SIST-TS ES 59008-4-1:2007
(Main)Data requirements for semiconductor die -- Part 4-1: Specific requirements and recommendations - Test and quality
Data requirements for semiconductor die -- Part 4-1: Specific requirements and recommendations - Test and quality
Specifies requirements for the exchange of data pertaining to bare semiconductor die, with or without connection structures,and minimally packaged semiconductor die. This specificaton also gives recommendations for general industry good practice in the use of bare die, with or without connection structures, and minimally packaged die.
Zahtevani podatki za polprevodniška integrirana vezja - 4-1. del: Specifične zahteve in priporočila - Preskus in kakovost
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Standards Content (Sample)
SLOVENSKI STANDARD
SIST-TS ES 59008-4-1:2007
01-januar-2007
=DKWHYDQLSRGDWNL]DSROSUHYRGQLãNDLQWHJULUDQDYH]MDGHO 6SHFLILþQH
]DKWHYHLQSULSRURþLOD3UHVNXVLQNDNRYRVW
Data requirements for semiconductor die -- Part 4-1: Specific requirements and
recommendations - Test and quality
Ta slovenski standard je istoveten z: ES 59008-4-1:2000
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
SIST-TS ES 59008-4-1:2007 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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