Amendment 1 - Voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) power transmission - Electrical testing

Specifies the content, format and recording method of the data blocks forming the helical records on the tape. Describes the common specifications for cassettes, modulation method, magnetization  and basic system data, for helical-scan digital video cassette recording system using 6,35 mm (1/4 inch) magnetic tape. Defines the electrical and mechanical characteristics of equipment which will provide for the interchangeability of recorded cassettes.

Amendement 1 - Valves à convertisseur de source de tension (VSC) pour le transport d’énergie en courant continu à haute tension (CCHT) - Essais électriques

Spécifie le contenu, le format et la méthode d'enregistrement des blocs de données formant les enregistrements hélicoïdaux sur la bande. Décrit les spécifications communes concernant les cassettes, la méthode de modulation, la magnétisation et les données de base système, destinées au système d'enregistrement vidéo numérique à cassette à balayage hélicoïdal utilisant la bande magnétique de 6,35 mm (1/4 d'inch). Définit les caractéristiques électriques et mécaniques du matériel permettant l'interchangeabilité des cassettes enregistrées.

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21-Sep-2017
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IEC 62501:2009/AMD2:2017 - Amendment 1 - Voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) power transmission - Electrical testing
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IEC 62501 ®
Edition 1.0 2017-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 2
AM ENDEMENT 2
Voltage sourced converter (VSC) valves for high-voltage direct current (HVDC)
power transmission – Electrical testing

Valves à convertisseur de source de tension (VSC) pour le transport d’énergie
en courant continu à haute tension (CCHT) – Essais électriques

IEC 62501:2009-06/AMD2:2017-09(en-fr)

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IEC 62501 ®
Edition 1.0 2017-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 2
AM ENDEMENT 2
Voltage sourced converter (VSC) valves for high-voltage direct current (HVDC)

power transmission – Electrical testing

Valves à convertisseur de source de tension (VSC) pour le transport d’énergie

en courant continu à haute tension (CCHT) – Essais électriques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 29.200; 29.240.99 ISBN 978-2-8322-4808-9

– 2 – IEC 62501:2009/AMD2:2017
© IEC 2017
FOREWORD
This amendment has been prepared by subcommittee 22F: Power electronics for electrical
transmission and distribution systems, of IEC technical committee 22: Power electronic
systems and equipment.
The text of this amendment is based on the following documents:
CDV Report on voting
22F/438/CDV 22F/457/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
1 Scope
Delete the third paragraph, added by IEC 62501:2009/AMD1:2014.
2 Normative references
Delete, in the reference IEC 60270:2000, High-voltage test techniques – Partial discharge
measurements, added by IEC 62501:2009/AMD1:2014, the publication year.
Replace the existing reference IEC 60700-1 and its footnote by the following new reference:
IEC 60700-1:2015, Thyristor valves for high voltage direct current (HVDC) power transmission
– Part 1: Electrical testing
Add the following new reference:
IEC 62747, Terminology for voltage-sourced converters (VSC) for high-voltage direct current
(HVDC) systems
3 Terms and definitions
Replace the existing first sentence by the following new sentence:

© IEC 2017
For the purposes of this document, the terms and definitions given in IEC 62747 and the
following apply
3.5.5
valve base electronics
Delete this term and its definition, modified by IEC 62501:2009/AMD1:2014.
4.1.2 Test object
Replace the existing title of 4.1.2 by the following new title:
4.1.2 Selection of test object
Replace, in letter b) of the first paragraph, the word "tested" by "operational type tested".
Table 1 – Minimum number of valve levels to be tested as a function of the number of
valve levels per valve
Replace the existing title of Table 1 by the following new title:
Table 1 – Minimum number of valve levels to be operational type tested as a function of
the number of valve levels per valve
Add, after Table 1, the following new paragraphs:
The minimum number of valve levels to be dielectric type tested can be equal to or lower than
the number specified for the operational type test.
The minimum number of valve levels, however, shall be representative to the valve dielectric
design. Details can be found in 9.2.
4.1.6 Frequency for testing
Delete the note, added by IEC 62501:2009/AMD1:2014.
4.4.1 General
Add, at the end of the last sentence of the existing paragraph, the words "and providing that
the failed valve level permits the rest of the valve or valve section to continue operating
without degraded performance".
6.2 Test object
Replace, in the second paragraph, the second existing sentence by the following new
sentence:
For the valves with valve surge arrester, a proportionally scaled valve arrester may be
included.
6.4 Maximum continuous operating duty test
Replace the paragraph starting with "The test current" by the following new paragraphs:
The test current, in r.m.s., shall be determined taking into account harmonics current and any
other additional current through the valve.
The test current value shall incorporate a test safety factor of 1,05.

– 4 – IEC 62501:2009/AMD2:2017
© IEC 2017
Add, in the paragraph starting with "The test voltage", in the definition of U , the words "of
dmax
the valve" after "DC voltage".
7.3.1 Valve support d.c. voltage test
Replace, in the first paragraph, the reference "IEC 60700-1" by "IEC 60700-1:2015".
Replace, in the last paragraph, modified by IEC 62501:2009/AMD1:2014, the key "k = 1,1" by
the following new key:
k = 1,10 for 1 min test;
k = 1,15 for 3 h test;
7.3.2 Valve support a.c. voltage test
Replace the last paragraph by the following new paragraph:
The valve support a.c. test voltage U shall be determined in accordance with the following:
tas
1 min test:
U
mS1
U = ⋅ k ⋅ k
tas 4 t
30 min test
U
mS2
U = ⋅ k
tas 4
where:
U is the peak value of maximum voltage appearing on the valve support in service,
mS1
particularly in system fault condition and valve fault operation condition. The
over-voltage limiting effect of phase arrester or other over-voltage protection means,
if any, shall be taken into account to derive this over-voltage;
U is the peak value of the maximum repetitive operating voltage across the valve
mS2
support during steady-state operation, including switching overshoot;
k is a test safety factor;
k = 1,10;
k is the atmospheric correction factor according to 4.2.
t
8.3.1 MVU d.c. voltage test to earth
Replace, in the last paragraph, modified by IEC 62501:2009/AMD1:2014, the key "k = 1,1" by
the following new key:
k = 1,10 for 1 min test;
= 1,15 for 3 h test;
k
8.3.2 MVU AC voltage test
Replace the last paragraph by the following new paragraph:
The MVU AC test voltage U shall be determined in accordance with the following:
tam
1 min test
© IEC 2017
U
mm1
U = ⋅ k ⋅ k
tam 6 t
30 min test
U
mm2
U = ⋅ k
tam 6
where
U is the peak value of maximum voltage between the terminals of the MVU in service,

mm1
particularly in system fault condition and valve fault operation condition. The
over-voltage limiting effect of phase arrester or other over-voltage protection means,
if any, shall be taken into account to derive this over-voltage;
U is the peak value of the maximum repetitive operating voltage between the terminals
mm2
of the MVU during steady-state operation, including switching overshoot;
k is a test safety factor;
k = 1,10;
k is the atmospheric correction factor according to 4.2.
t
9 Dielectric tests between valve terminals
9.3.1 Valve a.c. – d.c. voltage test
Delete Note 1, Note 4, Note 5 and Note 6, added by IEC 62501:2009/AMD1:2014.
Add the following new subclauses:
9.4 Test methods
9.4.1 General
Performing the valve dielectric test presents considerable practical difficulties on controllable
voltage source type VSC valves because of the high current drawn by the in-built capacitance.
For this reason, following valve dielectric test methods are acceptable.
9.4.2 Method one
Temporary substitution of a reduced capacitance but the same physical size test capacitor is
permissible. This test capacitor shall allow a test voltage build-up across the test object
during test.
Also, it may be necessary to disable gate electronics or other auxiliary circuits in this test or
provide independent means for powering them, in order to prevent interference with partial
discharge measurement, for example, from gate unit power supply circuits.
When gate electronics or other auxiliary circuits are disabled for the 10 s test, the active
voltage control function, if any, provided by gate electronics or other auxiliary circuits on each
IGBT level may be represented by other means, for example, high resistance shunt resistors
across test IGBT levels for appropriate voltage sharing.
In the event that it is not possible to disable gate electronics or other auxiliary circuits in this
test and interference can be proven to be caused by electronics circuit, then this interference
may be deducted from measurement.

– 6 – IEC 62501:2009/AMD2:2017
© IEC 2017
9.4.3 Method two
Valve dielectric test is done by two steps.
Step one focuses on the component level and step two on the valve or valve section. In step
one, module levels are tested independen
...

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