SIST EN 62433-2:2017
(Main)EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2017)
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2017)
IEC 62433-2:2008(E) specifies macro-models for ICs to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE model can also be used for modelling an IC-die, a functional block and an Intellectual Property block (IP). The ICEM-CE model can be used to model both digital and analogue ICs. Basically, conducted emissions have two origins: - conducted emmissions through power supply terminals and ground reference structure; - conducted emmisions through input/output (I/O) terminals. The ICEM-CE model addresses those two types of origins in a single approach. This standard defines structures and components of the macro-model for EMI simulation taking into account the IC's internal activities. This standard gives general data, which can be implemented in different formats or languages such as IBIS, IMIC, SPICE, VHDL-AMS and Verilog. SPICE is however chosen as default simulation environment to cover all the conducted emissions. This standard also specifies requirements for information that shall be incorporated in each ICEM-CE model or component part of the model for model circulation, but description syntax is not within the scope of this standard.
EMV-IC-Modellierung - Teil 2: Modelle integrierter Schaltungen für die Simulation des Verhaltens bei elektromagnetischer Beeinflussung - Modellierung leitungsgeführter Aussendungen (ICEM-CE) (IEC 62433-2:2017)
Modèles de circuits intégrés pour la CEM - Partie 2: Modèles de circuits intégrés pour la simulation du comportement lors de perturbations électromagnétiques – Modélisation des émissions conduites (ICEM-CE) (IEC 62433-2:2017)
La CEI 62433-2:2008 définit des macromodèles pour circuits intégrés, destinés à simuler les émissions électromagnétiques conduites sur une carte de circuit imprimé. On appelle habituellement ce modèle: Modèle des émissions de circuits intégrés - Émission conduite (ICEM-CE). Le modèle ICEM-CE peut également être utilisé pour modéliser une puce de circuit intégré, un bloc fonctionnel et un bloc à propriété intellectuelle (IP). Le modèle ICEM-CE peut être utilisé pour modéliser à la fois des circuits intégrés numériques et analogiques. Les émissions conduites ont fondamentalement deux origines:
- les émissions conduites par l'intermédiaire des bornes d'alimentation et des structures de référence de masse;
- les émissions conduites par l'intermédiaire des bornes d'entrée/sortie (E/S). Le modèle ICEM-CE traite ces deux types d'origine en une approche unique. La présente norme définit les structures et les composants du macromodèle pour la simulation des perturbations électromagnétiques en tenant compte des activités internes du circuit intégré. La présente norme fournit des données générales, pouvant être mises en oeuvre dans des formats ou des langages différents tels que: IBIS, IMIC, SPICE, VHDL-AMS et Verilog. On choisit toutefois SPICE comme environnement de simulation par défaut pour couvrir la totalité des émissions conduites. La présente norme spécifie également les exigences relatives aux informations qui doivent être incorporées dans chaque modèle ICEM-CE ou élément constituant du modèle pour la circulation du modèle. La syntaxe de la description ne fait toutefois pas partie du domaine d'application de la présente norme.
Modeliranje integriranih vezij (IC) za elektromagnetno združljivost (EMC) - 2. del: Modeli integriranih vezij za vedenjsko simulacijo pri EMI - Vodeni model oddajanja (ICEM-CE) (IEC 62433-2:2017)
Standard IEC 62433-2:2008(E) določa makro modele za integrirana vezja za simulacijo prevajanega elektromagnetnega sevanja v tiskanem vezju. Model običajno imenujemo model sevanja integriranega vezja – prevajano sevanje (ICEM–CE). Model ICEM-CE se lahko uporablja tudi za modeliranje integriranih vezij, funkcijskega bloka in bloka intelektualne lastnine (IP). Model ICEM-CE se lahko uporablja za modeliranje digitalnih in analognih integriranih vezij. V osnovi imajo prevajana sevanja dva izvora: – prevajana sevanja prek terminalov napajalnika in referenčno strukturo tal; – prevajana sevanja prek vhodnih/izhodnih (I/O) terminalov. ICEM-CE model obravnava dve vrsti izvorov v enem samem pristopu. Ta standard določa strukture in komponente makro modela za simulacijo EMI ob upoštevanju notranjih aktivnosti integriranega vezja. Ta standard podaja splošne podatke, ki se lahko uporabljajo v različnih oblikah zapisa ali jezikih, npr. IBIS, IMIC, SPICE, VHDL-AMS in Verilog. SPICE je izbran kot privzeto okolje simulacije, ki zajema vsa prevajana sevanja. Ta standard določa tudi zahteve glede informacij, ki jih je treba vključiti v vsak model ICEM-CE ali del komponente modela za kroženje modela, vendar pa skladnja opisa ne spada na področje uporabe tega standarda.
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN 62433-2:2017
01-julij-2017
1DGRPHãþD
SIST EN 62433-2:2010
Modeliranje integriranih vezij (IC) za elektromagnetno združljivost (EMC) - 2. del:
Modeli integriranih vezij za vedenjsko simulacijo pri EMI - Vodeni model oddajanja
(ICEM-CE) (IEC 62433-2:2017)
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation -
Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2017)
EMV-IC-Modellierung - Teil 2: Modelle integrierter Schaltungen für die Simulation des
Verhaltens bei elektromagnetischer Beeinflussung - Modellierung leitungsgeführter
Aussendungen (ICEM-CE) (IEC 62433-2:2017)
Modèles de circuits intégrés pour la CEM - Partie 2: Modèles de circuits intégrés pour la
simulation du comportement lors de perturbations électromagnétiques – Modélisation
des émissions conduites (ICEM-CE) (IEC 62433-2:2017)
Ta slovenski standard je istoveten z: EN 62433-2:2017
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
33.100.10 Emisija Emission
SIST EN 62433-2:2017 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN 62433-2:2017
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SIST EN 62433-2:2017
EUROPEAN STANDARD EN 62433-2
NORME EUROPÉENNE
EUROPÄISCHE NORM
May 2017
ICS 31.200; 33.100.10 Supersedes EN 62433-2:2010
English Version
EMC IC modelling -
Part 2: Models of integrated circuits for EMI behavioural
simulation - Conducted emissions modelling (ICEM-CE)
(IEC 62433-2:2017)
Modèles de circuits intégrés pour la CEM - Partie 2: EMV-IC-Modellierung - Teil 2: Modelle integrierter
Modèles de circuits intégrés pour la simulation du Schaltungen für die Simulation des Verhaltens bei
comportement lors de perturbations électromagnétiques - elektromagnetischer Beeinflussung - Modellierung
Modélisation des émissions conduites (ICEM-CE) leitungsgeführter Aussendungen (ICEM-CE)
(IEC 62433-2:2017) (IEC 62433-2:2017)
This European Standard was approved by CENELEC on 2017-03-03. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 62433-2:2017 E
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SIST EN 62433-2:2017
EN 62433-2:2017
European foreword
The text of document 47A/999/FDIS, future edition 2 of IEC 62433-2, prepared by SC 47A "Integrated
circuits", of IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and
approved by CENELEC as EN 62433-2:2017.
The following dates are fixed:
(dop) 2017-12-03
• latest date by which the document has to be implemented at
national level by publication of an identical national
standard or by endorsement
(dow) 2020-03-03
• latest date by which the national standards conflicting with
the document have to be withdrawn
This document supersedes EN 62433-2:2010.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 62433-2:2017 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 61967 NOTE Harmonized in EN 61967 series.
IEC 61967-4 NOTE Harmonized as EN 61967-4.
2
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SIST EN 62433-2:2017
EN 62433-2:2017
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is
available here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC/TS 62433-1 2011 EMC IC modelling - Part 1: General - -
modelling framework
CISPR 17 - Methods of measurement of the EN 55017 -
suppression characteristics of passive
EMC filtering devices
3
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SIST EN 62433-2:2017
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SIST EN 62433-2:2017
IEC 62433-2
®
Edition 2.0 2017-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
EMC IC modelling –
Part 2: Models of integrated circuits for EMI behavioural simulation – Conducted
emissions modelling (ICEM-CE)
Modèles de circuits intégrés pour la CEM –
Partie 2: Modèles de circuits intégrés pour la simulation du comportement lors
de perturbations électromagnétiques – Modélisation des émissions conduites
(ICEM-CE)
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
31.200; 33.100.10 ISBN 978-2-8322-3876-9
Warning! Make sure that you obtained this publication from an authorized distributor.
Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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SIST EN 62433-2:2017
– 2 – IEC 62433-2:2017 © IEC 2017
CONTENTS
FOREWORD . 7
1 Scope . 9
2 Normative references . 9
3 Terms, definitions, abbreviations and conventions . 9
3.1 Terms and definitions . 9
3.2 Abbreviations . 11
3.3 Conventions . 11
4 Philosophy . 11
4.1 General . 11
4.2 Conducted emission from core activity (digital culprit) . 12
4.3 Conducted emission from I/O activity . 12
4.4 Data exchange format . 12
5 ICEM-CE basic components . 13
5.1 General . 13
5.2 Internal Activity (IA) . 13
5.2.1 General . 13
5.2.2 Examples of IA . 14
5.3 Passive Distribution Network (PDN) . 14
5.3.1 General . 14
5.3.2 Examples of PDN . 15
6 IC macro-models . 16
6.1 Types of IC macro-models . 16
6.2 General IC macro-model . 16
6.3 Block-based IC macro-model . 17
6.3.1 Block component . 17
6.3.2 Inter-Block Coupling component (IBC) . 18
6.3.3 Block-based IC macro-model structure . 19
6.4 Sub-model-based IC macro-model . 21
6.4.1 Sub-model component . 21
6.4.2 Sub-model-based IC macro-model structure . 22
7 CEML format . 23
7.1 General . 23
7.2 CEML structure . 24
7.3 Global keywords . 24
7.4 Header section . 24
7.5 Lead definitions . 25
7.6 SPICE macro-models . 26
7.7 Validity section . 28
7.7.1 General . 28
7.7.2 Attribute definitions . 29
7.8 PDN . 31
7.8.1 General . 31
7.8.2 Attribute definitions . 32
7.8.3 Description . 36
7.9 IBC . 40
7.9.1 General . 40
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7.9.2 Attribute definitions . 40
7.10 IA . 42
7.10.1 General . 42
7.10.2 Attribute definitions . 42
7.10.3 Description . 46
8 Requirements for parameter extraction . 47
8.1 General . 47
8.2 Environmental extraction constraints . 47
8.3 IA parameter extraction . 47
8.4 PDN parameter extraction . 47
8.5 IBC parameter extraction . 48
Annex A (normative) Preliminary definitions for XML representation . 49
A.1 XML basics . 49
A.1.1 XML declaration . 49
A.1.2 Basic elements . 49
A.1.3 Root element . 49
A.1.4 Comments . 50
A.1.5 Line terminations . 50
A.1.6 Element hierarchy . 50
A.1.7 Element attributes . 50
A.2 Keyword requirements . 50
A.2.1 General . 50
A.2.2 Keyword characters . 51
A.2.3 Keyword syntax . 51
A.2.4 File structure . 51
A.2.5 Values . 53
Annex B (normative) CEML valid keywords and usage . 56
B.1 Root element keywords . 56
B.2 File header keywords . 57
B.3 Validity section keywords . 58
B.4 Global keywords . 59
B.5 Lead Keyword . 59
B.6 Lead_definitions section attributes . 60
B.7 Macromodels section attributes . 60
B.8 Pdn section keywords . 61
B.8.1 Lead element keywords . 61
B.8.2 Netlist section keywords . 63
B.9 Ibc section keywords . 63
B.9.1 Lead element keywords . 63
B.9.2 Netlist section keywords . 65
B.10 Ia section keywords . 65
B.10.1 Lead element keywords . 65
B.10.2 Voltage section keywords . 66
B.10.3 Current section keywords . 68
Annex C (informative) Example of ICEM-CE macro-model in CEML format . 70
C.1 General . 70
C.2 PDN and IBC sub-model . 70
C.3 IA sub-model . 71
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C.4 Frequency domain ICEM-CE in CEML . 73
C.5 Time domain ICEM-CE in CEML . 75
Annex D (informative) Conversions between parameter types . 77
D.1 General . 77
D.2 Conversion for one-port PDN . 77
D.3 Conversion for two-port PDN . 77
Annex E (informative) Model parameter generation . 79
E.1 General . 79
E.2 Default structure and values . 79
E.2.1 General . 79
E.2.2 IA parameters . 79
E.2.3 PDN parameters . 80
E.3 Model parameter generation from design information . 81
E.3.1 General . 81
E.3.2 IA parameters . 81
E.3.3 PDN parameters . 85
E.4 Model parameter generation from measurements . 87
E.4.1 IA parameters . 87
E.4.2 PDN parameters . 90
Annex F (informative) Decoupling capacitors optimization . 100
Annex G (informative) Conducted emission prediction . 102
Annex H (informative) Conducted emission prediction at PCB level . 103
Bibliography . 105
Figure 1 – Decomposition example of a digital IC for conducted emissions analysis . 12
Figure 2 – IA component in the case of a current source . 13
Figure 3 – Example of IA characteristics in the time domain. 14
Figure 4 – Example of IA characteristics in the frequency domain . 14
Figure 5 – Example of a four-terminal PDN using lumped elements . 15
Figure 6 – Example of a seven-terminal PDN using distributed elements . 16
Figure 7 – Example of a twelve-terminal PDN using matrix representation . 16
Figure 8 – General IC macro-model . 17
Figure 9 – Example of block component with a single IA . 18
Figure 10 – Example of block components for I/Os . 18
Figure 11 – Example of IBC with four internal terminals . 19
Figure 12 – Relationship between blocks and IBC . 19
Figure 13 – Block-based IC macro-model . 20
Figure 14 – Example of block-based IC macro-model . 21
Figure 15 – Example of simple sub-model . 21
Figure 16 – Sub-model-based IC macro-model . 22
Figure 17 – CEML inheritance hierarchy . 23
Figure 18 – Example of a netlist file defining a sub-circuit . 28
Figure 19 – PDN represented as S-parameters in Touchstone format . 38
Figure 20 – Simulated IA waveform with corresponding parameters . 45
Figure A.1 – Multiple XML (CEML) files . 52
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Figure A.2 – XML files with data files (*.dat) . 52
Figure A.3 – XML files with additional files . 53
Figure C.1 – Example pin-out of a microcontroller and the modelled pins . 70
Figure C.2 – PDN sub-model topology . 71
Figure C.3 – IA sub-model topology . 72
Figure C.4 – IA of digital block in frequency domain . 72
Figure C.5 – IA of digital block in time domain . 73
Figure E.1 – Typical characterization current gate schematic . 82
Figure E.2 – Current peak during switching transition . 82
Figure E.3 – Example of IA extraction procedure from design . 83
Figure E.4 – Technology Influence . 83
Figure E.5 – Final current waveform for a program period . 84
Figure E.6 – Comparison between measurement and simulation . 84
Figure E.7 – Example lumped element model of a package. 85
Figure E.8 – Circuit structure of the netlist . 87
Figure E.9 – Principle of the IA computation in the frequency domain . 88
Figure E.10 – Process involved to model i (t) . 89
A
Figure E.11 – i (t) measured using IEC 61967-4 . 89
Ext
Figure E.12 – i (t)and i (t) profiles . 90
A Ext
Figure E.13 – Conventional one-port S-parameter measurement . 90
Figure E.14 – Two-port method for low impedance measurement. 91
Figure E.15 – Two-port method for high impedance measurement . 91
Figure E.16 – Example of a hardware set-up used to extract the PDN parameters . 92
Figure E.17 – Miniature 50 Ω coaxial connectors . 93
Figure E.18 – Impedance probe using two miniature coaxial connectors . 93
Figure E.19 – Open and short terminations . 93
Figure E.20 – Measurement probe model . 94
Figure E.21 – De-embedding principle . 94
Figure E.22 – Example of a predefined PDN structure . 95
Figure E.23 – RL configuration. 96
Figure E.24 – RLC configuration . 97
Figure E.25 – RLC with magnetic coupling configuration . 97
Figure E.26 – Impedance seen from Vcc and Gnd. 97
Figure E.27 – Complete PDN component . 98
Figure E.28 – Set-up for correlation (left), measurement and prediction model (right) . 99
Figure E.29 – Set-up used to measure the internal decoupling capacitor . 99
Figure F.1 – Equivalent schematic of the complete electronic system . 100
Figure F.2 – Impedance prediction and measurements . 101
Figure G.1 – IEC 61967-4 test set-up standard . 102
Figure G.2 – Comparison between prediction and measurement . 102
Figure H.1 – Prediction of ETVddc noise level at PCB level . 103
Figure H.2 – Good agreements on the noise envelope . 104
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Table 1 – Attributes of Lead keyword in the Lead_definitions section . 25
Table 2 – Compatibility between the Mode and Type fields for correct CEML
annotation . 26
Table 3 – Subckt definition . 26
Table 4 – Definition of the Validity section . 28
Table 5 – Definition of the Lead keyword for Pdn section . 32
Table 6 – Valid data formats and their default units in the Pdn section . 35
Table 7 – Valid fi
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