IEC 61163-1:1995/COR1:1999

Corrigendum 1 - Reliability stress screening - Part 1: Repairable items manufactured in lots

Corrigendum 1 - Déverminage sous contraintes - Partie 1: Entités réparables fabriquées en lots

General Information

• Status: Published
• Publication Date: 21-Dec-1999
• Technical Committee: TC 56 - Dependability
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 26-Jun-2006

Relations

• Revised: IEC 61163-1:2006 - Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
• Effective Date: 05-Sep-2023

Standards Content (Sample)

Publication 61163-1 de la CEI IEC Publication 61163-1

(Première édition – 1995) (First edition – 1995)

Déverminage sous contraintes – Reliability stress screening –

Partie 1: Entités réparables fabriquées en lots Part 1: Repairable items manufactured in lots

CORRIGENDUM 1
Page 44 Page 45
7.2 Evaluation des renseignements obtenus 7.2 Evaluation of information
Remplacer l’équation (3) existante par la nouvelle Replace the existing equation (3) by the following
équation suivante: new equation:
N N
p = 1 – 1 − p p = 1 – 1 − p
c c
s s
Page 88
Page 89
Correction en anglais uniquement. Annex F
Replace, on page 93, in the line under the first dis-
played equation, the symbol t b
...