IEC 62624:2009
(Main)Test methods for measurement of electrical properties of carbon nanotubes
Test methods for measurement of electrical properties of carbon nanotubes
IEC 62624:2009(E) (IEEE 1650:2005) provides methods for the electrical characterization of carbon nanotubes (CNTs). The methods will be independent of processing routes used to fabricate the CNTs.
General Information
Standards Content (Sample)
IEC 62624
Edition 1.0 2009-08
™
IEEE Std 1650
INTERNATIONAL
STANDARD
Test methods for measurement of electrical properties of carbon nanotubes
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IEC 62624
Edition 1.0 2009-08
™
IEEE Std 1650
INTERNATIONAL
STANDARD
Test methods for measurement of electrical properties of carbon nanotubes
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
Q
ICS 07.030; 17.220.20 ISBN 978-2-88910-775-9
– i –
IEEE Std 1650-2005(E)
CONTENTS
Foreword .iii
IEEE Introduction .vi
1. Overview . 1
1.1 Scope . 1
1.2 Purpose . 1
1.3 Electrical characterization overview. 1
2. Definitions, acronyms, and abbreviations . 6
2.1 Definitions . 6
2.2 Acronyms and abbreviations . 7
3. Nanotube properties. 7
3.1 Single-walled nanotube . 8
3.2 Multi-walled nanotube. 9
4. Electrodes . 9
4.1 Materials. 9
4.2 Method for electrode fabrication . 9
4.3 Dimensions . 10
5. Device characterization . 10
5.1 Architecture design. 10
5.2 Method for processing and fabrication . 10
5.3 Standard characterization procedures . 11
5.4 Environmental control and standards . 14
Annex A (informative) Bibliography . 15
Annex B (informative) List of Participants. 16
Published by IEC under licence from IEEE. © 2009 IEEE. All rights reserved.
– iii – IEC 62624:2009(E)
IEEE Std 1650-2005(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
TEST METHODS FOR MEASUREMENT OF ELECTRICAL PROPERTIES
OF CARBON NANOTUBES
FOREWORD
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International Standard IEC 62624/IEEE Std 1650 has been processed through IEC technical
committee 113: Nanotechnology standardization for electrical and electronic products and
systems.
The text of this standard is based on the following documents:
IEEE Std FDIS Report on voting
1650 (2005) 113/58A/FDIS 113/63/RVD
Full information on the voting for the approval of this standard can be found in the report on
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Published by IEC under licence from IEEE. © 2009 IEEE. All rights reserved.
– iv –
IEEE Std 1650-2005(E)
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