EN 62132-1:2006
(Main)Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
This part of IEC 62132 provides general information and definitions on measurement of conducted and radiated electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also provides a description of measurement conditions, test equipment and set-up, as well as the test procedures and content of the test reports. A test method comparison table is included in Annex A to assist in selecting the appropriate measurement method(s). This standard describes general conditions required to obtain a quantitative measure of immunity of ICs in a uniform testing environment. Critical parameters that are expected to influence the test results are described. Deviations from this standard are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the injected voltages and currents, together with the responses of the ICs tested at controlled conditions, yields information about the potential immunity of the IC to conducted and radiated RF disturbances in a given application.
Integrierte Schaltungen - Messung der elektromagnetischen Störfestigkeit im Frequenzbereich von 150 kHz bis 1 GHz - Teil 1: Allgemeine Bedingungen und Begriffe
Circuits intégrés - Mesure de l'immunité électromagnétique, 150 kHz à 1 GHz - Partie 1: Conditions générales et définitions
Cette partie de la CEI 62132 fournit des informations générales et des définitions sur la mesure de l'immunité électromagnétique conduite et rayonnée des circuits intégrés (CI) aux perturbations conduites et rayonnées. Elle fournit également une description des conditions de mesure, de l'équipement d'essai et du montage d'essai ainsi que les méthodes d'essai et le contenu des rapports d'essai. Un tableau de comparaison des méthodes d'essai est compris dans l'Annexe A pour aider à la sélection de la ou des méthodes de mesure appropriées. L'objet de cette norme est de décrire les conditions générales prescrites pour obtenir une mesure quantitative d'immunité des CI dans un environnement d'essais uniforme. Les paramètres critiques qui sont prévus pour influencer les résultats d'essai sont décrits. Les divergences par rapport à la présente norme sont notées explicitement dans le rapport d'essai individuel. Les résultats de mesure peuvent être utilisés en vue de comparaisons ou à d'autres fins. La mesure des tensions et courants injectés, ainsi que les réponses des CI essayés aux conditions contrôlées, fournissent des informations sur l'immunité potentielle du CI aux perturbations RF conduites et rayonnées dans une application donnée.
Integrirana vezja – Meritve elektromagnetne odpornosti od 150 kHz do 1 GHz – 1. del: Splošni pogoji in definicije (IEC 62132-1:2006)
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SLOVENSKI SIST EN 62132-1:2006
STANDARD
julij 2006
Integrirana vezja – Meritve elektromagnetne odpornosti od 150 kHz do 1 GHz –
1. del: Splošni pogoji in definicije (IEC 62132-1:2006)
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz -
Part 1: General conditions and definitions (IEC 62132-1:2006)
ICS 31.200; 33.100.20 Referenčna številka
© Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno
EUROPEAN STANDARD
EN 62132-1
NORME EUROPÉENNE
February 2006
EUROPÄISCHE NORM
ICS 31.200
English version
Integrated circuits -
Measurement of electromagnetic immunity, 150 kHz to 1 GHz
Part 1: General conditions and definitions
(IEC 62132-1:2006)
Circuits intégrés - Integrierte Schaltungen -
Mesure de l'immunité électromagnétique, Messung der elektromagnetischen
150 kHz à 1 GHz Störfestigkeit im Frequenzbereich
Partie 1: Conditions générales von 150 kHz bis 1 GHz
et définitions Teil 1: Allgemeine Bedingungen
(CEI 62132-1:2006) und Begriffe
(IEC 62132-1:2006)
This European Standard was approved by CENELEC on 2006-02-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania,
Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switzerland
and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62132-1:2006 E
Foreword
The text of document 47A/734/FDIS, future edition 1 of IEC 62132-1, prepared by SC 47A, Integrated
circuits, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was
approved by CENELEC as EN 62132-1 on 2006-02-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2006-11-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2009-02-01
This European Standard makes reference to International Standards. Where the International Standard
referred to has been endorsed as a European Standard or a home-grown European Standard exists, this
European Standard shall be applied instead. Pertinent information can be found on the CENELEC web
site.
__________
Endorsement notice
The text of the International Standard IEC 62132-1:2006 was approved by CENELEC as a European
Standard without any modification.
__________
NORME CEI
INTERNATIONALE
IEC
62132-1
INTERNATIONAL
Première édition
STANDARD
First edition
2006-01
Circuits intégrés –
Mesure de l'immunité électromagnétique,
150 kHz à 1 GHz –
Partie 1:
Conditions générales et définitions
Integrated circuits –
Measurement of electromagnetic
immunity, 150 kHz to 1 GHz –
Part 1:
General conditions and definitions
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Pour prix, voir catalogue en vigueur
For price, see current catalogue
62132-1 IEC:2006 – 3 –
CONTENTS
FOREWORD.7
1 Scope and object.11
2 Normative references .11
3 Terms and definitions .13
4 Test conditions .19
4.1 General .19
4.2 Ambient conditions .19
4.3 Test generator.21
4.4 Frequency range .21
5 Test equipment.21
5.1 General .21
5.2 Shielding .21
5.3 Test generator and power amplifier .21
5.4 Other components .21
6 Test set-up .23
6.1 General .23
6.2 Test circuit board .23
6.3 Pin selection scheme .23
6.4 IC pin loading/termination.23
6.5 Power supply requirements .25
6.6 IC specific considerations.25
6.7 IC stability over time.27
7 Test procedure .27
7.1 Monitoring check .27
7.2 Human exposure .27
7.3 System verification .27
7.4 Specific procedures.29
8 Test report.31
8.1 General .31
8.2 Immunity limits or levels .33
8.3 Performance classes .33
8.4 Interpretation of results .33
Annex A (informative) Test method comparison table.35
Annex B (informative) General test board specification .37
Bibliography.45
62132-1 IEC:2006 – 5 –
Figure 1 – RF signal when RF peak power level is maintained .31
Figure B.1 – Example of an immunity test board .43
Table 1 – IC pin loading recommendations .25
Table 2 – Frequency step size versus frequency range.29
Table A.1 – Test method comparison table .35
Table B.1 – Position of vias over the board.37
62132-1 IEC:2006 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
INTEGRATED CIRCUITS –
MEASUREMENT OF ELECTROMAGNETIC IMMUNITY,
150 kHz TO 1 GHz –
Part 1: General conditions and definitions
FOREWORD
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International Standard IEC 62132-1 has been prepared by subcommittee 47A: Integrated
circuits, of IEC technical committee 47: Semiconductor devices.
The text of this standard is based on the following documents:
FDIS Report on voting
47A/734/FDIS 47A/742/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
62132-1 IEC:2006 – 9 –
IEC 62132 consists of the following parts, under the general title Integrated circuits –
Measurement of electromagnetic immunity, 150 kHz to 1 GHz:
Part 1: General conditions and definitions
Part 2: (G-) TEM cell method
Part 3: Bulk current injection (BCI) method
Part 4: Direct RF power injection method
Part 5: Workbench Faraday cage method
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the spec
...
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