EN 62431:2008

Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods

IEC 62431:2008(E) specifies the measurement methods for the reflectivity of electromagnetic wave absorbers (EMA) for the normal incident, oblique incident and each polarized wave in the millimetre-wave range. In addition, these methods are also equally effective for the reflectivity measurement of other materials: measurement frequency range: 30 GHz to 300 GHz; reflectivity: 0 dB to -50 dB; incident angle: 0° to 80°. It replaces and cancels IEC/PAS 62431 with corrections of obvious errors.

Verfahren zur Messung des Reflexionsvermögens von Absorbern für elektromagnetische Wellen im Millimeterwellen-Frequenzbereich

Réflectivité des absorbeurs d'ondes électromagnétiques dans la plage des fréquences millimétriques - Méthodes de mesure

La CEI 62431:2008 spécifie les méthodes de mesure de la réflectivité des absorbeurs d'ondes électromagnétiques (EMA: Electromagnetic Wave Absorber) pour une onde incidente normale, une onde incidente oblique et toute onde polarisée dans la plage des ondes millimétriques. En outre, ces méthodes sont aussi valables pour la mesure de réflectivité d'autres matériaux: - plage des fréquences de mesure: 30 GHz à 300 GHz; - réflectivité: 0 dB à -50 dB; - angle d'incidence: 0° à 80°. La norme CEI 62431 annule et remplace le IEC/PAS. La présente version bilingue correspond à la version anglaise monolingue publiée en 2008-07.

Merilne metode za odbojnost absorberjev milimetrskih elektromagnetnih valov (IEC 62431:2008)

General Information

• Status: Published
• Publication Date: 03-Dec-2008
• Withdrawal Date: 31-Oct-2011
• ICS: 17.020 - Metrology and measurement in general
• ICS: 19.080 - Electrical and electronic testing
• ICS: 29.120.10 - Conduits for electrical purposes
• Technical Committee: CLC/SR 46F - RF and microwave passive components
• Drafting Committee: IEC/SC 46F - IEC_SC_46F
• Parallel Committee: IEC/SC 46F - IEC_SC_46F
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 04-Dec-2008
• Completion Date: 04-Dec-2008
• Ref Project: SIST EN 62431:2009 - Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods (IEC 62431:2008)

Standards Content (Sample)

SLOVENSKI STANDARD
01-februar-2009
Merilne metode za odbojnost absorberjev milimetrskih elektromagnetnih valov
(IEC 62431:2008)
Reflectivity of electromagnetic wave absorbers in millimetre wave frequency -
Measurement methods (IEC 62431:2008)
Verfahren zur Messung des Reflexionsvermögens von Absorbern für elektromagnetische
Wellen im Millimeterwellen-Frequenzbereich (IEC 62431:2008)
Réflectivité des absorbeurs d'ondes électromagnétiques dans la plage des fréquences
millimétriques - Méthodes de mesure (CEI 62431:2008)
Ta slovenski standard je istoveten z: EN 62431:2008
ICS:
19.080 (OHNWULþQRLQHOHNWURQVNR Electrical and electronic
SUHVNXãDQMH testing
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 62431
NORME EUROPÉENNE
December 2008
EUROPÄISCHE NORM
ICS 19.080; 17.020; 29.120.10
English version
Reflectivity of electromagnetic wave absorbers
in millimetre wave frequency -
Measurement methods
(IEC 62431:2008)
Réflectivité des absorbeurs d'ondes Verfahren zur Messung
électromagnétiques dans la plage des Reflexionsvermögens von Absorbern
des fréquences millimétriques - für elektromagnetische Wellen
Méthodes de mesure im Millimeterwellen-Frequenzbereich
(CEI 62431:2008) (IEC 62431:2008)

This European Standard was approved by CENELEC on 2008-11-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels

© 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62431:2008 E
Foreword
The text of document 46F/65/CDV, future edition 1 of IEC 62431, prepared by SC 46F, R.F. and
microwave passive components, of IEC TC 46, Cables, wires, waveguides, R.F. connectors, R.F. and
microwave passive components and accessories, was submitted to the IEC-CENELEC Parallel Unique
Acceptance Procedure and was approved by CENELEC as EN 62431 on 2008-11-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2009-08-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2011-11-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 62431:2008 was approved by CENELEC as a European
Standard without any modification.
__________
– 3 – EN 62431:2008
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

1) 2)
ISO/IEC 17025 - General requirements for the competence EN ISO/IEC 17025 2005
of testing and calibration laboratories

1)
Undated reference.
2)
Valid edition at date of issue.

IEC 62431
Edition 1.0 2008-07
INTERNATIONAL
STANDARD
Reflectivity of electromagnetic wave absorbers in millimetre wave frequency –
Measurement methods
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
XA
ICS 19.080; 17.120; 29.120.10 ISBN 2-8318-9895-1
– 2 – 62431 © IEC:2008(E)
CONTENTS
FOREWORD.5
1 Scope.7
2 Normative references .7
3 Terms, definitions and acronyms .7
3.1 Terms and definitions .7
3.2 Acronyms and symbols.10
4 Specimen .12
4.1 Specimen specification.12
4.2 Reference metal plate .12
4.2.1 Material and thickness.12
4.2.2 Surface roughness .12
4.2.3 Flatness .12
4.2.4 Size and shape.12
4.3 Reference specimen for calibration .12
5 Specimen holder .13
6 Measurement equipment .13
6.1 Type of network analyzer .13
6.2 Antenna .13
6.2.1 Horn antenna.13
6.2.2 Lens antenna.13
6.3 Amplifier.13
6.4 Cable .14
7 Measurement condition .14
7.1 Temperature and environment.14
7.2 Warming up of measurement equipment.14
7.3 Electromagnetic environment .14
8 Calibration of measurement system and measurement conditions .14
8.1 Calibration of measurement system.14
8.2 Measurement conditions.14
8.2.1 Dynamic range .14
8.2.2 Setting up of the network analyzer for keeping adequate dynamic
range.14
9 Horn antenna method .15
9.1 Measurement system .15
9.1.1 Configuration of the measurement system .15
9.1.2 Horn antenna.16
9.1.3 Specimen holder.16
9.1.4 Mounting of the specimen.18
9.1.5 Antenna stand .18
9.2 Measurement conditions.18
9.2.1 Measurement environment .18
9.2.2 Measuring distance .18
9.2.3 Size of specimen .18
9.3 Measurement procedures .19
10 Dielectric lens antenna method – focused beam method .20
10.1 Outline .20

62431 © IEC:2008(E) – 3 –
10.2 Measurement system .20
10.2.1 Transmitting and receiving antennas .20
10.2.2 Focused beam horn antenna .21
10.2.3 Specimen size .22
10.2.4 Reference metal plate size .22
10.2.5 Specimen holder.22
10.2.6 Method of fixing the specimen and the reference metal plate.23
10.3 Measurement procedures .23
11 Dielectric lens antenna method – parallel beam method .25
11.1 Principle.25
11.1.1 Outline .25
11.1.2 Parallel EM wave beam formed using a EM wave lens.25
11.2 Measurement system .26
11.2.1 Composition of measurement system .26
11.2.2 Dielectric lens antenna .29
11.3 Specimen .29
11.3.1 General .29
11.3.2 Reference metal plate .29
11.3.3 Size of specimen .30
11.4 Measurement procedures .30
11.4.1 Normal incidence.30
11.4.2 Oblique Incidence.30
12 Test report.31
Annex A (informative) Reflection and scattering from metal plate – Horn antenna
method .33
Annex B (informative) Reflectivity of reference specimens using horn antenna method.38
Annex C (informative) Specifications of commercially available antennas .39
Annex D (normative) Calibration using VNA.42
Annex E (informative) Dynamic range and measurement errors .51
Annex F (informative) Enlargement of dynamic range – Calibration by isolation .53
Annex G (informative) Relative permittivity of styrofoam and foamed polyethylene
based on foam ratio .54
Annex H (informative) Calculation of Fraunhofer region – Horn antenna method.55

Figure 1 – Definition of reflectivity.
...