Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators

IEC/TS 61994-3:2011(E) specifies the terms and definitions for piezoelectric dielectric oscillators representing the state-of-the-art, which are intended for use in the standards and documents of IEC TC 49.

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IEC/TS 61994-3
Edition 2.0 2011-07
TECHNICAL
SPECIFICATION
Piezoelectric, dielectric and electrostatic devices and associated materials for
frequency control, selection and detection – Glossary –
Part 3: Piezoelectric and dielectric oscillators
IEC/TS 61994-3:2011(E)
---------------------- Page: 1 ----------------------
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---------------------- Page: 2 ----------------------
IEC/TS 61994-3
Edition 2.0 2011-07
TECHNICAL
SPECIFICATION
Piezoelectric, dielectric and electrostatic devices and associated materials for
frequency control, selection and detection – Glossary –
Part 3: Piezoelectric and dielectric oscillators
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
ICS 31.140; 01.040.31 ISBN 978-2-88912-556-2
® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 3 ----------------------
– 2 – TS 61994-3 © IEC:2011
CONTENTS

FOREWORD ........................................................................................................................... 3

1 Scope ............................................................................................................................... 5

2 Normative references ....................................................................................................... 5

3 Terms and definitions ....................................................................................................... 5

Bibliography .......................................................................................................................... 16

Figure 1 – Characteristics of an output waveform.................................................................... 6

Figure 2 – Example of the use of frequency offset .................................................................. 8

Figure 3 – Typical frequency fluctuation characteristics ........................................................ 10

Figure 4 – Clock signal with phase jitter ................................................................................ 11

---------------------- Page: 4 ----------------------
TS 61994-3 © IEC:2011 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PIEZOELECTRIC, DIELECTRIC AND
ELECTROSTATIC DEVICES AND ASSOCIATED MATERIALS
FOR FREQUENCY CONTROL, SELECTION AND DETECTION –
GLOSSARY –
Part 3: Piezoelectric and dielectric oscillators
FOREWORD

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all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To

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with the International Organization for Standardization (ISO) in accordance with conditions determined by

agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

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interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

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9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

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The main task of IEC technical committees is to prepare International Standards. In

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• the required support cannot be obtained for the publication of an International Standard,

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• the subject is still under technical development or where, for any other reason, there is the

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Technical specifications are subject to review within three years of publication to decide

whether they can be transformed into International Standards.
---------------------- Page: 5 ----------------------
– 4 – TS 61994-3 © IEC:2011

IEC 61994-3, which is a technical specification, has been prepared by IEC technical

committee 49: Piezoelectric, dielectric and electrostatic devices and associated materials for

frequency control, selection and detection.

This second edition of IEC 61994-3 cancels and replaces the first edition published in 2004.

This edition constitutes a technical revision.
The main changes with respect to the previous edition are listed below:
– definitions updated,
– terminology given in orderly sequence,
– new terminologies are added,
– drawings inserted for easier understanding.
The text of this technical specification is based on the following documents:
Enquiry draft Report on voting
49/928/DTS 49/949/RVC

Full information on the voting for the approval of this technical specification can be found in

the report on voting indicated in the above table.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

A list of all parts of the IEC 61994 series, under the general title Piezoelectric, dielectric and

electrostatic devices and associated materials for frequency control, selection and detection –

Glossary, can be found on the IEC website.

NOTE Future standards in this series will carry the new general title as cited above. Titles of existing standards in

this series will be updated at the time of next edition.

The committee has decided that the contents of this publication will remain unchanged until

the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data

related to the specific publication. At this date, the publication will be
• transformed into an International standard,
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
---------------------- Page: 6 ----------------------
TS 61994-3 © IEC:2011 – 5 –
PIEZOELECTRIC, DIELECTRIC AND
ELECTROSTATIC DEVICES AND ASSOCIATED MATERIALS
FOR FREQUENCY CONTROL, SELECTION AND DETECTION –
GLOSSARY –
Part 3: Piezoelectric and dielectric oscillators
1 Scope

This part of IEC 61994 specifies the terms and definitions for piezoelectric dielectric

oscillators representing the state-of-the-art, which are intended for use in the standards and

documents of IEC TC 49.
2 Normative references
Void
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1
adjustment frequency

frequency to which an oscillator must be adjusted, under a particular combination of operating

conditions, in order to meet the frequency tolerance specification over the specified range of

operating conditions, i.e. adjustment frequency = nominal frequency + frequency offset

[IEC 60679-1: 2007, 3.2.10]
3.2
Allan variance of fractional frequency fluctuation

unbiased estimate of the preferred definition in the time domain of the short-term stability

characteristic of the oscillator output frequency:
M−1 2
1 (Y −Y )
k+1 k
(τ)≅
M−1 2
k=1
where

are the average fractional frequency fluctuations obtained sequentially, with no

systematic dead time between measurements;
τ is the sample time over which measurements is averaged;
M is the number of measurements.
NOTE The confidence of the estimate improves as M increases.
[IEC 60679-1: 2007, 3.2.23, modified]
3.3
amplitude modulation distortion

non-linear distortion in which the relative magnitudes of the spectral components of the

modulating signal waveform are modified
---------------------- Page: 7 ----------------------
– 6 – TS 61994-3 © IEC:2011

NOTE This amplitude modulation distortion is also commonly known as frequency distortion, amplitude distortion

and amplitude/frequency distortion.
[IEC 60679-1: 2007, 3.2.28, modified]
3.4
crystal cut

orientation of the crystal element with respect to the crystallographic axes of the crystal

NOTE This definition is included as it may be desirable to specify the cut (and hence the general form of the

frequency/temperature performance) of a crystal unit used in an oscillator application. The choice of the crystal cut

will imply certain attributes of the oscillator which may not otherwise appear in the detail specification.

[IEC 60679-1: 2007, 3.2.3]
3.5
decay time
fall time

time interval required for the trailing edge of a waveform to change between two defined

levels

NOTE These two defined levels may be the logic levels V and V being at 90 % and 10 %, respectively, of

OH OL

the maximum amplitude (equaling V - V ) of the waveform, or any other ratio as defined in the detail

HI LO
specification (see Figure 1),
where
V is the low level output voltage;
V is the high level output voltage;
V is the upper flat voltage of the pulse waveform;
V is the low flat voltage of the pulse waveform.
[IEC 60679-1: 2007, 3.2.34, modified]
Pulse duration (t )
Pulse duration (t )
(mark)
(space)
V upper limit 90 %
Arithmetic mean
of limit
V Lower limit 10 %
Time
Decay time
Rise time
IEC 447/07
Figure 1 – Characteristics of an output waveform
3.6
electrostatic discharge
ESD

transfer of electric charge between bodies having different electrostatic potentials in proximity

or through direct contact
Voltage
---------------------- Page: 8 ----------------------
TS 61994-3 © IEC:2011 – 7 –
[IEC 60050-161:1990, 161-01-22]
3.7
frequency adjustment range

range over which the oscillator frequency may be varied by means of some variable element,

for the purpose of:
a) setting the frequency to a particular value, or
b) to correct the oscillator frequency to a prescribed value af
...

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