Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 41: Lists of properties (LOPs) of process analysers for electronic data exchange - Generic structures (IEC 61987-41:2025)

IEC 61987-41: 2025 provides:
• a characterization for the integration of process analysers in the Common Data Dictionary (CDD),
• generic structures for operating lists of properties (OLOP) and device lists of properties (DLOP) of measuring equipment in conformance with IEC 61987-10,
• generic structures for Dynamic Data, e.g. for condition monitoring of process analysers.
The generic structures for the OLOP and DLOP contain the most important blocks for process analysers. Blocks pertaining to a specific equipment type will be described in the corresponding part of the IEC 61987 standard series. Similarly, equipment properties are not part of this document. Thus, OLOP, DLOPs and LOPDs for selected process analysers families will be found in the IEC CDD.

IEC 61987 – Teil 41: Allgemeine Strukturen der Eigenschaftsliste (LOP) von Prozessanalysatoren Technologie (PAT) Messgeräten für den elektronischen Datenaustausch

Mesure et commande dans les processus industriels - Eléments et structures de données dans les catalogues d'équipements de processus - Partie 41: Listes des propriétés (LOP) des analyseurs de processus pour l'échange électronique de données - Structures génériques (IEC 61987-41:2025)

IEC 61987-41: 2025 fournit:
• une caractérisation pour l'intégration des analyseurs de processus dans le Dictionnaire de données communes (CDD),
• des structures génériques pour les listes de propriétés fonctionnelles (OLOP) et les listes de propriétés d'appareil (DLOP) des équipements de mesure conformes à l'IEC 61987-10,
• des structures génériques pour les données dynamiques, par exemple, pour la surveillance des conditions des analyseurs de processus.
Les structures génériques pour l'OLOP et la DLOP contiennent les blocs les plus importants pour les analyseurs de processus. Les blocs concernant un type d'équipement spécifique sont décrits dans la partie correspondante de la série de normes IEC 61987. De même, les propriétés des équipements ne sont pas traitées dans le présent document. Ainsi, les OLOP, DLOP et LOPD pour des familles choisies d'analyseurs de processus se trouveront dans l’IEC CDD.

Merjenje in nadzor v industrijskih procesih - Strukture podatkov in elementov v katalogih procesne opreme - 41. del: Seznami lastnosti (LOP) analizatorjev procesov za elektronsko izmenjavo podatkov - Generične strukture (IEC 61987-41:2025)

General Information

Status
Published
Public Enquiry End Date
24-Apr-2024
Publication Date
24-Aug-2025
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
10-Jun-2025
Due Date
15-Aug-2025
Completion Date
25-Aug-2025

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SLOVENSKI STANDARD
01-oktober-2025
Merjenje in nadzor v industrijskih procesih - Strukture podatkov in elementov v
katalogih procesne opreme - 41. del: Seznami lastnosti (LOP) analizatorjev
procesov za elektronsko izmenjavo podatkov - Generične strukture (IEC 61987-
41:2025)
Industrial-process measurement and control - Data structures and elements in process
equipment catalogues - Part 41: Lists of properties (LOPs) of process analysers for
electronic data exchange - Generic structures (IEC 61987-41:2025)
IEC 61987 – Teil 41: Allgemeine Strukturen der Eigenschaftsliste (LOP) von
Prozessanalysatoren Technologie (PAT) Messgeräten für den elektronischen
Datenaustausch
Mesure et commande dans les processus industriels - Eléments et structures de
données dans les catalogues d'équipements de processus - Partie 41: Listes des
propriétés (LOP) des analyseurs de processus pour l'échange électronique de données -
Structures génériques (IEC 61987-41:2025)
Ta slovenski standard je istoveten z: EN IEC 61987-41:2025
ICS:
25.040.40 Merjenje in krmiljenje Industrial process
industrijskih postopkov measurement and control
35.240.50 Uporabniške rešitve IT v IT applications in industry
industriji
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 61987-41

NORME EUROPÉENNE
EUROPÄISCHE NORM May 2025
ICS 01.140.30
English Version
Industrial-process measurement and control - Data structures
and elements in process equipment catalogues - Part 41: Lists of
properties (LOPs) of process analysers for electronic data
exchange - Generic structures
(IEC 61987-41:2025)
Mesure et commande dans les processus industriels - IEC 61987 - Teil 41: Allgemeine Strukturen der
Eléments et structures de données dans les catalogues Eigenschaftsliste (LOP) von Prozessanalysatoren
d'équipements de processus - Partie 41: Listes des Technologie (PAT) Messgeräten für den elektronischen
propriétés (LOP) des analyseurs de processus pour Datenaustausch
l'échange électronique de données - Structures génériques (IEC 61987-41:2025)
(IEC 61987-41:2025)
This European Standard was approved by CENELEC on 2025-05-22. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Türkiye and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2025 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 61987-41:2025 E

European foreword
The text of document 65E/1067/CDV, future edition 1 of IEC 61987-41, prepared by SC 65E "Devices
and integration in enterprise systems" of IEC/TC 65 "Industrial-process measurement, control and
automation" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2026-05-31
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2028-05-31
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 61987-41:2025 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standard indicated:
IEC 61069-5 NOTE Approved as EN 61069-5
IEC 61360-1 NOTE Approved as EN 61360-1
IEC 61360-2 NOTE Approved as EN 61360-2
IEC 61508-6 NOTE Approved as EN 61508-6
IEC 61987 (series) NOTE Approved as EN IEC 61987 (series)
IEC 61987-92 NOTE Approved as EN IEC 61987-92
IEC 62828-1 NOTE Approved as EN IEC 62828-1
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1  Where an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.
NOTE 2  Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cencenelec.eu.
Publication Year Title EN/HD Year
IEC 61987-1 2024 Industrial-process measurement and EN IEC 61987-1 2024
control - Data structures and elements in
process equipment catalogues - Part 1:
Generic structures for measuring
equipment
IEC 61987-10 - Industrial-process measurement and EN 61987-10 -
control - Data structures and elements in
process equipment catalogues - Part 10:
List of Properties (LOPs) for Industrial-
Process Measurement and Control for
Electronic Data Exchange - Fundamentals
IEC 61987-11 2016 Industrial-process measurement and EN 61987-11 2017
control - Data structures and elements in
process equipment catalogues - Part 11:
List of properties (LOPs) of measuring
equipment for electronic data exchange -
Generic structures
IEC 61987-41 ®
Edition 1.0 2025-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Industrial-process measurement and control – Data structures and elements in

process equipment catalogues –

Part 41: Lists of properties (LOPs) of process analysers for electronic data

exchange – Generic structures
Mesure et commande dans les processus industriels – Eléments et structures

de données dans les catalogues d'équipements de processus –

Partie 41: Listes des propriétés (LOP) des analyseurs de processus pour

l'échange électronique de données – Structures génériques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 01.140.30  ISBN 978-2-8327-0369-4

– 2 – IEC 61987-41:2025 © IEC 2025
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 8
4 General . 9
4.1 Characterization scheme . 9
4.2 OLOP, DLOP and LOPD . 10
4.3 Cardinality and polymorphism . 10
5 Operating list of properties (OLOP). 11
5.1 Generic block structure . 11
5.2 Matrix of components/measurands . 11
5.2.1 General. 11
5.2.2 Chemical component/measurand . 11
5.2.3 Process analyser measurands . 12
5.3 Measuring or control point . 12
5.4 Base conditions . 12
5.5 Physical properties at sampling point . 12
5.6 Operating conditions for device design. 12
5.7 Process equipment . 12
5.8 Physical location . 12
5.8.1 General. 12
5.8.2 Available power supply . 12
5.8.3 Auxiliary media . 13
5.8.4 Process criticality classification . 13
5.8.5 Area classification . 13
6 Device list of properties (DLOP) . 13
6.1 Basic structure . 13
6.2 Generic block structure . 13
6.3 Relationship to IEC 61987-1 . 15
7 LOPD with dynamic properties for condition monitoring . 15
7.1 General . 15
7.2 Measurement variables . 16
7.3 General device variables/status . 16
7.4 Specific device variables/status/condition monitoring. 16
7.5 General device parameters and variables . 16
7.6 General functions . 16
8 Additional aspects . 16
Annex A (informative) Device type dictionary – Classification of process analysers . 17
Bibliography . 22

Figure 1 – Characterization of process analysers . 9
Figure 2 – Assignment of OLOP, LOPD and DLOPs for process analysers . 10

Table 1 – Generic block structure of an OLOP for process analysers . 11

IEC 61987-41:2025 © IEC 2025 – 3 –
Table 2 – Generic block structure of a DLOP . 14
Table 3 – Generic block structure of an LOPD for a process analyser . 15
Table A.1 – Classification scheme for process analysers . 17

– 4 – IEC 61987-41:2025 © IEC 2025
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
INDUSTRIAL-PROCESS MEASUREMENT AND CONTROL –
DATA STRUCTURES AND ELEMENTS IN PROCESS
EQUIPMENT CATALOGUES –
Part 41: Lists of properties (LOPs) of process analysers
for electronic data exchange – Generic structures

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Gui
...

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