IEC 62132-2:2010

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.

Circuits intégrés - Mesure de l'immunité electromagnétique - Partie 2: Mesure de l'immunité rayonnée - Méthode de cellule TEM et cellule TEM à large bande

La CEI 62132-2:2010 spécifie une méthode de mesure de l'immunité d'un circuit intégré (CI) aux perturbations électromagnétiques rayonnées aux fréquences radioélectriques. La gamme de fréquences de cette méthode est comprise entre 150 kHz et 1 GHz, ou dans les limites fixées par les caractéristiques de la cellule TEM.

General Information

• Status: Published
• Publication Date: 29-Mar-2010
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.200 - Integrated circuits. Microelectronics
• Technical Committee: SC 47A - Integrated circuits
• Drafting Committee: WG 9 - TC 47/SC 47A/WG 9
• Current Stage: PPUB - Publication issued
• Start Date: 30-Apr-2010
• Completion Date: 30-Mar-2010

Standards Content (Sample)

IEC 62132-2 ®
Edition 1.0 2010-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Integrated circuits – Measurement of electromagnetic immunity –
Part 2: Measurement of radiated immunity – TEM cell and wideband TEM cell
method
Circuits intégrés – Mesure de l’immunité electromagnétique –
Partie 2: Mesure de l’immunité rayonnée – Méthode de cellule TEM et cellule
TEM à large bande
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IEC 62132-2 ®
Edition 1.0 2010-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Integrated circuits – Measurement of electromagnetic immunity –
Part 2: Measurement of radiated immunity – TEM cell and wideband TEM cell
method
Circuits intégrés – Mesure de l’immunité electromagnétique –
Partie 2: Mesure de l’immunité rayonnée – Méthode de cellule TEM et cellule
TEM à large bande
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
T
CODE PRIX
ICS 31.200 ISBN 978-2-88910-624-0
– 2 – 62132-2 © IEC:2010
CONTENTS
FOREWORD.3
1 Scope.5
2 Normative references .5
3 Terms and definitions .5
4 General .6
5 Test conditions .7
6 Test equipment.7
6.1 General .7
6.2 Cables.7
6.3 RF disturbance source .7
6.4 TEM cell.8
6.5 Gigahertz TEM cell.8
6.6 50-Ω termination .8
6.7 DUT monitor.8
7 Test set-up .8
7.1 General .8
7.2 Test set-up details.8
7.3 EMC test board .10
8 Test procedure .10
8.1 General .10
8.2 Immunity measurement .10
8.2.1 General .10
8.2.2 RF disturbance signals .10
8.2.3 Test frequencies.11
8.2.4 Test levels and dwell time .11
8.2.5 DUT monitoring .11
8.2.6 Detail procedure .11
9 Test report.12
Annex A (normative) Field strength characterization procedure.13
Annex B (informative) TEM CELL and wideband TEM cell descriptions.21
Bibliography.22

Figure 1 – TEM and GTEM cell cross-section .9
Figure 2 – TEM cell test set-up .9
Figure 3 – GTEM cell test set-up.10
Figure 4 – Immunity measurement procedure flowchart .12
Figure A.1 – E-field characterization test fixture.14
Figure A.2 – The electric field to voltage transfer function.16
Figure A.3 – H-field characterization test fixture.19
Figure A.4 – The magnetic field to voltage transfer function .20

62132-2 © IEC:2010 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
INTEGRATED CIRCUITS – MEASUREMENT OF
ELECTROMAGNETIC IMMUNITY –
Part 2: Measurement of radiated immunity –
TEM cell and wideband TEM cell method

FOREWORD
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International Standard IEC 62132-2 has been prepared by subcommittee 47A: Integrated
circuits, of IEC technical committee 47: Semiconductor devices.
The text of this standard is based on the following documents:
FDIS Report on voting
47A/838/FDIS 47A/843/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
This part of IEC 62132 is to be read in conjunction with IEC 62132-1.

– 4 – 62132-2 © IEC:2010
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
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