Information technology - Automatic identification and data capture techniques - Bar code print quality test specification - Linear symbols (ISO/IEC 15416:2000)

Informationstechnik - Verfahren der automatischen Identifikation und Datenerfassung - Testspezifikationen für Strichcodedruckqualität, Lineare Symbole (ISO/IEC 15416:2000)

Diese Norm
¾ legt die Methode zur Messung spezifischer Attribute von Strichcodesymbolen fest;
¾ definiert ein Verfahren zur Bewertung dieser Messergebnisse und ermöglicht eine Gesamtbewertung der Symbolqualität;
¾ informiert über mögliche Ursachen für Abweichungen von der optimalen Klasse, um Anwendern die Möglichkeit zu entsprechenden Korrekturen zu geben.
Diese  Norm wird auf Symbologien angewendet, für die ein Referenzdecodieralgorithmus definiert ist und die unter Verwendung einer linearen Scanningmethode gelesen werden. Diese Methode kann aber ganz oder teilweise auch auf andere Symbologien übertragen werden.

Technologies de l'information - Techniques d'identification automatique et de capture des données - Spécifications pour essai de qualité d'impression des codes à barres - Symboles linéaires (ISO/IEC 15416:2000)

Informacijska tehnologija - Tehnike za samodejno identificiranje (razpoznavanje) in zajem podatkov - Specifikacija za preskušanje kakovosti tiska črtnih kod - Linearni simboli (ISO/IEC 15416:2000)

General Information

Status
Published
Publication Date
11-Dec-2001
Technical Committee
Current Stage
9093 - Decision to confirm - Review Enquiry
Due Date
07-Sep-2009
Completion Date
07-Sep-2009

Buy Standard

Standard
EN ISO/IEC 15416:2003
English language
36 pages
sale 10% off
Preview
sale 10% off
Preview

e-Library read for
1 day

Standards Content (sample)

SLOVENSKI STANDARD
SIST EN ISO/IEC 15416:2003
01-oktober-2003

,QIRUPDFLMVNDWHKQRORJLMD7HKQLNH]DVDPRGHMQRLGHQWLILFLUDQMH UD]SR]QDYDQMH LQ

]DMHPSRGDWNRY6SHFLILNDFLMD]DSUHVNXãDQMHNDNRYRVWLWLVNDþUWQLKNRG/LQHDUQL

VLPEROL ,62,(&

Information technology - Automatic identification and data capture techniques - Bar code

print quality test specification - Linear symbols (ISO/IEC 15416:2000)

Informationstechnik - Verfahren der automatischen Identifikation und Datenerfassung -

Testspezifikationen für Strichcodedruckqualität, Lineare Symbole (ISO/IEC 15416:2000)

Technologies de l'information - Techniques d'identification automatique et de capture des

données - Spécifications pour essai de qualité d'impression des codes a barres -
Symboles linéaires (ISO/IEC 15416:2000)
Ta slovenski standard je istoveten z: EN ISO/IEC 15416:2001
ICS:
01.080.50 *UDILþQLVLPEROL]DXSRUDERY Graphical symbols for use on
WHKQLþQLKULVEDKY information technology and
LQIRUPDFLMVNLWHKQRORJLMLLQ telecommunications technical
WHOHNRPXQLNDFLMDKWHUY drawings and in relevant
XVWUH]QLWHKQLþQLSURL]YRGQL technical product
GRNXPHQWDFLML documentation
35.040 Nabori znakov in kodiranje Character sets and
informacij information coding
SIST EN ISO/IEC 15416:2003 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------
SIST EN ISO/IEC 15416:2003
---------------------- Page: 2 ----------------------
SIST EN ISO/IEC 15416:2003
EUROPEAN STANDARD
EN ISO/IEC 15416
NORME EUROPÉENNE
EUROPÄISCHE NORM
December 2001
ICS 01.080.50; 35.040 Supersedes EN 1635:1997
English version
Information technology - Automatic identification and data
capture techniques - Bar code print quality test specification -
Linear symbols (ISO/IEC 15416:2000)

Technologies de l'information - Techniques d'identification Informationstechnik - Verfahren der automatischen

automatique et de capture des données - Spécifications Identifikation und Datenerfassung - Testspezifikationen für

pour essai de qualité d'impression des codes à barres - Strichcodedruckqualität, Lineare Symbole (ISO/IEC

Symboles linéaires (ISO/IEC 15416:2000) 15416:2000)
This European Standard was approved by CEN on 20 October 2001.

CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European

Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national

standards may be obtained on application to the Management Centre or to any CEN member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation

under the responsibility of a CEN member into its own language and notified to the Management Centre has the same status as the official

versions.

CEN members are the national standards bodies of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece,

Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.

EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION
EUROPÄISCHES KOMITEE FÜR NORMUNG
Management Centre: rue de Stassart, 36 B-1050 Brussels

© 2001 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN ISO/IEC 15416:2001 E

worldwide for CEN national Members.
---------------------- Page: 3 ----------------------
SIST EN ISO/IEC 15416:2003
EN ISO/IEC 15416:2001 (E)
CORRECTED 2002-03-27
Foreword

The text of the International Standard from Technical Committee ISO/IEC/JTC 1 "Information

technology" of the International Organization for Standardization (ISO) has been taken over as a

European Standard by Technical Committee CEN/TC 225 "Bar coding", the secretariat of which

is held by NEN.

This European Standard shall be given the status of a national standard, either by publication of

an identical text or by endorsement, at the latest by June 2002, and conflicting national

standards shall be withdrawn at the latest by June 2002.
This document supersedes EN 1635:1997.

According to the CEN/CENELEC Internal Regulations, the national standards organizations of

the following countries are bound to implement this European Standard: Austria, Belgium, Czech

Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg,

Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and the United Kingdom.

Endorsement notice

The text of the International Standard ISO/IEC 15416:2000 has been approved by CEN as a

European Standard without any modifications.
---------------------- Page: 4 ----------------------
SIST EN ISO/IEC 15416:2003
INTERNATIONAL ISO/IEC
STANDARD 15416
First edition
2000-08-15
Information technology — Automatic
identification and data capture
techniques — Bar code print quality test
specification — Linear symbols
Technologies de l'information — Techniques d'identification automatique et
de capture des données — Spécifications pour essai de qualité
d'impression des codes à barres — Symboles linéaires
Reference number
ISO/IEC 15416:2000(E)
ISO/IEC 2000
---------------------- Page: 5 ----------------------
SIST EN ISO/IEC 15416:2003
ISO/IEC 15416:2000(E)
PDF disclaimer

This PDF file may contain embedded typefaces. In accordance with Adobe's licensing policy, this file may be printed or viewed but shall not

be edited unless the typefaces which are embedded are licensed to and installed on the computer performing the editing. In downloading this

file, parties accept therein the responsibility of not infringing Adobe's licensing policy. The ISO Central Secretariat accepts no liability in this

area.
Adobe is a trademark of Adobe Systems Incorporated.

Details of the software products used to create this PDF file can be found in the General Info relative to the file; the PDF-creation parameters

were optimized for printing. Every care has been taken to ensure that the file is suitable for use by ISO member bodies. In the unlikely event

that a problem relating to it is found, please inform the Central Secretariat at the address given below.

© ISO/IEC 2000

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic

or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or ISO's member body

in the country of the requester.
ISO copyright office
Case postale 56 � CH-1211 Geneva 20
Tel. + 41 22 749 01 11
Fax + 41 22 749 09 47
E-mail copyright@iso.ch
Web www.iso.ch
Printed in Switzerland
ii © ISO/IEC 2000 – All rights reserved
---------------------- Page: 6 ----------------------
SIST EN ISO/IEC 15416:2003
ISO/IEC 15416:2000(E)
Contents Page

Foreword.....................................................................................................................................................................vi

Introduction...............................................................................................................................................................vii

1 Scope ..............................................................................................................................................................1

2 Normative references ....................................................................................................................................1

3 Terms and definitions ...................................................................................................................................1

4 Symbols and abbreviated terms ..................................................................................................................3

4.1 Abbreviations.................................................................................................................................................3

4.2 Symbols ..........................................................................................................................................................3

5 Measurement methodology..........................................................................................................................4

5.1 General requirements....................................................................................................................................4

5.2 Reference reflectivity measurements..........................................................................................................5

5.2.1 Measurement wavelength(s).........................................................................................................................5

5.2.2 Measuring aperture........................................................................................................................................5

5.2.3 Optical geometry............................................................................................................................................6

5.2.4 Inspection band .............................................................................................................................................7

5.2.5 Number of scans............................................................................................................................................7

5.3 Scan reflectance profile ................................................................................................................................7

5.4 Scan reflectance profile assessment parameters......................................................................................8

5.4.1 Element determination ..................................................................................................................................9

5.4.2 Edge determination .......................................................................................................................................9

5.4.3 Decode ..........................................................................................................................................................10

5.4.4 Symbol contrast (SC) ..................................................................................................................................10

5.4.5 Minimum reflectance (R )........................................................................................................................10

min

5.4.6 Edge contrast (EC).......................................................................................................................................10

5.4.7 Modulation (MOD)........................................................................................................................................10

5.4.8 Defects ..........................................................................................................................................................10

5.4.9 Decodability..................................................................................................................................................10

5.4.10 Quiet zone check .........................................................................................................................................11

6 Symbol grading............................................................................................................................................12

6.1 Scan reflectance profile grading................................................................................................................12

6.1.1 Decode ..........................................................................................................................................................12

6.1.2 Reflectance parameter grading..................................................................................................................12

6.1.3 Decodability..................................................................................................................................................13

6.2 Expression of symbol grade.......................................................................................................................13

7 Substrate characteristics............................................................................................................................13

Annex A (normative) Decodability...........................................................................................................................14

A.1 Two-width symbologies ..............................................................................................................................14

A.2 Edge to similar edge decodable symbologies ((n, k) symbologies) ......................................................14

Annex B (normative) Example of symbol quality grading ....................................................................................16

B.1 Individual scan reflectance profile grading ..............................................................................................16

B.2 Overall symbol grade ..................................................................................................................................17

Annex C (informative) Symbol grading flowchart..................................................................................................18

Annex D (informative) Substrate characteristics...................................................................................................19

D.1 Substrate opacity.........................................................................................................................................19

D.2 Gloss .............................................................................................................................................................19

D.3 Over-laminate...............................................................................................................................................19

© ISO/IEC 2000 – All rights reserved iii
---------------------- Page: 7 ----------------------
SIST EN ISO/IEC 15416:2003
ISO/IEC 15416:2000(E)

D.4 Static reflectance measurements...............................................................................................................19

D.4.1 Prediction of Symbol Contrast (SC)...........................................................................................................20

D.4.2 Prediction of Minimum Edge Contrast (EC ) and Modulation (MOD) .................................................20

min

D.4.3 Acceptability of measured and derived values.........................................................................................22

Annex E (informative) Interpretation of the scan reflectance profile and profile grades...................................23

E.1 Significance of scan reflectance profiles..................................................................................................23

E.2 Interpretation of results...............................................................................................................................23

E.3 Matching grades to applications................................................................................................................24

E.4 Alphabetic grading ......................................................................................................................................25

Annex F (informative) Guidance on selection of light wavelength ......................................................................26

F.1 Light sources................................................................................................................................................26

F.2 Effect of variations in wavelength..............................................................................................................27

Annex G (informative) Guidance on number of scans per symbol......................................................................28

Annex H (informative) Example of verification report ...........................................................................................29

Annex I (informative) Comparison with traditional methodologies .....................................................................30

I.1 Traditional methodologies..........................................................................................................................30

I.2 Correlation of Print Contrast Signal with symbol contrast measurements...........................................30

I.3 Guidance on grading for applications also specifying PCS ...................................................................31

Annex J (informative) Process control requirements............................................................................................32

J.1 Process control for repetitive printing ......................................................................................................32

J.2 Number of scans..........................................................................................................................................32

J.3 Bar width deviation......................................................................................................................................33

J.3.1 Two-width symbologies ..............................................................................................................................33

J.3.2 (n, k) symbologies .......................................................................................................................................33

J.3.3 Average bar width gain/loss .......................................................................................................................33

Bibliography ..............................................................................................................................................................34

iv © ISO/IEC 2000 – All rights reserved
---------------------- Page: 8 ----------------------
SIST EN ISO/IEC 15416:2003
ISO/IEC 15416:2000(E)
Foreword

ISO (the International Organization for Standardization) and IEC (the International Electrotechnical Commission)

form the specialized system for worldwide standardization. National bodies that are members of ISO or IEC

participate in the development of International Standards through technical committees established by the

respective organization to deal with particular fields of technical activity. ISO and IEC technical committees

collaborate in fields of mutual interest. Other international organizations, governmental and non-governmental, in

liaison with ISO and IEC, also take part in the work.

International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 3.

In the field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.

Draft International Standards adopted by the joint technical committee are circulated to national bodies for voting.

Publication as an International Standard requires approval by at least 75 % of the national bodies casting a vote.

Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of

patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.

International Standard ISO/IEC 15416 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information

technology, Subcommittee SC 31, Automatic identification and data capture techniques.

Annexes A and B form a normative part of this International Standard. Annexes C to J are for information only.

© ISO/IEC 2000 – All rights reserved v
---------------------- Page: 9 ----------------------
SIST EN ISO/IEC 15416:2003
ISO/IEC 15416:2000(E)
Introduction

The technology of bar coding is based on the recognition of patterns encoded in bars and spaces of defined

dimensions according to rules defining the translation of characters into such patterns, known as the symbology

specification.

The bar code symbol must be produced in such a way as to be reliably decoded at the point of use, if it is to fulfil its

basic objective as a machine readable data carrier.

Manufacturers of bar code equipment and the producers and users of bar code symbols therefore require publicly

available standard test specifications for the objective assessment of the quality of bar code symbols, to which they

can refer when developing equipment and application standards or determining the quality of the symbols. Such

test specifications form the basis for the development of measuring equipment for process control and quality

assurance purposes during symbol production as well as afterwards.

The performance of measuring equipment is the subject of a separate International Standard, ISO/IEC 15426.

This International Standard is intended to be substantially equivalent in technical content to EN 1635 and ANSI

standards X3.182 - 1990 and ANSI/UCC5 on which it has been based. It should be read in conjunction with the

symbology specification applicable to the bar code symbol being tested, which provides symbology-specific detail

necessary for its application.

There are currently many methods of assessing bar code quality at different stages of symbol production. The

methodology provided in this specification is not intended as a replacement for any current process control

methods but gives essential additional quality information. This methodology provides a basis for grading the

quality of bar code symbols in relation to their expected performance when read and therefore gives symbol

producers and their trading partners a universally standardized means for communicating about the quality of bar

code symbols after they have been printed. It also provides symbol producers with information enabling them to

adjust their production process.

Alternative methods of quality assessment may be agreed between parties or as part of an application

specification.
vi © ISO/IEC 2000 – All rights reserved
---------------------- Page: 10 ----------------------
SIST EN ISO/IEC 15416:2003
INTERNATIONAL STANDARD ISO/IEC 15416:2000(E)
Information technology — Automatic identification and data
capture techniques — Bar code print quality test specification —
Linear symbols
1 Scope
This International Standard

� specifies the methodology for the measurement of specific attributes of bar code symbols;

� defines a method for evaluating these measurements and deriving an overall assessment of symbol quality;

� gives information on possible causes of deviation from optimum grades to assist users in taking appropriate

corrective action.

This International Standard applies to those symbologies for which a reference decode algorithm has been defined,

and which are intended to be read using linear scanning methods, but its methodology can be applied partially or

wholly to other symbologies.
2 Normative references

The following normative documents contain provisions which, through reference in this text, constitute provisions of

this International Standard. For dated references, subsequent amendments to, or revisions of, any of these

publications do not apply. However, parties to agreements based on this International Standard are encouraged to

investigate the possibility of applying the most recent editions of the normative documents indicated below. For

undated references, the latest edition of the normative document referred to applies. Members of ISO and IEC

maintain registers of currently valid International Standards.

ISO 7724-2:1984, Paints and varnishes — Colorimetry — Part 2: Colour measurement.

EN 1556:1998, Bar coding — Terminology.
3 Terms and definitions

For the purposes of this International Standard, the terms and definitions given in EN 1556 and the following apply.

3.1
bar

A dark element corresponding to a region of a scan reflectance profile below the global threshold.

3.2
bar reflectance

The lowest reflectance value of an individual bar element in the scan reflectance profile of that element.

© ISO/IEC 2000 – All rights reserved 1
---------------------- Page: 11 ----------------------
SIST EN ISO/IEC 15416:2003
ISO/IEC 15416:2000(E)
3.3
decodability

The proportion of the available margin (between the ideal dimension of an element or combination of elements and

the relevant reference threshold) that has not been consumed by the element or combination of elements,

calculated for the element or combination of elements deviating most from its ideal dimension.

3.4
decode
Determination of the information encoded in a bar code symbol.
3.5
edge contrast

The difference between bar reflectance and space reflectance of two adjacent elements.

3.6
element reflectance non-uniformity

The reflectance difference between the highest peak and the lowest valley in the scan reflectance profile of an

individual element or quiet zone.
3.7
global threshold

The reflectance level midway between the maximum and minimum reflectance values in a scan reflectance profile

used for the initial identification of elements.
3.8
gloss

The propensity of a surface to reflect a proportion of incident light in a specular manner.

3.9
inspection band

The band (usually from 10 % to 90 % of the height of a bar code symbol) across which measurements are taken

(see Figure 2).
3.10
measuring aperture

A circular opening which governs the effective sample area of the symbol, and the diameter of which at 1:1

magnification is equal to that of the sample area.
3.11
modulation
The ratio of minimum edge contrast to symbol contrast.
3.12
(n, k) symbology

A class of bar code symbologies in which each symbol character is n modules in width and is composed of k bar

and space pairs.
3.13
peak

A point of higher reflectance in a scan reflectance profile with points of lower reflectance on either side.

3.14
sample area

The effective area of the symbol within the field of view of the measurement device.

3.15
scan reflectance profile
Plot of variations in reflectance with linear distance along a scan path.
2 © ISO/IEC 2000 – All rights reserved
---------------------- Page: 12 ----------------------
SIST EN ISO/IEC 15416:2003
ISO/IEC 15416:2000(E)
3.16
scan path

The line along which the centre of the sample area traverses the symbol, including quiet zones.

3.17
space

A light element corresponding to a region of a scan reflectance profile above the global threshold.

3.18
space reflectance

The highest reflectance value of an individual space element or quiet zone in the scan reflectance profile of that

element or quiet zone.
3.19
two-width symbology

A bar code symbology in which symbol characters consist only of narrow and wide elements the widths of which

are in a constant ratio to each other.
3.20
valley

A point of lower reflectance in a scan reflectance profile with points of higher reflectance on either side.

3.21
vertical redundancy

The property of a bar code symbol whereby there exist multiple possible scan paths as a result of the symbol being

significantly higher than the height of a single scan line.
4 Symbols and abbreviated terms
4.1 Abbreviations
EC: Edge contrast
EC : Minimum value of EC
min
ERN: Element reflectance non-uniformity
ERN : Maximum value of ERN
max
GT: Global threshold
MOD: Modulation
PCS: Print contrast signal
RT: Reference threshold
SC: Symbol contrast
SRD: Static reflectance difference
4.2 Symbols

A: Average achieved width of element or element combinations of a particular type

e: Width of widest narrow element
© ISO/IEC 2000 – All rights reserved 3
---------------------- Page: 13 ----------------------
SIST EN ISO/IEC 15416:2003
ISO/IEC 15416:2000(E)
E: Width of narrowest wide element

e:i edge to similar edge measurement, counting from leading edge of symbol character

K: Smallest absolute difference between a measurement and a reference threshold
k: number of element pairs in a symbol character in a (n, k) symbology
M: Width of element showing greatest deviation from A
m: Number of modules in a symbol character
N: Average achieved wide to narrow ratio
n: number of modules in a symbol character in a (n, k) symbology
R : Bar reflectance
R : Dark reflectance
R : Light reflectance
R : Space reflectance
R : Maximum reflectance
max
R : Minimum reflectance
min
RT : Reference threshold between measurements j and (j+1) modules wide
S: Total width of a character
V: Decodability value
V : Decodability value for a symbol character
X: Nominal narrow element dimension
Z: Average achieved narrow element dimension
5 Measurement methodology
5.1 General requirements

The measurement methodology defined in this standard is designed to maximize the consistency of both reflectivity

and bar and space width measurements of bar code symbols on various substrates. This methodology is also

intended to correlate with conditions encountered in bar code scanning hardware.

Measurements shall be made with a single light wavelength and a measurement aperture of a diameter defined by

the application specification or determined in accordance with 5.2.1 and 5.2.2.

Whenever possible, measurements shall be made on the bar code symbol in its final configuration, i.e. the

configuration in which it is intended to be scanned. If this is impossible, refer to annex D for the method to be used

for measuring reflectance for non-opaque substrates.

The sampling method should be based on a statistically valid sample size within the lot or batch being tested. A

minimum grade for acceptability shall be established prior to quality control inspection. In the absence of a

4 © ISO/IEC 2000 – All rights reserved
---------------------- Page:
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.