EN ISO 12179:2000
(Main)Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2000)
Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2000)
Geometrische Produktspezifikation (GPS) -Oberflächenbeschaffenheit: Tastschnittverfahren - Kalibrierung von Tastschnittgeräten (ISO 12179:2000)
Diese Internationale Norm gilt für die Kalibrierung von meßtechnischen Eigenschaften der Tastschnittgeräte zur Messung von Oberflächen nach dem Tastschnittverfahren nach ISO 3274. Die Kalibrierung ist mit Hilfe von Normalen durchzuführen. Anhang B dieser Internationalen Norm gilt für die Kalibrierung von meßtechnischen Eigenschaften der Sekundärmeßgeräte, die mit der ISO 3274 nicht übereinstimmen.
Spécification géométrique des produits (GPS) - Etat de surface: Méthode du profil - Etalonnage des instruments à contact (palpeur) (ISO 12179:2000)
La présente Norme internationale s'applique à l'étalonnage des caractéristiques métrologiques des instruments à contact (palpeur) destinés au mesurage de l'état de surface par la méthode du profil comme défini dans l'ISO 3274. L'étalonnage est à effectuer avec des étalons de mesure.L'annexe B s'applique à l'étalonnage des caractéristiques métrologiques d'instruments à contact (palpeur) simplifiés qui ne sont pas en conformité avec l'ISO 3274.
Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2000)
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
01-december-2000
Geometrical Product Specifications (GPS) - Surface texture: Profile method -
Calibration of contact (stylus) instruments (ISO 12179:2000)
Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration
of contact (stylus) instruments (ISO 12179:2000)
Geometrische Produktspezifikation (GPS) -Oberflächenbeschaffenheit:
Tastschnittverfahren - Kalibrierung von Tastschnittgeräten (ISO 12179:2000)
Spécification géométrique des produits (GPS) - Etat de surface: Méthode du profil -
Etalonnage des instruments a contact (palpeur) (ISO 12179:2000)
Ta slovenski standard je istoveten z: EN ISO 12179:2000
ICS:
17.040.30 Merila Measuring instruments
17.040.40 6SHFLILNDFLMDJHRPHWULMVNLK Geometrical Product
YHOLþLQL]GHOND *36 Specification (GPS)
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
INTERNATIONAL ISO
STANDARD 12179
First edition
2000-03-15
Geometrical Product Specifications
(GPS) — Surface texture: Profile method —
Calibration of contact (stylus) instruments
Spécification géométrique des produits (GPS) — État de surface: Méthode
du profil — Étalonnage des instruments à contact (palpeur)
Reference number
ISO 12179:2000(E)
©
ISO 2000
ISO 12179:2000(E)
PDF disclaimer
This PDF file may contain embedded typefaces. In accordance with Adobe's licensing policy, this file may be printed or viewed but shall not
be edited unless the typefaces which are embedded are licensed to and installed on the computer performing the editing. In downloading this
file, parties accept therein the responsibility of not infringing Adobe's licensing policy. The ISO Central Secretariat accepts no liability in this
area.
Adobe is a trademark of Adobe Systems Incorporated.
Details of the software products used to create this PDF file can be found in the General Info relative to the file; the PDF-creation parameters
were optimized for printing. Every care has been taken to ensure that the file is suitable for use by ISO member bodies. In the unlikely event
that a problem relating to it is found, please inform the Central Secretariat at the address given below.
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic
or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or ISO's member body
in the country of the requester.
ISO copyright office
Case postale 56 � CH-1211 Geneva 20
Tel. + 41 22 749 01 11
Fax + 41 22 734 10 79
E-mail copyright@iso.ch
Web www.iso.ch
Printed in Switzerland
ii © ISO 2000 – All rights reserved
ISO 12179:2000(E)
Contents Page
Foreword.iv
Introduction.v
1 Scope .1
2 Normative references .1
3 Terms and definitions .2
4 Conditions of use.2
5 Measurement standards .3
6 Contact (stylus) instrument metrological characteristics.3
7 Calibration .6
8 Uncertainty of measurement .8
9 Contact (stylus) instrument calibration certificate.9
Annex A (normative) Calibration of instruments measuring the motifs method parameters.10
Annex B (normative) Calibration of simplified operator instruments for the measurements of surface
texture .12
Annex C (informative) Example: roughness measurement standard parameter Ra .13
Annex D (informative) Relation to the GPS matrix model.16
Bibliography.17
ISO 12179:2000(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO
member bodies). The work of preparing International Standards is normally carried out through ISO technical
committees. Each member body interested in a subject for which a technical committee has been established has
the right to be represented on that committee. International organizations, governmental and non-governmental, in
liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical
Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 3.
Draft International Standards adopted by the technical committees are circulated to the member bodies for voting.
Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights.
International Standard ISO 12179 was prepared by Technical Committee ISO/TC 213, Dimensional and
geometrical product specifications and verification.
Annexes A and B form a normative part of this International Standard. Annexes C and D are for information only.
iv © ISO 2000 – All rights reserved
ISO 12179:2000(E)
Introduction
This International Standard is a geometrical product specification (GPS) standard and is to be regarded as a
general GPS standard (see ISO/TR 14638). It influences the chain link 6 of the chain of standards on roughness,
waviness and primary profile.
For more detailed information on the relationship of this standard to the GPS matrix model, see annex D.
This International Standard introduces calibration of contact (stylus) instruments as defined in ISO 3274. The
calibration is to be carried out with the aid of measurement standards.
INTERNATIONAL STANDARD ISO 12179:2000(E)
Geometrical Product Specifications (GPS) — Surface texture:
Profile method — Calibration of contact (stylus) instruments
1 Scope
This International Standard applies to the calibration of the metrological characteristics of contact (stylus)
instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration is
to be carried out with the aid of measurement standards.
Annex B applies to the calibration of metrological characteristics of simplified operator contact (stylus) instruments
which do not conform with ISO 3274.
2 Normative references
The following normative documents contain provisions which, through reference in this text, constitute provisions of
this International Standard. For dated references, subsequent amendments to, or revisions of, any of these
publications do not apply. However, parties to agreements based on this International Standard are encouraged to
investigate the possibility of applying the most recent editions of the normative documents indicated below. For
undated references, the latest edition of the normative document referred to applies. Members of ISO and IEC
maintain registers of currently valid International Standards.
ISO 3274:1996, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal
characteristics of contact (stylus) instruments.
ISO 4287:1997, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions
and surface texture parameters.
ISO 5436-1:2000, Geometrical Product Specifications (GPS) — Surface texture: Profile method; Measurement
standards — Part 1: Material measures.
ISO 10012-1:1992, Quality assurance requirements for measuring equipment — Part 1: Metrological confirmation
system for measuring equipment.
ISO 12085:1996, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Motif
parameters.
ISO 14253-1:1998, Geometrical Product Specifications (GPS) — Inspection by measurement of workpieces and
measuring equipment — Part 1: Decision rules for proving conformance or non-conformance with specification.
ISO/TS 14253-2:1999, Geometrical Product Specifications (GPS) — Inspection by measurement of workpieces
and measuring equipment — Part 2: Guide to the estimation of uncertainty of measurement in GPS measurement,
in calibration of measuring equipment and in product verification.
Guide to the expression of uncertainty in measurement (GUM). BIPM,IEC,IFCC, ISO, IUPAC,IUPAP,OIML,
1st edition, 1995.
International vocabulary of basic and general terms used in metrology (VIM). BIPM, IEC, IFCC, ISO, IUPAC,
IUPAP, OIML, 2nd edition, 1993.
ISO 12179:2000(E)
3 Terms and definitions
For the purposes of this International Standard, the terms and definitions given in ISO 3274, ISO 4287,
ISO 14253-1, VIM [some of which are reproduced below (without their notes) for convenience], GUM, and term and
definition 3.2, apply.
3.1
calibration
set of operations that establish, under specified conditions, the relationship between values of quantities indicated
by a measuring instrument or measuring system, or values represented by a material measure or a reference
material, and the corresponding values realized by standards
[VIM 6.11]
3.2
task related calibration
set of operations which establish, under specified conditions, the relationship between values of quantities
indicated by a measuring instrument and the corresponding known values of a limited family of precisely defined
measurands which constitute a subset of the measuring capabilities of the measuring instrument
3.3
adjustment (of a measuring instrument)
operation of bringing a measuring instrument into a state of performance suitable for its use
[VIM 4.30]
3.4
(measurement) standard
etalon
material measure, measuring instrument, reference material or measuring system intended to define, realize,
conserve or reproduce a unit or one or more values of a quantity to serve as a reference
[VIM 6.1]
NOTE In ISO 5436:1985, "measurement standards" were referred to as "calibration specimens".
3.5
uncertainty of measurement
parameter, associated with the result of a measurement, that characterizes the dispersion of the values that could
reasonably be attributed to the measurand
[VIM 3.9]
3.6
traceability
property of the result of a measurement or the value of a standard whereby it can be related to stated references,
usually national or international standards, through an unbroken chain of comparisons all having stated
uncertainties
[VIM 6.10]
4 Conditions of use
4.1 Components and configurations of the contact (stylus) instrument
The contact (stylus) instrument is comprised of the basic equipment, a drive unit, a probe and a profile recorder
(see ISO 3274).
2 © ISO 2000 – All rights reserved
ISO 12179:2000(E)
If the basic equipment is used with several drive units and probes, each of these instrumental combinations
(configurations) shall be calibrated separately.
4.2 Calibration of a configuration
The contact (stylus) instrument shall be calibrated when a change is made to the basic elements of the system
which intentionally or unintentionally modifies the measured profile/measuring result. Each configuration of the
contact (stylus) instrument shall be calibrated separately.
EXAMPLE With a change of probe the contact (stylus) instrument shall be calibrated.
4.3 Place of calibration
The contact (stylus) instrument should be calibrated at the place of use with environmental conditions similar to
those present when in use for measurement to take into account external influence factors.
EXAMPLE Noise, temperature, vibration, air movement, etc.
5 Measurement standards
The following measuring standards are applicable to the calibrations given in clause 6:
� optical flat;
� depth measurement standard (Figure 1): type A according to ISO 5436-1;
� spacing measurement standard (Figure 2): type C according to ISO 5436-1;
� inclined optical flat (Figure 3);
� profile co-ordinate measurement standard (consisting of a sphere or prism): type E according to ISO 5436-1;
� roughness measurement standard (Figure 4): type D according to ISO 5436-1.
NOTE It is recommended that a profile co-ordinate measurement standard be used on contact (stylus) instruments where
the stylus rotates plus and minus one half of a degree when moving through its full range.
6 Contact (stylus) instrument metrological characteristics
Only those task-rela
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.