EN ISO 13696:2002
(Main)Optics and optical instruments - Test methods for radiation scattered by optical components (ISO 13696:2002)
Optics and optical instruments - Test methods for radiation scattered by optical components (ISO 13696:2002)
ISO 13696:2002 specifies procedures for the determination of the total scattering by coated and uncoated optical surfaces. Procedures are given for measuring the contributions of the forward scattering and backward scattering to the total scattering of an optical component.
ISO 13696:2002 applies to coated and uncoated optical components with optical surfaces that have a radius of curvature of more than 10 m. The wavelength range includes the ultraviolet, the visible and the infrared spectral regions.
Optik und optische Instrumente - Bestimmung von Streustrahlung, hervorgerufen durch optische Komponenten (ISO 13696:2002)
Diese Europäische Norm legt ein Prüfverfahren für die Bestimmung der Gesamtstreuung von beschichteten und unbeschichteten optischen Oberflächen fest. Verfahren zur Messung der Beiträge der Vorwärts- und Rückwärtsstreuung zur Gesamtstreuung von optischen Komponenten werden angegeben.
Diese Europäische Norm bezieht sich auf beschichtete und unbeschichtete optische Komponenten mit optischen Oberflächen, die einen Krümmungsradius von mehr als 10 m besitzen. Der Wellenlängenbereich erstreckt sich vom ultravioletten über den sichtbaren bis zum infraroten Spektralbereich.
Optique et instruments d'optique - Méthodes d'essai du rayonnement diffusé par les composants optiques (ISO 13696:2002)
L'ISO 13696:2002 définit les méthodes de détermination de la diffusion totale par des surfaces optiques revêtues et non revêtues. Des procédures sont indiquées pour mesurer les contributions de la prodiffusion et de la rétrodiffusion à la diffusion totale d'un composant optique.
L'ISO 13696:2002 s'applique aux composants optiques revêtus et non revêtus dont les surfaces optiques ont un rayon de courbure supérieur à 10 m. La gamme de longueurs d'onde inclut les régions spectrales ultraviolette, visible et infrarouge.
Optika in optični instrumenti - Preskusne metode za sevanje, razpršeno z optičnimi komponentami (ISO 13696:2002)
General Information
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Standards Content (Sample)
SLOVENSKI STANDARD
01-november-2002
2SWLNDLQRSWLþQLLQVWUXPHQWL3UHVNXVQHPHWRGH]DVHYDQMHUD]SUãHQR]
RSWLþQLPLNRPSRQHQWDPL ,62
Optics and optical instruments - Test methods for radiation scattered by optical
components (ISO 13696:2002)
Optik und optische Instrumente - Bestimmung von Streustrahlung, hervorgerufen durch
optische Komponenten (ISO 13696:2002)
Optique et instruments d'optique - Méthodes d'essai du rayonnement diffusé par les
composants optiques (ISO 13696:2002)
Ta slovenski standard je istoveten z: EN ISO 13696:2002
ICS:
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD
EN ISO 13696
NORME EUROPÉENNE
EUROPÄISCHE NORM
July 2002
ICS 37.020
English version
Optics and optical instruments - Test methods for radiation
scattered by optical components (ISO 13696:2002)
Optique et instruments d'optique - Méthodes d'essai du Optik und optische Instrumente - Bestimmung von
rayonnement diffusé par les composants optiques (ISO Streustrahlung hervorgerufen durch optische Komponenten
13696:2002) (ISO 13696:2002)
This European Standard was approved by CEN on 8 June 2002.
CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national
standards may be obtained on application to the Management Centre or to any CEN member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CEN member into its own language and notified to the Management Centre has the same status as the official
versions.
CEN members are the national standards bodies of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece,
Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION
EUROPÄISCHES KOMITEE FÜR NORMUNG
Management Centre: rue de Stassart, 36 B-1050 Brussels
© 2002 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN ISO 13696:2002 E
worldwide for CEN national Members.
CORRECTED 2002-09-25
Foreword
This document (ISO 13696:2002) has been prepared by Technical Committee ISO/TC 172
"Optics and optical instruments" in collaboration with Technical Committee CEN/TC 123
"Lasers and laser-related equipment", the secretariat of which is held by DIN.
This European Standard shall be given the status of a national standard, either by publication
of an identical text or by endorsement, at the latest by January 2003, and conflicting national
standards shall be withdrawn at the latest by January 2003.
According to the CEN/CENELEC Internal Regulations, the national standards organizations of
the following countries are bound to implement this European Standard: Austria, Belgium,
Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy,
Luxembourg, Malta, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and the
United Kingdom.
Endorsement notice
The text of ISO 13696:2002 has been approved by CEN as EN ISO 13696:2002 without any
modifications.
NOTE Normative references to International Standards are listed in Annex ZA (normative).
Annex ZA
(normative)
Normative references to international publications
with their relevant European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions
of any of these publications apply to this European Standard only when incorporated in it by
amendment or revision. For undated references the latest edition of the publication referred to
applies (including amendments).
NOTE Where an International Publication has been modified by common modifications,
indicated by (mod.), the relevant EN/HD applies.
Publication Year Title EN Year
ISO 12005 1999 Lasers and laser-related equipment - EN ISO 12005 1999
Test methods for laser beam parameters
- Polarization
ISO 14644-1 1999 Cleanrooms and associated controlled EN ISO 14644-1 1999
environments - Part 1: Classification of
air cleanliness
INTERNATIONAL ISO
STANDARD 13696
First edition
2002-07-15
Corrected version
2004-08-01
Optics and optical instruments — Test
methods for radiation scattered by optical
components
Optique et instruments d'optique — Méthodes d'essai du rayonnement
diffusé par les composants optiques
Reference number
ISO 13696:2002(E)
©
ISO 2002
ISO 13696:2002(E)
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ii © ISO 2002 – All rights reserved
ISO 13696:2002(E)
Contents Page
Foreword . iv
Introduction. v
1 Scope. 1
2 Normative references. 1
3 Terms, definitions and symbols . 1
3.1 Terms and definitions. 1
3.2 Symbols and units . 3
4 Test method . 3
4.1 Principle . 3
4.2 Measurement arrangement and test equipment . 3
4.3 Arrangement with high sensitivity . 6
4.4 Preparation of specimens . 6
5 Procedure. 7
5.1 General . 7
5.2 Alignment procedure . 7
5.3 Measurement procedure. 8
6 Evaluation . 8
6.1 Determination of the total scattering value . 8
6.2 Error budget. 11
7 Test report. 11
Annex A (informative) Set-up with a Coblentz sphere . 13
Annex B (informative) Example of test report. 15
Annex C (informative) Statistical evaluation example . 19
Annex D (informative) Example for selection of spacing . 23
Bibliography. 26
ISO 13696:2002(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO
member bodies). The work of preparing International Standards is normally carried out through ISO technical
committees. Each member body interested in a subject for which a technical committee has been established has
the right to be represented on that committee. International organizations, governmental and non-governmental, in
liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical
Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 3.
Draft International Standards adopted by the technical committees are circulated to the member bodies for voting.
Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights.
International Standard ISO 13696 was prepared by Technical Committee ISO/TC 172, Optics and photonics,
Subcommittee SC 9, Electro-optical systems.
Annexes A to D of this International Standard are for information only.
In this corrected version of ISO 13696:2002, the following changes have been incorporated:
N
Vr()-(τV )
s,for i s u
page 10, equation (5) reads S =
for Â
NV ()r -V
cui
i=1
N
Vr()-+(1 r )V
s,bac i s u
equation (6) reads S =
bac Â
NV ()r -V
cui
i=1
Vr()-(tV )
s,for i s u
equation (7) reads Sr() =
for i
VV-
cu
Vr()-+(1 r )V
s,bac i s u
page 11, equation (8) reads Sr() =
bac i
VV-
cu
N
page 19, equation (C2) reads =-Sr()
s  M
()s
s i
bac,sc
N -1
i = 1
page 26, the year of publication of ISO 12005 has been inserted.
iv © ISO 2002 – All rights reserved
ISO 13696:2002(E)
Introduction
In most applications, scattering in optical components reduces the efficiency and deteriorates the image-forming
quality of optical systems. Scattering is predominantly produced by imperfections of the coatings and the optical
surfaces of the components. Common surface features which contribute to optical scattering are imperfections of
substrates, thin films and interfaces, surface and interface roughness, or contamination and scratches. These
imperfections deflect a fraction of the incident radiation from the specular path. The spatial distribution of this
scattered radiation is dependent on the wavelength of the incident radiation and on the individual optical properties
of the component. For most applications in laser technology and optics, the amount of total loss produced by
scattering is a useful quality criterion of an optical component.
This International Standard describes a testing procedure for the corresponding quantity, the total scattering (TS)
value, which is defined by the measured values of backward scattering and forward scattering. The measurement
principle described in this International Standard is based on an Ulbricht sphere as the integrating element for
scattered radiation. An alternative apparatus with a Coblentz hemisphere, which is also frequently employed for
collecting scattered light, is described in annex A. Currently, advanced studies on the comparability and
the limitations of both light collecting elements are being performed (e.g. round r
...
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