IEC 62899-502-1:2017

Printed electronics - Part 502-1: Quality assessment - Organic light emitting diode (OLED) elements - Mechanical stress testing of OLED elements formed on flexible substrates

IEC 62899-502-1:2017(E) specifies the quality assessment methods, especially the mechanical stress test methods, for reliability assessment.
This document is applicable to flexible OLED elements formed on flexible substrates by printed electronics technology excluding those OLED products, which are intended to be used for lighting purposes.

General Information

• Status: Published
• Publication Date: 06-Mar-2017
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 29.035.01 - Insulating materials in general
• ICS: 31.260 - Optoelectronics. Laser equipment
• Technical Committee: TC 119 - Printed Electronics
• Drafting Committee: WG 5 - TC 119/WG 5
• Current Stage: PPUB - Publication issued
• Start Date: 24-Mar-2017
• Completion Date: 07-Mar-2017

Standards Content (Sample)

IEC 62899-502-1 ®
Edition 1.0 2017-03
INTERNATIONAL
STANDARD
colour
inside
Printed electronics –
Part 502-1: Quality assessment – Organic light emitting diode (OLED) elements –
Mechanical stress testing of OLED elements formed on flexible substrates

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IEC 62899-502-1 ®
Edition 1.0 2017-03
INTERNATIONAL
STANDARD
colour
inside
Printed electronics –
Part 502-1: Quality assessment – Organic light emitting diode (OLED) elements –

Mechanical stress testing of OLED elements formed on flexible substrates

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 29.035.01; 31.260 ISBN 978-2-8322-4078-6

– 2 – IEC 62899-502-1:2017 © IEC 2017
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
3.1 General terms . 8
3.2 Terms related to optical and electrical properties . 8
3.3 Terms related to mechanical stress test . 9
4 Standard atmospheric condition for measurements and tests . 9
5 Evaluation methods of optical and electrical properties . 9
5.1 General . 9
5.2 Sample preparation of OLED element(s) for optical and electrical
measurements . 9
5.3 IVL characteristics . 10
5.4 Luminous flux . 10
5.5 Luminance uniformity . 10
6 Mechanical stress test methods . 10
6.1 General . 10
6.2 Bending test . 10
6.2.1 General . 10
6.2.2 Testing apparatus . 10
6.2.3 Testing procedure . 10
6.2.4 Evaluation . 11
6.2.5 Testing conditions . 11
6.3 Rolling test. 12
6.3.1 General . 12
6.3.2 Testing apparatus . 12
6.3.3 Testing procedure . 12
6.3.4 Evaluation . 13
6.3.5 Testing conditions . 13
6.4 Torsion test . 14
6.4.1 General . 14
6.4.2 Testing apparatus . 14
6.4.3 Testing procedure . 14
6.4.4 Evaluation . 15
6.4.5 Testing conditions . 15
6.5 Tension test . 16
6.5.1 General . 16
6.5.2 Testing apparatus . 16
6.5.3 Testing procedure . 16
6.5.4 Evaluation . 16
6.5.5 Testing conditions . 16
7 Failure criteria . 17
Annex A (normative) Measurement methods of IVL characteristics . 18
A.1 General . 18
A.2 Measurement method . 18

A.2.1 General . 18
A.2.2 Measurement apparatus . 18
A.2.3 Measurement procedure . 18
A.2.4 Acceptance . 18
A.2.5 Items for relevant specification . 18
Annex B (normative) Measurement methods of luminous flux . 20
B.1 General . 20
B.2 Measurement method . 20
B.2.1 General . 20
B.2.2 Measurement apparatus . 20
B.2.3 Measurement procedure . 21
B.2.4 Acceptance . 22
B.2.5 Terms for additional definition . 22

Figure 1 – Apparatus for bending test . 12
Figure 2 – Apparatus for rolling test . 13
Figure 3 – Apparatus for torsion test . 15
Figure 4 – Example of sample alignment for torsion testing . 15
Figure 5 – Apparatus for tension test . 17
Figure A.1 – Layout of luminous measurement system . 19
Figure B.1 – Example of measurement apparatus for luminous flux using an integral
sphere . 21

– 4 – IEC 62899-502-1:2017 © IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PRINTED ELECTRONICS –
Part 502-1: Quality assessment – Organic light emitting diode (OLED)
elements – Mechanical stress testing of OLED elements
formed on flexible substrates
FOREWORD
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