iTeh StandardsiTeh Standards
EURUSD
Your shopping cart is empty.
SIST

SIST EN 60679-1:2002

(Main)

Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification

Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification

Specifies the methods of test and general requirements for quartz crystal controlled oscillators of assessed quality using either capability approval or qualification approval procedures.

Quarzoszillatoren mit bewerteter Qualität -- Teil 1: Fachgrundspezifikation

Oscillateurs pilotés par quartz sous assurance de la qualité -- Partie 1: Spécification générique

Spécifie les méthodes d'essai et les exigences générales pour les oscillateurs pilotés par quartz dont la qualité est garantie par les procédures d'agrément de savoir-faire ou par les procédures d'homologation.

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:1997)

General Information

Status
Withdrawn
Publication Date
31-Aug-2002
Withdrawal Date
06-Jun-2016
ICS
31.140 - Piezoelectric devices
Technical Committee
I11 - Imaginarni 11
Current Stage
9900 - Withdrawal (Adopted Project)
Start Date
07-Jun-2016
Due Date
30-Jun-2016
Completion Date
07-Jun-2016
Ref Project
EN 60679-1:1998 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

Relations

Amended By
SIST EN 60679-1:2002/A1:2003 - Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification
Effective Date
21-Sep-2010
Amended By
SIST EN 60679-1:2002/A2:2004 - Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification
Effective Date
21-Sep-2010
Replaced By
SIST EN 60679-1:2008 - Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification
Effective Date
06-May-2014
Amended By
SIST EN 60679-1:2002/A1:2003 - Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification
Effective Date
29-Jan-2023
Replaced By
SIST EN 60679-1:2008 - Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification
Effective Date
28-Jan-2023
Amended By
SIST EN 60679-1:2002/A2:2004 - Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification
Effective Date
29-Jan-2023
Amended By
SIST EN 60679-1:2002/A1:2003 - Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification
Effective Date
07-Jun-2022
Amended By
SIST EN 60679-1:2002/A2:2004 - Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification
Effective Date
07-Jun-2022
Replaced By
SIST EN 60679-1:2008 - Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification
Effective Date
01-Feb-2008
Revised
SIST EN 169000:2004 - Generic Specification: Quartz crystal controlled oscillators
Effective Date
03-Sep-2013
Revised
SIST EN 169000:2004/A1:2004 - Generic Specification: Quartz crystal controlled oscillator
Effective Date
03-Sep-2013
Replaces
SIST EN 169000:2004/A1:2004 - Generic Specification: Quartz crystal controlled oscillator
Effective Date
29-Jan-2023
Replaces
SIST EN 169000:2004 - Generic Specification: Quartz crystal controlled oscillators
Effective Date
29-Jan-2023
Replaces
SIST EN 169000:2004/A1:2004 - Generic Specification: Quartz crystal controlled oscillator
Effective Date
07-Jun-2022

Buy Standard

EN 60679-1:2002EN 60679-1:2002
PreviousNext
Standard
EN 60679-1:2002
English language
85 pages
sale 10% off
Preview
sale 10% off
Preview
e-Library read for
1 day

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 60679-1:2002
01-september-2002
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic
specification (IEC 60679-1:1997)
Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification
Quarzoszillatoren mit bewerteter Qualität -- Teil 1: Fachgrundspezifikation
Oscillateurs pilotés par quartz sous assurance de la qualité -- Partie 1: Spécification
générique
Ta slovenski standard je istoveten z: EN 60679-1:1998
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
SIST EN 60679-1:2002 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 2 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 3 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 4 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 5 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 6 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 7 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 8 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 9 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 10 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 11 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 12 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 13 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 14 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 15 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 16 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 17 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 18 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 19 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 20 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 21 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 22 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 23 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 24 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 25 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 26 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 27 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 28 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 29 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 30 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 31 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 32 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 33 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 34 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 35 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 36 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 37 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 38 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 39 ----------------------

SIST EN 60679-1:2002

---------------------- Page: 40 -------------
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.

This May Also Interest You

SIST
SIST EN IEC 62604-2:2022(Main)
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (IEC 62604-2:2022)
EN IEC 62604-2:2022

This part of IEC 62604 applies to duplexers which can separate receiving signals from
transmitting signals and are key components for two-way radio communications, and which are
generally used in mobile phone systems compliant with CDMA systems such as N-CDMA in
second generation mobile telecommunication systems (2G), W-CDMA / UMTS (3G) or LTE (4G).
These guidelines draw attention to some fundamental questions about the theory of SAW and
BAW duplexers and how to use them, which will be considered by the user before he places an
order for SAW and BAW duplexers for a new application. Such a procedure will be the user’s
insurance against unsatisfactory performance. Because SAW and BAW duplexers have very
similar performance for the usage, it is useful and convenient for users that both duplexers are
described in one standard.

  • Standard
    29 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN IEC 62604-1:2022(Main)
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (IEC 62604-1:2022)
EN IEC 62604-1:2022

This part of IEC 62604 specifies the methods of test and general requirements for SAW and
BAW duplexers of assessed quality using either capability approval or qualification approval
procedures.

  • Standard
    37 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN IEC 63041-1:2022(Main)
Piezoelectric sensors - Part 1: Generic specifications (IEC 63041-1:2021)
EN IEC 63041-1:2021

This part of IEC 63041 applies to piezoelectric sensors of resonator, delay-line and non acoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc.
The purpose of this document is to specify the terms and definitions for the piezoelectric sensors, and to make sure from a technological perspective that users understand the state-of-art piezoelectric sensors and how to use them correctly.

  • Standard
    33 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN IEC 60444-6:2021(Main)
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 60444-6:2021)
EN IEC 60444-6:2021

This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz
crystal units. Two test methods (A and C) and one referential method (B) are described. “Method
A”, based on the π-network according to IEC 60444-5, can be used in the complete frequency
range covered by this part of IEC 60444. “Reference Method B”, based on the π-network or
reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete
frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable
for measurements of fundamental mode crystal units in larger quantities with fixed conditions.
NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other
crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high
impedance test fixture).

  • Standard
    23 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN IEC 61837-2:2018/A1:2021(Amendment)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (IEC 61837-2:2018/A1:2020)
EN IEC 61837-2:2018/A1:2020
  • Amendment
    26 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN IEC 63041-3:2020(Main)
Piezoelectric sensors - Part 3: Physical sensors (IEC 63041-3:2020)
EN IEC 63041-3:2020

This part of IEC 63041 is applicable to piezoelectric physical sensors mainly used in the field
of process control, wireless monitoring, dynamics, thermodynamics, vacuum engineering, and
environmental sciences. This document provides users with technical guidelines as well as
basic knowledge of common physical sensors.
Piezoelectric sensors covered herein are those applied to the detection and measurement of
physical quantities such as force, pressure, torque, viscosity, temperature, film thickness,
acceleration, vibration, and tilt angle.

  • Standard
    16 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN IEC 63155:2020(Main)
Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications (IEC 63155:2020)
EN IEC 63155:2020

This document defines the measurement method for the determination of the durability of
radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices,
such as filters and duplexers, with respect to high power RF signals, which are used in
telecommunications, measuring equipment, radar systems and consumer products. RF BAW
devices include two types: those based on the film bulk acoustic resonator (FBAR) technology
and those based on the solidly mounted resonator (SMR) technology.
This document includes basic properties of failure of RF SAW/BAW devices, and guidelines to
set up the measurement system and to establish the procedure to estimate the time to failure
(TF). Since TF is mainly governed by the RF power applied in the devices, discussions are
focused on the power durability.
It is not the aim of this document to explain the theory, or to attempt to cover all the
eventualities which can arise in practical circumstances. This document draws attention to
some of the more fundamental questions which will need to be considered by the user before
he/she places an order for an RF SAW/BAW device for a new application. Such a procedure
will be the user's means of preventing unsatisfactory performance related to premature device
failure resulting from high-power exposure of RF SAW/BAW devices.

  • Standard
    23 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN IEC 62884-4:2019(Main)
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods (IEC 62884-4:2019)
EN IEC 62884-4:2019

This part of IEC 62884 describes the methods for the measurement and evaluation of the
short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its
purpose is to unify the test and evaluation methods for short-term frequency stability.

  • Standard
    23 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN IEC 60122-4:2019(Main)
Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (IEC 60122-4:2019)
EN IEC 60122-4:2019

This part of IEC 60122 is applicable to crystal units with thermistors mainly used in the field of
mobile communication that requires high frequency stability such as local reference signal
generator for the mobile phone base station or GPS. This document provides users with
technical guidelines of crystal units with thermistors as well as basic knowledge of common
crystal units with thermistors.

  • Standard
    17 pages
    English language
    sale 10% off
    e-Library read for
    1 day
SIST
SIST EN IEC 61837-2:2018(Main)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (IEC 61837-2:2018)
EN IEC 61837-2:2018

This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply
to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures,
and is based on IEC 61240:2016.

  • Standard
    102 pages
    English language
    sale 10% off
    e-Library read for
    1 day