Geometrical product specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments (ISO 3274:1996)

Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.

Geometrische Produktspezifikationen (GPS) - Oberflächenbeschaffenheit: Tastschnittverfahren - Nenneigenschaften von Tastschnittgeräten (ISO 3274:1996)

Diese Internationale Norm definiert Profile und den allgemeinen Aufbau von Tastschnittgeräten zum Messen der Oberflächenrauheit und Welligkeit, um die existierenden Normen für die praktische Profilauswertung anwenden zu können. Sie legt Eigenschaften der Meßgeräte fest, die Profilauswertung beeinflussen und sie beschreibt die grundlegenden Eigenschaften von Tastschnittgeräten (Meßgeräte und Profilausgabegeräte).

Spécification géométrique des produits (GPS) - Etat de surface: Méthode du profil - Caractéristiques nominales des appareils à contact (palpeur) (ISO 3274:1996)

La présente Norme internationale définit les différents profils et la structure générale des appareils à contact (palpeur) utilisés pour mesurer la rugosité et l'ondulation de surface, permettant ainsi d'appliquer les Normes internationales existantes à l'évaluation pratique des profils. Elle prescrit les caractéristiques des appareils qui influencent l'évaluation du profil et fournit un cadre de spécifications des appareils à contact (palpeur) (profilomètres et enregistreurs de profil). NOTES1 Une fiche technique présentant les caractéristiques des appareils à contact (palpeur), à remplir par le fabricant, est en cours de préparation. Elle fera l'objet d'une Norme internationale ultérieure sur les procédures d'étalonnage.2 Les relations entre la longueur d'onde de coupure d'ondulation λf, le rayon de pointe et le rapport des longueurs de coupure d'ondulation sont à l'étude et feront l'objet d'un amendement à la présente Norme internationale.

Geometrical product specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments (ISO 3274:1996)

General Information

Status
Published
Publication Date
18-Nov-1997
Current Stage
9093 - Decision to confirm - Review Enquiry
Start Date
10-Jul-2008
Completion Date
10-Jul-2008

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SLOVENSKI STANDARD
SIST EN ISO 3274:2000
01-december-2000
Geometrical product specifications (GPS) - Surface texture: Profile method -
Nominal characteristics of contact (stylus) instruments (ISO 3274:1996)
Geometrical product specifications (GPS) - Surface texture: Profile method - Nominal
characteristics of contact (stylus) instruments (ISO 3274:1996)
Geometrische Produktspezifikationen (GPS) - Oberflächenbeschaffenheit:
Tastschnittverfahren - Nenneigenschaften von Tastschnittgeräten (ISO 3274:1996)
Spécification géométrique des produits (GPS) - Etat de surface: Méthode du profil -
Caractéristiques nominales des appareils a contact (palpeur) (ISO 3274:1996)
Ta slovenski standard je istoveten z: EN ISO 3274:1997
ICS:
17.040.30 Merila Measuring instruments
SIST EN ISO 3274:2000 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN ISO 3274:2000

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SIST EN ISO 3274:2000

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SIST EN ISO 3274:2000

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SIST EN ISO 3274:2000

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SIST EN ISO 3274:2000

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SIST EN ISO 3274:2000
INTERNATIONAL IS0
STANDARD 3274
Second edition
1996-12-01
Geometrical Product Specifications
(GPS) - Surface texture: Profile method -
Nominal characteristics of contact (stylus)
instruments
Spbcification gbom&-ique des produits (GPS) - &at de surface: Mbthode
du profil- Caractkristiques nom&ales des appareils ;i contact (palpeur)
Reference number
IS0 32749 996(E)

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SIST EN ISO 3274:2000
IS0 3274:1996(E)
Page
Contents
.............................................................. . . . ......
1 Scope
..................................... . . . ......
2 Normative references
....................................................... . . * ......
3 Definitions
. . . .
4 Nominal values for instrument characteristics
Annexes
9
A Instruments conforming to IS0 3274: 1975 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
B Background for the improvements introduced in this
IO
International Standard . . . . . . . . . . . . . . . . . . . . . . . . . . .-. s . . . . . . . . . . . . . . .-.
12
C Relation to the GPS matrix model . . . . . . . . . . . . . . . , . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I3
D Bibliography . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
0 IS0 1996
All rights reserved. No part of this publication may be reproduced or utilized in any form or
by any means, electronical or mechanical, including photocopyrng and microfiim, without
permissron in writrng from the publisher.
International Organization for Standardization
Case postale 56 l CH-1211 Geneve 20 l Switzerland
Printed in Switzerland
II

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SIST EN ISO 3274:2000
IS0 3274:1996(E)
@ IS0
Foreword
IS0 (the International Organization for Standardization) is a worldwide
federation of national standards bodies (IS0 member bodies). The work of
preparing International Standards is normally carried out through IS0
technical committees. Each member body interested in a subject for
which a technical committee has been established has the right to be
represented on that committee. International organizations, governmental
and non-governmental, in liaison with ISO, also take part in the work. IS0
collaborates closely with the International Electrotechnical Commission
(IEC) on all matters of electrotechnical standardization.
Draft International Standards adopted by the technical committees are
circulated to the member bodies for voting. Publication as an International
Standard requires approval by at least 75 % of the member bodies casting
a vote.
International Standard IS0 3274 was prepared jointly by Technical Com-
mittees lSO/TC 57, Metrology and properties of surfaces, Subcommittee
SC I, Geometrical parameters - Instruments and procedures for
measurement of surface roughness and waviness, lSO/TC 3, Limits and
fits, and lSO/TC 10, Technical drawings, product definition and related
documentation, Subcommittee SC 5, Dimensioning and tolerancing.
This second edition of IS0 3274 cancels and replaces the first edition
(IS0 3274:1975) as well as IS0 1880:1979, which have been technically
revised.
In particular it takes into account the nominal characteristics of contact
(stylus) instruments and their technical development. Modern instruments
use phase-correct filters according to IS0 11562.
Annexes A, B, C and D of this International Standard are fo
...

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