Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.

Integrierte Schaltungen - Messung der elektromagnetischen Störfestigkeit - Teil 2: Messung der Störfestigkeit bei Einstrahlungen - TEM-Zellen- und Breitband-TEM-Zellenverfahren

Circuits intégrés - Mesure de l'immunité électromagnétique - Partie 2: Mesure de l'immunité rayonnée - Méthode de cellule TEM et cellule TEM à large bande

La CEI 62132-2:2010 spécifie une méthode de mesure de l'immunité d'un circuit intégré (CI) aux perturbations électromagnétiques rayonnées aux fréquences radioélectriques. La gamme de fréquences de cette méthode est comprise entre 150 kHz et 1 GHz, ou dans les limites fixées par les caractéristiques de la cellule TEM.

Integrirana vezja - Meritve elektromagnetne odpornosti - 2. del: Meritev odpornosti proti sevanju - Metoda s celico TEM in širokopasovno celico TEM (IEC 62132-2:2010)

Ta mednarodni standard določa metodo za merjenje odpornosti integriranega vezja (IC) proti radiofrekvenčnim izsevanim elektromagnetnim motnjam (RF). Frekvenčni razpon te metode sega od 150 kHz do 1 GHz ali kot ga omejujejo značilnosti celice TEM.

General Information

Status
Published
Publication Date
03-Mar-2011
Withdrawal Date
01-Jan-2014
Drafting Committee
Parallel Committee
Current Stage
6060 - Document made available - Publishing
Start Date
04-Mar-2011
Completion Date
04-Mar-2011

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Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 62132-2:2011
01-maj-2011
Integrirana vezja - Meritve elektromagnetne odpornosti - 2. del: Meritev odpornosti
proti sevanju - Metoda s celico TEM in širokopasovno celico TEM (IEC 62132-
2:2010)
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of
radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010)
Integrierte Schaltungen - Messung der elektromagnetischen Störfestigkeit - Teil 2:
Messung der Störfestigkeit bei Einstrahlungen - TEM-Zellen- und Breitband-
TEMZellenverfahren (IEC 62132-2:2010)
Circuits intégrés - Mesure de l'immunité électromagnétique - Partie 2: Mesure de
l'immunité rayonnée - Méthode de cellule TEM et cellule TEM à large bande (CEI 62132-
2:2010)
Ta slovenski standard je istoveten z: EN 62132-2:2011
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
33.100.20 Imunost Immunity
SIST EN 62132-2:2011 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 62132-2:2011

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SIST EN 62132-2:2011

EUROPEAN STANDARD
EN 62132-2

NORME EUROPÉENNE
March 2011
EUROPÄISCHE NORM

ICS 31.200


English version


Integrated circuits -
Measurement of electromagnetic immunity -
Part 2: Measurement of radiated immunity -
TEM cell and wideband TEM cell method
(IEC 62132-2:2010)


Circuits intégrés -  Integrierte Schaltungen -
Mesure de l'immunité électromagnétique - Messung der elektromagnetischen
Partie 2: Mesure de l'immunité rayonnée - Störfestigkeit -
Méthode de cellule TEM et cellule TEM à Teil 2: Messung der Störfestigkeit bei
large bande Einstrahlungen -
(CEI 62132-2:2010) TEM-Zellen- und Breitband-TEM-
Zellenverfahren
(IEC 62132-2:2010)




This European Standard was approved by CENELEC on 2011-01-02. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

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the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels


© 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62132-2:2011 E

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SIST EN 62132-2:2011
EN 62132-2:2011 - 2 -
Foreword
The text of document 47A/838/FDIS, future edition 1 of IEC 62132-2, prepared by SC 47A, Integrated
circuits, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was
approved by CENELEC as EN 62132-2 on 2011-01-02.
This part of EN 62132 is to be read in conjunction with EN 62132-1.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2011-10-02
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2014-01-02
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 62132-2:2010 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
[7] IEC 61000-4-3:2006 NOTE  Harmonized as EN 61000-4-3:2006 (not modified).
   IEC 61000-4-3:2006/A1:2007 NOTE  Harmonized as EN 61000-4-3:2006/A1:2008 (not modified).
[8] IEC 61000-4-6:2008 NOTE  Harmonized as EN 61000-4-6:2009 (not modified).
[9] IEC 61000-4-20:2003 NOTE  Harmonized as EN 61000-4-20:2003 (not mo
...

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