IEC 62396-2:2017

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

IEC 62396-2:2017(E) aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earth’s atmosphere (atmospheric neutrons). Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of electronic components and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process can be applied by other industrial sectors.

General Information

• Status: Published
• Publication Date: 14-Dec-2017
• ICS: 03.100.50 - Production. Production management
• ICS: 29.060.10 - Wires
• ICS: 31.020 - Electronic components in general
• ICS: 49.060 - Aerospace electric equipment and systems
• Technical Committee: TC 107 - Process management for avionics
• Drafting Committee: WG 4 - TC 107/WG 4
• Current Stage: PPUB - Publication issued
• Start Date: 29-Dec-2017
• Completion Date: 15-Dec-2017

Relations

• Revises: IEC PAS 62396-2:2007 - Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
• Effective Date: 05-Sep-2023
• Revises: IEC 62396-2:2012 - Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
• Effective Date: 05-Sep-2023
• Revises: IEC TS 62396-2:2008 - Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 62396-2 ®
Edition 2.0 2017-12
INTERNATIONAL
STANDARD
colour
inside
Process management for avionics – Atmospheric radiation effects –
Part 2: Guidelines for single event effects testing for avionics systems
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IEC 62396-2 ®
Edition 2.0 2017-12
INTERNATIONAL
STANDARD
colour
inside
Process management for avionics – Atmospheric radiation effects –

Part 2: Guidelines for single event effects testing for avionics systems

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 03.100.50; 31.020; 49.060 ISBN 978-2-8322-5098-3

– 2 – IEC 62396-2:2017 © IEC 2017
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Abbreviated terms . 7
5 Obtaining SEE data . 9
5.1 Types of SEE data . 9
5.2 Use of existing SEE data . 9
5.2.1 General . 9
5.2.2 Heavy ion data . 10
5.2.3 High energy neutron and proton data . 10
5.2.4 Thermal neutron data . 11
5.3 Deciding to perform dedicated SEE tests . 11
6 Availability of existing SEE data for avionics applications . 11
6.1 Variability of SEE data . 11
6.2 Types of existing SEE data that may be used . 11
6.2.1 General . 11
6.2.2 Sources of data, proprietary versus published data . 13
6.2.3 Data based on the use of different sources . 14
6.2.4 Ground level versus avionics applications . 19
6.3 Sources of existing data . 19
7 Considerations for SEE testing . 22
7.1 General . 22
7.2 Selection of hardware to be tested . 22
7.3 Selection of test method . 22
7.4 Selection of facility providing energetic particles . 23
7.4.1 Radiation sources . 23
7.4.2 Spallation neutron sources . 24
7.4.3 Monoenergetic and quasi-monoenergetic beam sources . 25
7.4.4 Thermal neutron sources . 26
7.4.5 Whole system and equipment testing . 27
8 Converting test results to avionics SEE rates . 28
8.1 General . 28
8.2 Use of spallation neutron source . 28
8.3 Use of SEU cross-section curve over energy . 29
8.4 Measured SEU rates for different accelerator-based neutron sources . 32
8.5 Influence of upper neutron energy on the accuracy of calculated SEE rates –

Verification and compensation . 32
Annex A (informative) Sources of SEE data published before the year 2000 . 34
Bibliography . 35

Figure 1 – Comparison of Los Alamos, TRIUMF and ANITA neutron spectra with
terrestrial/avionics neutron spectra (JESD89A and IEC 62396-1) . 15

Figure 2 – Variation of high energy neutron SEU cross-section per bit as a function of
electronic component feature size for SRAM and SRAM arrays in FPGA and
microprocessors . 17
Figure 3 – Percentage fraction of SEU rate from atmospheric neutrons contributed by
neutrons with E < 10 MeV . 18
Figure 4 – Comparison of monoenergetic SEU cross-sections with Weibull and piece-
wise linear fits . 31

Table 1 – Sources of existing data (published after 2000) . 20
Table 2 – Spectral distribution of neutron energies . 32
Table A.1 – Sources of existing SEE data published before the year 2000 . 34

– 4 – IEC 62396-2:2017 © IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PROCESS MANAGEMENT FOR AVIONICS –
ATMOSPHERIC RADIATION EFFECTS –

Part 2: Guidelines for single event effects
testing for avionics systems
FOREWORD
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International Standard IEC 62396-2 has been prepared by IEC technical committee 107:
Process management for avionics.
This second edition cancels and replaces the first edition published in 2012. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition.
a) improvements and changes to test facilities have been added in Clause 7, which includes
new facilities at TSL, TRIUMF and ChipIr,
b) links with IEC 60749-38 and IEC 60749-44 are made in 7.1.

The text of this International Standard is based on the following documents:
FDIS Report on voting
107/316/FDIS 107/318/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 62396 series, published under the general title Process
management for avionics – Atmospheric radiation effects, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
•
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