IEC 62528:2007

Standard Testability Method for Embedded Core-based Integrated Circuits

Defines a mechanism for the test of core designs within a system on chip (SoC).This mechanism constitutes a hardware architecture and leverages the core test language (CTL)to faciliate communication between core designers and core integrators.

General Information

• Status: Published
• Publication Date: 06-Nov-2007
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.200 - Integrated circuits. Microelectronics
• Technical Committee: TC 91 - Electronics assembly technology
• Drafting Committee: WG 15 - TC 91/WG 15
• Current Stage: PPUB - Publication issued
• Start Date: 31-Oct-2007
• Completion Date: 07-Nov-2007

Standards Content (Sample)

IEC 62528
Edition 1.0 2007-11
™
IEEE 1500
INTERNATIONAL
STANDARD
Standard Testability Method for Embedded Core-based Integrated Circuits

IEC 62528:2007(E) IEEE Std. 1500-2005

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IEC 62528
Edition 1.0 2007-11
™
IEEE 1500
INTERNATIONAL
STANDARD


Standard testability method for embedded core-based integrated circuits

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
XF
ICS 31.220 ISBN 2-8318-9481-6

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– 2 – IEC 62528:2007(E)
IEEE 1500-2005(E)
CONTENTS
FOREWORD . 4
IEE Introduction . 7
1. Overview.9
1.1 Scope.10
1.2 Purpose.10
2. Normative references.10
3. Definitions, acronyms, and abbreviations.11
3.1 Definitions .11
3.2 Acronyms and abbreviations .16
4. Structure of this standard .17
4.1 Specifications.17
4.2 Descriptions . 18
5. Introduction and motivations of two compliance levels.
...