prEN IEC 62007-2:2024
(Main)Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
Optoelektronische Halbleiterbauelemente für Anwendungen in Lichtwellenleitersystemen - Teil 2: Messverfahren
Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes fibroniques - Partie 2: Méthodes de mesure
Polprevodniške optoelektronske naprave za uporabo v sistemih z optičnimi vlakni - 2. del: Merilne metode
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Standards Content (Sample)
SLOVENSKI STANDARD
01-februar-2024
Polprevodniške optoelektronske naprave za uporabo v sistemih z optičnimi vlakni
- 2. del: Merilne metode
Semiconductor optoelectronic devices for fibre optic system applications - Part 2:
Measuring methods
Optoelektronische Halbleiterbauelemente für Anwendungen in Lichtwellenleitersystemen
- Teil 2: Messverfahren
Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes
fibroniques - Partie 2: Méthodes de mesure
Ta slovenski standard je istoveten z: prEN IEC 62007-2:2023
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
33.180.01 Sistemi z optičnimi vlakni na Fibre optic systems in
splošno general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
86C/1895/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 62007-2 ED3
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2023-12-08 2024-03-01
SUPERSEDES DOCUMENTS:
86C/1881/CD, 86C/1892/CC
IEC SC 86C : FIBRE OPTIC SYSTEMS AND ACTIVE DEVICES
SECRETARIAT: SECRETARY:
United States of America Mr Fred Heismann
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
Other TC/SCs are requested to indicate their interest, if
any, in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
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Attention IEC-CENELEC parallel voting
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CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
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Countries” clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is
the final stage for submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).
TITLE:
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring
methods
PROPOSED STABILITY DATE: 2027
NOTE FROM TC/SC OFFICERS:
download this electronic file, to make a copy and to print out the content for the sole purpose of preparing National
Committee positions. You may not copy or "mirror" the file or printed version of the document, or any part of it, for
any other purpose without permission in writing from IEC.
IEC CDV 62007-2/Ed3 © IEC:2023 – 2 – 86C/1895/CDV
1 CONTENTS
3 FOREWORD . 4
4 INTRODUCTION . 6
5 1 Scope . 7
6 2 Normative references . 7
7 3 Terms, definitions, and abbreviated terms . 7
8 3.1 Terms and definitions. 7
9 3.2 Abbreviated terms . 7
10 4 Measuring methods for photoemitters . 8
11 4.1 Outline of the measuring methods . 8
12 4.2 Radiant power and forward current of LEDs and LDs with or without optical
13 fibre pigtails . 8
14 4.3 Small signal cut-off frequency f of LEDs and LDs with or without optical
c
15 fibre pigtails . 9
16 4.4 Threshold current of LDs with or without optical fibre pigtails . 11
17 4.5 Relative intensity noise of LEDs and LDs with or without optical fibre pigtails . 12
18 4.6 S parameter of LEDs, LDs, and LD modules with or without optical fibre
19 pigtails . 13
20 4.7 Tracking error for LD modules with optical fibre pigtails, with or without
21 cooler . 15
22 4.8 Spectral linewidth of LDs with or without optical fibre pigtails . 17
23 4.9 Modulation current at 1 dB efficacy compression of LEDs . 19
24 4.10 Differential efficiency of an LD module or an LD with or without pigtail . 21
25 4.11 Differential (forward) resistance r of an LD with or without pigtail . 22
d
26 5 Measuring methods for receivers . 23
27 5.1 Outline of the measuring methods . 23
28 5.2 Noise of a PIN photodiode . 24
29 5.3 Excess noise factor of an APD with or without optical fibre pigtails . 25
30 5.4 Small-signal cut-off frequency of a photodiode with or without optical fibre
31 pigtails . 27
32 5.5 Multiplication factor of an APD with or without an optical fibre pigtail . 28
33 5.6 Responsivity of a PIN-TIA module . 30
34 5.7 Frequency response flatness (S/S) of a PIN-TIA module . 32
35 5.8 Output noise power (spectral) density P of a PIN-TIA module . 33
no,
36 5.9 Low frequency output noise power (spectral) density (P ) and corner
no,,LF
37 frequency (f ) of a PIN-TIA module . 35
cor
38 5.10 Minimum detectable power of PIN-TIA module . 37
39 Bibliography . 39
41 Figure 1 – Equipment setup for measuring radiant power and forward current of LEDs
42 or LDs . 9
43 Figure 2 – Circuit diagram for measuring the small-signal cut-off frequency of LEDs or
44 LDs 10
45 Figure 3 – Circuit diagram for measuring threshold current of LDs . 11
46 Figure 4 – Graph to determine threshold current of LDs . 12
IEC CDV 62007-2/Ed3 © IEC:2023 – 3 – 86C/1895/CDV
47 Figure 5 – Circuit diagram for measuring RIN of LEDs or LDs . 12
48 Figure 6 – Circuit diagram for measuring the S parameter of LEDs, LDs, or LD
49 modules . 14
50 Figure 7– Circuit diagrams for LDs with cathode or anode connected to package . 16
51 Figure 8 – Output radiant power versus time . 17
52 Figure 9 – Output radiant power versus case temperature . 17
53 Figure 10 – Equipment setup for measuring the spectral linewidth of LDs . 18
54 Figure 11 – Circuit diagram for measuring 1-dB efficacy compression of LEDs . 19
55 Figure 12 – Plot of 20×log(V ) versus 20×log(I ) . 20
2 1
56 Figure 13 – Circuit diagram for measuring differential efficiency of LDs . 21
57 Figure 14 – Current waveform for differential efficiency measurement . 21
58 Figure 15 – Circuit diagram for measuring differential resistance of LDs . 22
59 Figure 16 – Current waveform for differential resistance . 23
60 Figure 17 – Circuit diagram for measuring noise of a PIN photoreceiver . 24
61 Figure 18 – Circuit diagram for measuring noise with synchronous detection . 25
62 Figure 19 – Circuit diagram for measuring excess noise of an APD . 26
63 Figure 20 – Circuit diagram for measuring small-signal cut-off wavelength of a
64 photodiode . 28
65 Figure 21 – Circuit diagram for measuring multiplication factor of an APD . 29
66 Figure 22 – Graph showing measurement of I and I . 30
R1 R2
67 Figure 23 – Circuit diagram for measuring responsivity of a PIN-TIA module . 31
68 Figure 24 – Circuit diagram for measuring frequency response flatness of a PIN-TIA
69 module. 32
70 Figure 25 – Circuit diagram for measuring output noise power (spectral) density of a
71 PIN-TIA module under matched output conditions . 34
72 Figure 26 – Circuit diagram for measuring output noise power (spectral) density of a
73 non-irradiated PIN-TIA module in the low frequency region . 35
74 Figure 27 – Graph of V versus frequency . 37
m
75 Figure 28 – Circuit diagram for measuring minimum detectable power of a PIN-TIA
76 module. 38
IEC CDV 62007-2/Ed3 © IEC:2023 – 4 – 86C/1895/CDV
80 INTERNATIONAL ELECTROTECHNICAL COMMISSION
81 ____________
83 SEMICONDUCTOR OPTOELECTRONIC DEVICES
84 FOR FIBRE OPTIC SYSTEM APPLICATIONS –
86 Part 2: Measuring methods
89 FOREWORD
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118 8) Attention is drawn to the Normative
...
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