja glede na elektromagnetno odpornost (EMI) - Modeliranje sevanih emisij (ICEM-RE) (IEC 62433-3:2017 )

Ta del standarda IEC 62433 določa metodo za izpeljavo makro modela, ki omogoča simulacijo ravni sevanih emisij integriranega vezja (IC). Ta model običajno imenujemo model emisij integriranega vezja – sevane emisije, ICEM-RE. Model je predviden za uporabo za modeliranje celotnega integriranega vezja s povezanim paketom ali brez njega, funkcionalnega bloka in bloka intelektualne lastnine (IP) analognih in digitalnih integriranih vezij (vhodne/izhodne nožice, digitalno jedro in napajanje), kadar izmerjenih ali simuliranih podatkov ni mogoče neposredno uvoziti v simulacijska orodja.
Predlagani makro model integriranega vezja je treba vstaviti v 3D-elektromagnetna simulacijska orodja za:
• napovedovanje bližnje sevanih emisij iz integriranega vezja;
• ocenjevanje učinka sevanih emisij na sosednja integrirana vezja, kable, prenosne vode itd.
Ta del standarda IEC 62433 ima dva glavna dela:
• prvi je električni opis elementov makro modela ICEM-RE;
• drugi del pa predlaga univerzalni format za izmenjavo podatkov, ki se imenuje REML in temelji na formatu XML.
Ta format omogoča kodiranje modela ICEM-RE v uporabnejši in splošnejši obliki za simulacijo emisij.

General Information

• Status: Published
• Publication Date: 01-Jun-2017
• Withdrawal Date: 02-Mar-2020
• ICS: 31.200 - Integrated circuits. Microelectronics
• ICS: 33.100.10 - Emission
• Technical Committee: CLC/TC 47X - Semiconductor devices and trusted chips
• Drafting Committee: IEC/SC 47A - IEC_SC_47A
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 02-Jun-2017
• Completion Date: 02-Jun-2017
• Ref Project: SIST EN 62433-3:2017 - EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) (IEC 62433-3:2017 )

Standards Content (Sample)

SLOVENSKI STANDARD
01-september-2017
Modeliranje integriranih vezij (IC) za elektromagnetno združljivost (EMC) - 3. del:
Modeli integriranih vezij za simulacijo obnašanja glede na elektromagnetno
odpornost (EMI) - Modeliranje sevanih emisij (ICEM-RE) (IEC 62433-3:2017 )
EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation -
Radiated emissions modelling (ICEM-RE) (IEC 62433-3:2017 )
Modèles de circuits intégrés pour la CEM - Partie 3: Modèles de circuits intégrés pour la
simulation du comportement lors de perturbations électromagnétiques - Modélisation des
émissions rayonnées (ICEM-RE) (IEC 62433-3:2017 )
Ta slovenski standard je istoveten z: EN 62433-3:2017
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
33.100.10 Emisija Emission
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 62433-3
NORME EUROPÉENNE
EUROPÄISCHE NORM
June 2017
ICS 33.100.10; 31.200
English Version
EMC IC modelling - Part 3: Models of Integrated Circuits for EMI
behavioural simulation - Radiated emissions modelling (ICEM-
RE)
(IEC 62433-3:2017)
Modèles de circuits intégrés pour la CEM - Partie 3: EMV-IC-Modellierung - Teil 3: Modelle integrierter
Modèles de circuits intégrés pour la simulation du Schaltungen für die Simulation des Verhaltens bei
comportement lors de perturbations électromagnétiques - elektromagnetischer Beeinflussung - Modellierung von
Modélisation des émissions rayonnées (ICEM-RE) abgestrahlten Aussendungen (ICEM-RE)
(IEC 62433-3:2017) (IEC 62433-3:2017)
This European Standard was approved by CENELEC on 2017-03-03. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 62433-3:2017 E
European foreword
The text of document 47A/1000/FDIS, future edition 1 of IEC 62433-3, prepared by SC 47A
"Integrated circuits" of IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC
parallel vote and approved by CENELEC as EN 62433-3:2017.

The following dates are fixed:
(dop) 2017-12-03
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2020-03-03
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Endorsement notice
The text of the International Standard IEC 62433-3:2017 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
1)
ISO 8879:1986 NOTE Harmonized as EN 28879:1990

1) Withdrawn publication
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant

EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 61967-1 -  Integrated circuits - Measurement of EN 61967-1 -
electromagnetic emissions, 150 kHz to 1
GHz -- Part 1: General conditions and
definitions
IEC 62433-2 -  EMC IC modelling - Part 2: Models of FprEN 62433-2 -
integrated circuits for EMI behavioural
simulation - Conducted emissions
modelling (ICEM-CE)
IEC/TS 61967-3 -  Integrated circuits - Measurement of - -
electromagnetic emissions - Part 3:
Measurement of radiated emissions -
Surface scan method
IEC/TS 62433- -  EMC IC modelling - Part 1: General - -
1:2011 modelling framework
ANSI INCITS 4 -  Information Systems - Coded Character - -
Sets - 7-Bit American National Standard
Code for Information Interchange (7-Bit
ASCII)
IEC 62433-3 ®
Edition 1.0 2017-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
EMC IC modelling –
Part 3: Models of integrated circuits for EMI behavioural simulation – Radiated

emissions modelling (ICEM-RE)
Modèles de circuits intégrés pour la CEM –

Partie 3: Modèles de circuits intégrés pour la simulation du comportement lors

de perturbations électromagnétiques – Modélisation des émissions rayonnées

(ICEM-RE)
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
31.200; 33.100.10 ISBN 978-2-8322-3878-3

– 2 – IEC 62433-3:2017  IEC 2017
CONTENTS
FOREWORD . 6
1 Scope . 8
2 Normative references . 8
3 Terms, definitions, abbreviations and conventions . 9
3.1 Terms and definitions . 9
3.2 Abbreviations . 10
3.3 Conventions . 10
4 Philosophy . 10
5 ICEM-RE macro-model description . 11
5.1 General . 11
5.2 PDN description . 12
5.3 IA description . 16
5.4 Electromagnetic field calculation and simulation . 16
6 REML format . 17
6.1 General . 17
6.2 REML structure . 18
6.3 Global keywords . 19
6.4 Header section . 19
6.5 Frequency definitions . 20
6.6 Coordinate system definition . 20
6.7 Reference definition . 21
6.8 Validity section . 21
6.8.1 General . 21
6.8.2 Attribute definitions . 22
6.9 PDN . 24
6.9.1 General . 24
6.9.2 Attribute definitions . 25
6.9.3 PDN of a single-frequency ICEM-RE . 26
6.9.4 PDN for multi-frequency ICEM-RE . 29
6.10 IA . 32
6.10.1 General . 32
6.10.2 Attribute definitions . 33
6.10.3 IA of a single-frequency ICEM-RE . 34
6.10.4 IA for multi-frequency ICEM-RE . 37
7 Extraction . 38
7.1 General . 38
7.2 Environmental extraction constraints . 39
7.3 Obtaining model parameters from near-field data . 39
7.3.1 General . 39
7.3.2 PDN . 40
7.3.3 IA . 42
7.4 Extraction based on ICEM-CE simulation . 45
7.4.1 General . 45
7.4.2 PDN . 45
7.4.3 IA . 46
8 Validation . 46

IEC 62433-3:2017  IEC 2017 – 3 –
Annex A (normative) Preliminary definitions for XML representation . 48
A.1 XML basics . 48
A.1.1 XML declaration . 48
A.1.2 Basic elements . 48
A.1.3 Root element . 48
A.1.4 Comments . 48
A.1.5 Line terminations . 49
A.1.6 Element hierarchy . 49
A.1.7 Element attributes . 49
A.2 Keyword requirements . 49
A.2.1 General . 49
A.2.2 Keyword characters . 49
A.2.3 Keyword syntax . 50
A.2.4 File structure .
...