IEC 62396-3:2013

Process management for avionics - Atmospheric radiation effects - Part 3: System design optimization to accommodate the single event effects (SEE) of atmospheric radiation

IEC 62396-3:2013(E) provides guidance and furthermore it provides necessary requirements for those involved in the design of avionic systems and equipment and the resultant effects of atmospheric radiation-induced single event effects (SEE) on those avionic systems. The outputs of the activities and objectives described in this part of IEC 62396 will become inputs to higher level certification activities and required evidences. It builds on the initial guidance on the system level approach to single event effects in IEC 62396-1:2012, considers some avionic systems and provides basic methods to accommodate SEE so that system development assurance levels are met.

General Information

• Status: Published
• Publication Date: 24-Sep-2013
• ICS: 03.100.50 - Production. Production management
• ICS: 31.020 - Electronic components in general
• ICS: 31.200 - Integrated circuits. Microelectronics
• ICS: 49.060 - Aerospace electric equipment and systems
• Technical Committee: TC 107 - Process management for avionics
• Current Stage: PPUB - Publication issued
• Start Date: 30-Sep-2013
• Completion Date: 25-Sep-2013

Relations

• Replaces: IEC TS 62396-3:2008 - Process management for avionics - Atmospheric radiation effects - Part 3: Optimising system design to accommodate the single event effects (SEE) of atmospheric radiation
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 62396-3 ®
Edition 1.0 2013-09
INTERNATIONAL
STANDARD
Process management for avionics – Atmospheric radiation effects –
Part 3: System design optimization to accommodate the single event effects
(SEE) of atmospheric radiation
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IEC 62396-3 ®
Edition 1.0 2013-09
INTERNATIONAL
STANDARD
Process management for avionics – Atmospheric radiation effects –

Part 3: System design optimization to accommodate the single event effects

(SEE) of atmospheric radiation

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
U
ICS 03.100.50; 31.020; 49.060 ISBN 978-2-8322-1095-6

– 2 – 62396-3 © IEC:2013(E)
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Process guidance . 10
5 Atmospheric radiation and electronic system faults . 11
5.1 Atmospheric radiation effects on avionics . 11
5.2 Hard faults . 12
5.3 Soft faults . 13
6 Aircraft safety assessment . 13
6.1 Methodology . 13
6.2 Mitigation . 14
6.3 Specific electronic systems . 14
6.3.1 Level A systems . 14
6.3.2 Level B systems . 17
6.3.3 Level C systems . 18
6.3.4 Levels D and E systems . 18
Annex A (informative) Design process flow diagram for SEE rates . 19
Annex B (informative) Some mitigation method considerations for SEEs . 20
Annex C (informative) Example systems . 24
Bibliography . 28

Figure C.1 – Electronic equipment (flight control computers). 24
Figure C.2 – Electronic equipment (flight director computers) . 25
Figure C.3 – Electronic equipment (engine control) . 26
Figure C.4 – Electronically powered surface . 26
Figure C.5 – Hydro mechanical drive of surface – Electronic valve control . 27

Table 1 – Failure effect and occurrence probability . 14

62396-3 © IEC:2013(E) – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PROCESS MANAGEMENT FOR AVIONICS –
ATMOSPHERIC RADIATION EFFECTS –

Part 3: System design optimization to accommodate
the single event effects (SEE) of atmospheric radiation

FOREWORD
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all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62396-3 has been prepared by IEC technical committee 107:
Process management for avionics.
This first edition cancels and replaces IEC/TS 62396-3 published in 2008. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) Reference to IEC 62396-1:2012 included.
b) Some definitions in Clause 3 updated in line with IEC 62396-1:2012.
c) Reference to system level A types I and II removed from 6.3 and Annex C.
d) Replacement in key locations of “may” by a more positive statement.

– 4 – 62396-3 © IEC:2013(E)
The text of this international standard is based on the following documents:
FDIS Report on voting
107/210/FDIS 107/220/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 62396 series, under the general title Process management for
avionics – Atmospheric radiation effects, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

62396-3 © IEC:2013(E) – 5 –
INTRODUCTION
This industry-wide International Standard provides additional guidance to avionics systems
designers, electronic equipment, component manufacturers and their customers to adopt a
standard approach to optimise system design to accommodate atmospheric radiation single
event effects (SEE). It builds on the information and guidance on the system level approach to
single event effects in IEC 62396-1:2012, considers some avionic systems and provides basic
methods to accommodate SEE so that system hardware assurance levels are met.
Atmospheric radiation effects are one factor that could contribute to equipment hard and soft
fault rates. From a system safety perspective, using derived fault rate values, the existing
methodology described in ARP4754 [1] (accommodation of hard and soft fault rates in
general) will also accommodate atmospheric radiation effect rates.
___________
Numbers in square brackets refer to the Bibliography.

– 6 – 62396-3 © IEC:2013(E)
PROCESS MANAGEMENT FOR AVIONICS –
ATMOSPHERIC RADIATION EFFECTS –

Part 3: System design optimization to accommodate
the single event effects (SEE) of atmospheric radiation

1 Scope
This part of IEC 62396 provides guidance and furthermore it provides necessary requirements
for those involved in the design of avionic systems and equipment and the resultant effects of
atmospheric radiation-induced single event effects (SEE) on those avionic systems. The
outputs of the activities and objectives described in this part of IEC 62396 will become inputs
to higher level certification activities and required evidences. It builds on the initial guidance
on the system level approach to single event effects in IEC 62396-1:2012, considers some
avionic systems and provides basic methods to accommodate SEE so that system
development assurance levels are met.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 62396-1:2012, Process management for avionics – Atmospheric radiation effects – Part 1:
Accommodation of atmospheric radiation effects via single event effects within avionics
electronic equipment
IEC/TS 62239-1, Process management for avionics – Management plan – Part 1: Preparation
and maintenance of an electronic components management plan
3 Terms and definitions
For the purposes of this document, the terms and definitions of IEC 62396-1:2012,
IEC/TS 62239-1 as well as the following apply.
3.1
analogue single event transient
ASET
spurious signal or voltage produced at the output of an analogue device by the deposition of
charge by a single particle
[SOURCE: IEC 62396-1:2012, 3.2]
3.2
could not duplicate
CND
reporte
...